Assignment of Assignor's Interest

Recorded: 1998-08-27 Pages: 2

Assignor

ASAKA, TOSHIHARU

Executed: 1998-08-13

Assignee

NEC CORPORATION

7-1, SHIBA 5-CHOME, MINATO-KU, TOKYO, JAPAN

Covered Property (1)

Design for Testability Method Selectively Employing Two Methods for Forming Scan Paths in a Circuit

Patent: 6,189,128 →

Application: 09/141,329 →

Related Assignments (2)

Other recorded transfers of the patent in this record — the chain of ownership.