Patent Assignment
Reel/Frame 047987/0626
Change of Address
Recorded: 2018-12-18
Pages: 30
Assignor
ADVANTEST CORPORATION
Executed: 2018-11-12
Assignee
ADVANTEST CORPORATION
1-6-2, MARUNOUCHI, CHIYODA-KU, TOKYO, 100-0005, JAPAN
Covered Properties
(1053)
Multi-Channel Architecture with Channel Independent Clock Signals
Patent:
6,055,644 →
Application:
09/050,289 →
Permanent Failure Monitoring in Complex Systems
Patent:
6,216,243 →
Application:
09/050,505 →
Online Documentation and Help System for Computer-Based Systems
Patent:
6,208,338 →
Application:
09/079,985 →
Compressible Elastomeric Contact and Mechanical Assembly Therewith
Patent:
6,183,272 →
Application:
09/093,485 →
Memory Latency Compensation
Optimized Memory Organization in a Multi-Channel Architecture
Patent:
6,304,947 →
Application:
09/140,427 →
Laser Repair Apparatus and Method
Patent:
6,590,182 →
Application:
09/175,716 →
Laser Machining Apparatus
Patent:
6,103,991 →
Application:
09/176,405 →
Evaluation System and Method for Ad Converter
Patent:
6,177,894 →
Application:
09/183,644 →
Failure Analysis Memory for Semiconductor Memory Testing Devices and Its Storage Method
Patent:
6,374,378 →
Application:
09/185,184 →
Method for Calibrating Variable Delay Circuit and a Variable Delay Circuit Using the Same
Patent:
6,163,759 →
Application:
09/193,523 →
Maintenance Free Test System
Patent:
6,185,708 →
Application:
09/200,909 →
Method for Producing Contact Structures
Patent:
6,297,164 →
Application:
09/201,299 →
Packaging and Interconnection of Contact Structure
Patent:
6,255,585 →
Application:
09/240,457 →
Apparatus for and Method of Measuring a Jitter
Patent:
6,621,860 →
Application:
09/246,458 →
Apparatus for and Method of Detecting a Delay Fault
Patent:
6,291,979 →
Application:
09/251,096 →
Delta Time Event Based Test System
Patent:
6,360,343 →
Application:
09/259,401 →
Editing Apparatus and Generating Method for Physical Conversion Definition
Patent:
6,360,341 →
Application:
09/268,238 →
"Ic Testing Apparatus" by Takeshi Onishi
Patent:
6,198,274 →
Application:
09/272,832 →
Apparatus for Storing Customer Trays
Patent:
6,237,783 →
Application:
09/277,529 →
Skew Adjusting Method in Ic Testing Apparatus and Pseudo Device for Use in the Method
Patent:
6,327,678 →
Application:
09/286,358 →
Tray Transfer Arm, Electronic Component Testing Apparatus and Tray Transfer Method
Semiconductor Test System
Patent:
6,374,392 →
Application:
09/312,355 →
Semiconductor Device Testing Apparatus and Its Calibration Method
Patent:
6,417,682 →
Application:
09/314,887 →
Voltage Protection Circuit for Semiconductor Test System
Patent:
6,292,342 →
Application:
09/315,798 →
Ic Pickup, Ic Carrier and Ic Testing Apparatus Using the Same
Patent:
6,384,360 →
Application:
09/330,151 →
Electron Gun Used in an Electron Beam Exposure Apparatus
Patent:
6,252,344 →
Application:
09/335,398 →
Clock Signal Extraction Circuit
Patent:
6,549,598 →
Application:
09/338,234 →
Device Testing Apparatus and Test Method
Patent:
6,313,654 →
Application:
09/339,062 →
Method of Producing a Contact Structure
Patent:
6,218,203 →
Application:
09/344,851 →
Probe Card for Ic Testing Apparatus
Patent:
6,292,005 →
Application:
09/346,045 →
Semiconductor Component Mounting Apparatus
Patent:
6,184,698 →
Application:
09/347,867 →
Optical Sampler
Patent:
6,303,926 →
Application:
09/348,478 →
Semiconductor Device Testing System and Method
Patent:
6,366,109 →
Application:
09/348,489 →
Pick and Place Mechanism for Contactor
Patent:
6,359,454 →
Application:
09/368,002 →
Contact Structure Formed by Microfabrication Process
Patent:
6,255,727 →
Application:
09/368,003 →
Method and Apparatus for Driving Laser Diode
Patent:
6,285,692 →
Application:
09/369,046 →
Connector
Patent:
6,257,933 →
Application:
09/381,062 →
Particle Beam System with a Device for Reducing the Energy Width of a Particle Beam
Patent:
6,489,621 →
Application:
09/400,929 →
Electric Part Test System
Patent:
6,728,903 →
Application:
09/408,184 →
Apparatus for and Method of Measuring a Jitter
Patent:
6,687,629 →
Application:
09/408,280 →
Particle Beam Apparatus
Patent:
6,407,387 →
Application:
09/409,109 →
Scan Path Test Support
