Patent Assignment
Reel/Frame 007470/0232
Assignment of Assignor's Interest
Recorded: 1995-05-05
Pages: 6
Assignor
LEEDY, GLENN J.
Executed: 1995-03-28
Assignee
ELM TECHNOLOGY CORPORATION ( A CALIFORNIA CORP.)
1061 E. MOUNTAIN DRIVE, MOUNTECITO, CALIFORNIA, 93108
Covered Properties
(8)
Method of Making and Testing an Integrated Circuit
Patent:
4,924,589 →
Application:
07/194,596 →
Flexible Tester Surface for Testing Integrated Circuits
Patent:
4,994,735 →
Application:
07/436,278 →
Method of Making a Flexible Tester Surface for Testing Integrated Circuits
Patent:
5,020,219 →
Application:
07/436,395 →
Test Device for Testing Integrated Circuits
Patent:
5,034,685 →
Application:
07/436,396 →
Making and Testing an Integrated Circuit Using High Density Probe Points
Patent:
5,103,557 →
Application:
07/482,135 →
Making and Testing an Integrated Circuit Using High Density Probe Points
Patent:
5,225,771 →
Application:
07/775,324 →
Membrane Dielectric Isolation Ic Fabrication
Patent:
5,354,695 →
Application:
07/865,412 →
Interconnection Structure for Integrated Circuits and Method for Making Same
Patent:
5,323,035 →
Application:
07/960,588 →
Related Assignments
(3)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignors Interest.
Oct 18, 1990
From: LEEDY, GLENN J.
To: DRI TECHNOLOGY CORPORATION, A CORP. OF CALIFORNIA
Reel/Frame 005489/0374 →
Assignment of Assignor's Interest
Jan 18, 1994
From: DRI TECHNOLOGY CORPORATION
To: LEEDY, GLENN J.
Reel/Frame 006830/0160 →
Assignment of Assignor's Interest
Aug 20, 2008
From: ELM TECHNOLOGY CORPORATION
To: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Reel/Frame 021411/0158 →