Patent Assignment
Reel/Frame 011479/0556
Assignment of Assignor's Interest
Recorded: 2001-01-16
Received: 2001-02-05
Pages: 5
Assignor
MIURA, TAKEO
Executed: 2000-12-26
Assignee
ADVANTEST CORPORATION
32-1, ASAHICHO 1-CHOME, NERIMA-KU, TOKYO, JPX, 179-0, JAPAN
Covered Property
(1)
Method and Apparatus for Testing Semiconductor Devices
Application:
09/761,199 →