Patent Assignment
Reel/Frame 010149/0219
Assignment of Assignor's Interest
Recorded: 1999-08-02
Pages: 2
Assignee
NEC CORPORATION
MINATO-KU, 7-1, SHIBA 5-CHOME, TOKYO, JAPAN
Covered Property
(1)
Reverse Profiling Method for Profiling Modulated Impurity Density Distribution of Semiconductor Device
Patent:
6,242,272 →
Application:
09/366,321 →
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.