Patent Assignment
Reel/Frame 011448/0446
Assignment of Assignor's Interest
Recorded: 2001-01-10
Received: 2001-01-26
Pages: 3
Assignors
ISHIDA, SHINJI
Executed: 2000-11-20
IWASAKI, HARUO
Executed: 2000-11-20
YOSHII, TSUYOSHI
Executed: 2000-11-20
Assignee
NEC CORPORATION
7-1, SHIBA 5-CHOME, MINATO-KU, TOKYO, JPX, JAPAN
Covered Property
(1)
Photomask and Pattern Forming Method Used in a Thermal Flow Process and Semiconductor Integrated Circuit Fabricated Using the Thermal Flow Process
Application:
09/757,841 →