Patent:
6,484,280 →
Application:
09/409,936 →
Method of Measuring a Propagation Delay Time Through a Transmission Path in a Semiconductor Integrated Circuit Testing Apparatus and Semiconductor Integrated Circuit Testing Apparatus Using the Same
Patent:
6,369,601 →
Application:
09/413,768 →
Contact Structure Having Silicon Finger Contactors and Total Stack-Up Structure Using Same
Patent:
6,232,669 →
Application:
09/415,913 →
Output Amplitude Control Circuit
Patent:
6,246,279 →
Application:
09/428,612 →
Electrostatic Deflector for Electron Beam Exposure Apparatus
Patent:
6,509,568 →
Application:
09/431,441 →
Test Pattern Generator, a Testing Device, and a Method of Generating a Plurality of Test Patterns
Patent:
6,769,083 →
Application:
09/437,249 →
W - Cdma Analyzing Apparatus, Method of Displaying Results of W-Cdma Analysis, and Recording Medium Carrying Record of Program for Displaying Results of W-Cdma Analysis
Patent:
6,519,227 →
Application:
09/442,272 →
Semiconductor Test System
Patent:
7,173,443 →
Application:
09/443,021 →
Fail Information Obtaining Device and Semiconductor Memory Tester Using the Same
Patent:
6,571,353 →
Application:
09/444,300 →
Socket and Connector
Patent:
6,213,804 →
Application:
09/457,764 →
Method of Removing Particles from Stage and Cleaning Plate
Patent:
6,565,419 →
Application:
09/497,819 →
Contact Structure and Production Method Thereof
Patent:
6,540,524 →
Application:
09/503,903 →
Attenuation Equailizer for Transmission lines
Patent:
6,239,667 →
Application:
09/526,916 →
Data writing apparatus, data writing method, and tester
Patent:
6,219,289 →
Application:
09/533,734 →
Particle Beam Apparatus for Tilted Observation of a Specimen
Compressed Data Restoration Apparatus, Semiconductor Tester Equipped with Same, and Data Compression/Restoration Method
Patent:
6,629,278 →
Application:
09/536,337 →
Quadrature demodulator quadrature demodulation method and recording medium
Patent:
6,294,952 →
Application:
09/577,111 →
Voltage drive circuit, voltage drive apparatus and semiconductor-device testing apparatus
Patent:
6,294,949 →
Application:
09/588,615 →
Contact structure and assembly mechanism thereof
Patent:
6,343,940 →
Application:
09/596,437 →
Modular interface between test and application equipment
Application:
09/642,930 →
Jitter Measuring Device and Method
Patent:
6,795,496 →
Application:
09/647,908 →
Jitter Measurement Apparatus and Its Method
Patent:
6,598,004 →
Application:
09/650,000 →
Method and Apparatus for Administering Inversion Property in a Memory Tester
Patent:
6,973,404 →
Application:
09/659,198 →
Method and Apparatus for No-Latency Conditional Branching
Patent:
6,968,545 →
Application:
09/659,256 →
Method and Apparatus for Executing a Program Using Primary, Secondary, and Tertiary Memories
Patent:
6,598,112 →
Application:
09/659,259 →
Method and Apparatus for Inserting Programmable Latency Between Address and Data Information in a Memory Tester
Patent:
6,591,385 →
Application:
09/659,539 →
Memory Tester Has Memory Sets Configurable for Use as Error Catch Ram, Tag Ram's, Buffer Memories and Stimulus Log Ram
Patent:
6,851,076 →
Application:
09/672,650 →
Memory Tester Tests Multiple Dut's Per Test Site
Patent:
6,671,844 →
Application:
09/677,202 →
Deflection Arrangement for Separating Two Particle Beams
Patent:
6,509,569 →
Application:
09/690,425 →
Apparatus and Method for Storing Information During a Test Program
Patent:
6,687,855 →
Application:
09/693,218 →
Memory Tester Omits Programming of Addresses in Detected Bad Columns
Patent:
6,748,562 →
Application:
09/702,578 →
Memory Tester with Enhanced Post Decode
Patent:
6,687,861 →
Application:
09/702,631 →
Method and Apparatus for Testing Semiconductor Devices
Wideband Optical Amplifier and Wideband Variable Wavelength Optical Source
Jitter Measuring Device and Method
Test Vector Compression Method
Apparatus for and Method of Measuring Jitter
Method of Extracting Characters and Computer-Readable Recording Medium
Multi-Beam Exposure Apparatus Using a Multi-Axis Electron Lens, Electron Lens Convergencing a Plurality of Electron Beam and Fabrication Method of a Semiconductor Device
