Patent Assignment
Reel/Frame 008319/0610
Assignment of Assignor's Interest
Recorded: 1997-01-07
Pages: 2
Assignors
MORISHIGE, YOSHIO
Executed: 1996-09-11
NAKAMURA, HISATO
Executed: 1996-09-11
WATANABE, TETSUYA
Executed: 1996-09-11
Assignee
HITACHI ELECTRONICS ENGINEERING CO., LTD.
16-3, HIGASHI 3-CHOME, SHIBUYA-KU, TOKYO, JAPAN
Covered Property
(1)
Extraneous Substance Inspection Apparatus for Patterned Wafer
Patent:
5,724,132 →
Application:
08/736,582 →
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name
Sep 30, 2004
From: HITACHI ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 015201/0763 →
Assignment of Assignor's Interest
Jul 28, 2005
From: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 016570/0926 →