Patent Assignment
Reel/Frame 010974/0833
Assignment of Assignor's Interest
Recorded: 2000-07-27
Pages: 3
Assignor
YOKOTA, KAZUKI
Executed: 2000-07-03
Assignee
NEC CORPORATION
7-1, SHIBA, 5-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Overlay Mark, Method of Measuring Overlay Accuracy, Method of Making Alignment and Semiconductor Device Therewith
Patent:
6,801,313 →
Application:
09/627,456 →
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Feb 27, 2003
From: NEC CORPORATION
To: NEC ELECTRONICS CORPORATION
Reel/Frame 013795/0949 →
Change of Name
Nov 18, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025375/0909 →
Change of Address
Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →