Assignment of Assignor's Interest

Recorded: 1997-10-28 Pages: 3

Assignor

YEH, MENG-LIN

Executed: 1997-10-06

Assignee

UNITED SEMICONDUCTOR CORP.

SCIENCE-BASED INDUSTRIAL PARK, NO. 3, LI-HSIN II ROAD, HSINCHU, R.O.C, TAIWAN

Covered Property (1)

Test Connecting Device Including Testkey and Probe Card for Use in the Testing of Integrated Circuits

Patent: 5,949,240 →

Application: 08/959,520 →

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.