Patent Assignment
Reel/Frame 006305/0759
Assignment of Assignors Interest.
Recorded: 1992-07-23
Pages: 3
Assignor
COMEAU, ALAIN
Executed: 1992-07-02
Assignee
MITEL CORPORATION
350 LEGGET DRIVE, KANATA, ONTARIO K2K 1X3, CANADA
Covered Property
(1)
Test Chip for Semiconductor Fault Analysis
Patent:
5,329,228 →
Application:
07/910,029 →
Related Assignments
(4)
Other recorded transfers of the patent in this record — the chain of ownership.
Grant of Patent Security Interest
Mar 31, 1998
From: MITEL CORPORATION, A CORP. OF CANADA
To: CANADIAN IMPERIAL BANK OF COMMERCE, AS SECURED PARTY
Reel/Frame 009114/0489 →
Release of Security Interest
Mar 7, 2001
From: CANADIAN IMPERIAL BANK OF COMMERCE
To: MITEL CORPORATION; MITEL SEMICONDUCTOR AMERICAS, INC., A DELAWARE CORPORATION; MITEL, INC., A DELAWARE CORPORATION; MITEL SEMICONDUCTOR, INC., A DELAWARE CORPORATION
Reel/Frame 011590/0406 →
Change of Name
Mar 8, 2002
From: MITEL CORPORATION
To: ZARLINK SEMICONDUCTOR INC.
Reel/Frame 012653/0397 →
Assignment of Assignor's Interest
Jul 8, 2002
From: ZARLINK SEMICONDUCTOR INC.
To: DALSA SEMICONDUCTOR INC.
Reel/Frame 013305/0508 →