METHOD AND SYSTEM FOR TESTING A CHIP
A method and a system for testing various types of chips includes: registering, by a tester connected to a chip, a model pattern of signals; receiving, by the tester via no more than a single cable, an output signal generated by the chip based on a test signal generated by the tester or by an image sensor connected to the chip; comparing, by the tester, a pattern in the output signal with the model pattern of signals; and displaying, by a display, a test result based on a comparison of the pattern in the output signal with the model pattern of signals.
1 . A testing method for a chip, comprising:
registering, by a tester connected to the chip, a model pattern of signals;
receiving, by the tester via no more than a single cable, an output signal generated by the chip based on a test signal generated by the tester or by an image sensor connected to the chip;
comparing, by the tester, a pattern in the output signal with the model pattern of signals; and
displaying, by a display, a test result based on a comparison of the pattern in the output signal with the model pattern of signals.
2 . The testing method of claim 1 , wherein the comparing of the pattern in the output signal with the model pattern of signals is performed by a test chip on the tester.
3 . The testing method of claim 1 , wherein the output signal is aggregated with other signals including a command response of the image sensor, and the output signal aggregated with the other signals is received via the signal cable.
4 . The testing method of claim 1 , wherein the single cable is a Universal Serial Bus (USB) cable.
5 . The testing method of claim 1 , wherein the model pattern of signals is an artificial pattern of signals.
6 . The testing method of claim 3 , further comprising:
registering, by the tester, a redefined model pattern of signals in response to a reconfiguration of the chip.
7 . The testing method of claim 1 , further comprising:
transmitting, by the image sensor, the test signal to the chip via a Mobile Industry Processor Interface (MIPI) cable.
8 . A system for testing a chip, comprising:
a tester connected to the chip; and
a display connected to the tester,
wherein the tester:
registers a model pattern of signals;
receives, via no more than a single cable, an output signal generated by the chip based on a test signal generated by the tester or an image sensor connected to the chip;
compares a pattern in the output signal with the model pattern of signals; and
causes the display to display a test result based on a comparison of the pattern in the output signal with the model pattern of signals.
9 . The system according to claim 8 , wherein the tester comprises a test chip that compares the pattern in the output signal with the model pattern of signals.
10 . The system according to claim 8 , wherein the output signal is aggregated with other signals including a command response of the image sensor, and the output signal aggregated with the other signals is received via the signal cable.
11 . The system according to claim 8 , wherein the single cable is a Universal Serial Bus (USB) cable.
12 . The system according to claim 8 , wherein the model pattern of signals is an artificial pattern of signals.
13 . The system according to claim 10 , wherein the tester further registers a redefined model pattern of signals in response to a reconfiguration of the chip.
14 . The system according to claim 8 , wherein the image sensor transmits the test signal via a Mobile Industry Processor Interface (MIPI) cable.