Multi-Beam Exposure Apparatus Using a Multi-Axis Electron Lens, Fabrication Method of a Semiconductor Device
Apparatus for and Method of Measuring Cross-Correlation Coefficient Between Signals
Digital Signal Transition Splitting Method and Apparatus
Algorithmically Programmable Memory Tester with Breakpoint Trigger, Error Jamming and 'Scope Mode That Memorizes Target Sequences
Algorithmically Programmable Memory Tester with History Fifo's That Aid in Error Analysis and Recovery
Semiconductor Device Testing Apparatus
Integrated Circuit Tester with Multi-Port Testing Functionality
Method and Apparatus for Testing Digital Devices Using Transition Timestamps
Analog to Digital Signal Conversion Method and Apparatus
Patent:
6,462,693 →
Application:
09/875,848 →
Circuit Pattern Design Method, Circuit Pattern Design System, and Recording Medium
Circuit Pattern Design Method,Exposure Method, Charged-Particle Beam Exposure System
Apparatus for and Method of Measuring Jitter
Patent:
7,203,229 →
Application:
09/882,290 →
Algorithmically Programmable Memory Tester with Test Sites Operating in a Slave Mode
Method and Apparatus for Testing Semiconductor Devices
Method and Apparatus for Analog to Digital Conversion Using Time-Varying Reference Signal
Patent:
6,429,799 →
Application:
09/905,747 →
Methods and Apparatus for Minimizing Current Surges During Integrated Circuit Testing
Timing Calibration Method and Semiconductor Device Testing Apparatus Having Timing Calibration Function
Semiconductor memory device tester
Semiconductor Memory Testing Method and Apparatus
Bandwidth Matching for Scan Architectures in an Integrated Circuit
Circuit for Providing a Logical Output Signal in Accordance with Crossing Points of Differential Signals
Semiconductor Memory Testing Device
Input Delay Correcting System and Method for a/D Converter and Storage Medium
Semiconductor Device Testing Apparatus and a Test Tray for Use in the Testing Apparatus
Semiconductor Device Manufacturing System and Electron Beam Exposure Apparatus
Filter for Injecting Data Dependent Jitter and Level Noise
Contact Structure and Production Method Thereof and Probe Contact Assembly Using Same
Virtualized Generic Equipment Model Data and Control Router for Factory Automation
N-Squared Algorithm for Optimizing Correlated Events
Contact Structure and Production Method Thereof
Charged Particle Beam Exposure Apparatus, Device Manufacturing Method, and Charged Particle Beam Applied Apparatus
Device, Method, and System for Detecting the Presence of Liquid in Proximity to Electronic Components
Measuring Apparatus and Measuring Method
Comparator Circuit for Semiconductor Test System
Cooler for Electrical and/ or Electronic Components, Linked to Present Cooling Needs
Device Power Supply and Ic Test Apparatus
A Pga Connector and a Pga Socket
System and Method for Testing Circuitry on a Wafer
Contact Structure with Flexible Cable and Probe Contact Assembly Using Same
Contact Structure Production Method
Plug-Type Connector for Simultaneously Connecting Several Coaxial Cables
Reconstruction of Non-Deterministic Algorithmic Tester Stimulus Used as Input to a Device Under Test
System and Method for Heterogeneous Multi-Site Testing
Empirical Data Based Test Optimization Method
Signal Preconditioning for Analog-to-Digital Conversion with Timestamps
Measuring and/or Calibrating a Test Head
Electron Beam Length-Measurement Apparatus and Measurement Method
Method and Apparatus for Testing Circuit Using Light Emission
Calibration Method for Interleaving an a/D Converter
Electrical System Like a Testing System for Testing the Channels of a Communication System
System and Method for Testing Circuitry Using an Externally Generated Signature
Exposure Apparatus, Control Method Thereof, and Device Manufacturing Method
Connecting Member, a Micro-Switch, a Method for Manufacturing a Connecting Member, and a Method for Manufacturing a Micro-Switch
Electron Beam Monitoring Sensor and Electron Beam Monitoring Method
Electron Beam Writing Equipment Using Plural Beams and Method
Systems and Methods for Injection of Test Jitter in Data Bit-Streams
Digitizer Apparatus and Semiconductor Testing Apparatus
