Assignment of Assignor's Interest

Recorded: 1996-06-25 Pages: 2

Assignor

KAGAMI, AKIHIKO

Executed: 1996-06-13

Assignee

NEC CORPORATION

7-1, SHIBA 5-CHOME, MINATO-KU, TOKYO, JAPAN

Covered Property (1)

Test Mode Setting Circuit of Test Circuit for Semiconductor Memory

Patent: 5,629,944 →

Application: 08/670,823 →

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.