IP Library › Granted Patent US 6,789,224
Granted Patent Utility
US 6,789,224 · Confirmation No. 5498

METHOD AND APPARATUS FOR TESTING SEMICONDUCTOR DEVICES

Inventor: Takeo Miura
Patented Case View Patent ↗ View Publication ↗
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2009-06-25 EBCC.AD Notice of Change of Address Place in File Wrapper Due to Electronic Business Center(EBC) Customer Number Update 1 View
2004-07-19 IFEE Issue Fee Payment (PTO-85B) 1 View
2004-07-19 LET. Miscellaneous Incoming Letter 1 View
2004-07-19 DRW Drawings-only black and white line drawings 1 View
2004-04-29 IDS Information Disclosure Statement (IDS) Form (SB08) 3 View
2004-04-29 FOR Foreign Reference 20 View
2001-01-16 TRNA Transmittal of New Application 2 View
2001-01-16 SPEC Specification 30 View
2001-01-16 CLM Claims 9 View
2001-01-16 ABST Abstract 1 View
2001-01-16 DRW Drawings-only black and white line drawings 19 View
2001-01-16 OATH Oath or Declaration filed 2 View
2001-01-16 TRNA Transmittal of New Application 2 View
2001-01-16 SPEC Specification 30 View
2001-01-16 CLM Claims 9 View
2001-01-16 ABST Abstract 1 View
2001-01-16 DRW Drawings-only black and white line drawings 19 View
2001-01-16 OATH Oath or Declaration filed 2 View
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Quick Facts
Patent No.
US 6,789,224
App. No.
09/761,199
Filed
2001-01-16
Granted
2004-09-07
Pub. No.
US20010052097A1
Art Unit
2133
PTA
-76 days