Patent Assignment
Reel/Frame 005081/0817
Assignment of Assignors Interest.
Recorded: 1989-04-21
Pages: 1
Assignees
MITSUBISHI KINZOKU KABUSHIKI KAISHAO
5-2, OTEMACHI 1-CHOME, CHIYODA-KU, TOKYO, JAPAN
JAPAN SILICON CO., LTD.
5-2, OTEMACHI 1-CHOME, CHIYODA-KU, TOKYO, JAPAN
Covered Property
(1)
Method for Contactless Evaluation of Characteristics of Semiconductor Wafers and Devices
Patent:
4,949,034 →
Application:
07/322,390 →
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.
Document Is Being Recorded as a Change of Name and a Change of Address. Change of Name Effective 12-01-90 and Change of Address Effective 11-28-88.
Aug 9, 1991
From: MITSUBISHI KINZOKU KABUSHIKI KAISHA 5-2, OTEMACHI 1-CHOME, CHIYODA-KU TOKYO
To: MITSUBISHI MATERIALS CORPORATION
Reel/Frame 005810/0070 →
Change of Name
Dec 12, 1991
From: JAPAN SILICON CO., LTD.
To: MITSUBISHI MATERIALS SILICON CORPORATION
Reel/Frame 005945/0206 →