Comparator Including a Differential Transistor Pair and a Diode Arrangement
Electron Beam Generating Apparatus and Electron Beam Exposure Apparatus
Memory Defect Remedy Analyzing Method and Memory Test Instrument
Test Apparatus and Test Method for Testing Plurality of Devices in Parallel
Holding Device for Electronic Part Test, and Device and Method for Electronic Part Test
Electron Beam Exposure Apparatus and Electron Beam Deflection Apparatus
Electron Beam Exposure Apparatus, Electron Beam Method, Semiconductor Device Manufacturing Method, Mask, and Mask Manufacturing Method
Fail Analysis Device
Electron Beam, Generating Device, and Testing Device
Cooling a Microchip on a Circuit Board
Apparatus for Calibrating High Frequency Signal Measurement Equipment
Systems and Methods for Testing Performance of an Electronic Device
Multiple-Output Arbitrary Waveform Generator and Mixed Lsi Tester
Semiconductor Memory Test Apparatus and Method for Address Generation for Defect Analysis
Semiconductor Device Tester
Semiconductor Testing Apparatus
Electronic Part Test Apparatus
Semiconductor Test Device Having Clock Recovery Circuit
Voltage-Impressed Current Measuring Apparatus and Current Buffers with Switches Used Therefor
Orthogonal Modulation Device, Method, Program, Recording Medium, and Modulation Device
Phase Measurement Device, Method, Program, and Recording Medium
Electronic Device Test Apparatus
Temperature Control Device and Temparature Control Method
Operational Amplifier Selecting One of Inputs, and an Amplifying Apparatus Using the Op Amplifier the Verification Method
Phase Measurement Device, Method , Program, and Recording Medium
Image Sensor Test System
Connector
Systems and Methods for Testing a Device-Under-Test
Multi-Electron Beam Exposure Method and Apparatus
Switch, Integrated Circuit Device, and Method of Manufacturing Switch
Modeling an Electronic Device
Transition Tracking
Digital Measurements of Spread Spectrum Clocking
Electron Beam Exposure Apparatus, Electron Beam Exposure Apparatus Calibration Method, and Semiconductor Element Manufacturing Method
Electron Beam Exposure Apparatus, Deflection Apparatus, and Electron Beam Exposure Method
Cost Estimation for Device Testing
Memory Tester Uses Arbitrary Dynamic Mappings to Serialize Vectors into Transmitted Sub-Vectors and De-Serialize Received Sub-Vectors into Vectors
Methods and Apparatus for Optimizing Lists of Waveforms
Device Testing Control
Electron Beam Irradiation Apparatus, Electron Beam Exposure Apparatus, and Defect Detection Method
Circuit and Method for Determining Integrated Circuit Propagation Delay
Electron Beam Exposure Apparatus, Electron Beam Exposing Method, Semiconductor Element Manufacturing Method, and Pattern Error Detection Method
Cooling fin connected to a cooling unit and a pusher of the testing apparatus
Heater-Equipped Pusher, Electronic Component Handling Apparatus, and Temperature Control Method for Electronic Component
Power Supply Circuit and Testing Device
Apparatus and Method for Testing Semiconductor Device
Systems and Methods for Adaptively Compressing Test Data
Apparatus for Handling Electronic Components and Method for Controlling Temperature of Electronic Components
Coaxial Cable Unit, Test Apparatus, and Cpu System
Propagation Measuring Apparatus and a Propagation Measuring Method
Instrument Rack with Direct Exhaustion
Input-Output Circuit and a Testing Apparatus
Method and Apparatus for Testing Integrated Circuits
Polynomial Fit for Jitter Separation
Measuring Apparatus and Measuring Method
Insert Attachable to an Insert Magazine of a Tray for Holding an Area Array Type Electronic Component to Be Tested
Dynamic Waveform Resource Management
Wireless No-Touch Testing of Integrated Circuits
Apparatus for Testing Integrated Circuits Having an Integrated Unit for Testing Digital and Analog Signals
Test Apparatus and Test Method
Multiple Clocks with Superperiod
Printed Circuit Board with Improved Cooling of Electrical Component
Verification of Integrated Circuit Tests Using Test Simulation and Integrated Circuit Simulation with Simulated Failure
Parameterized Signal Conditioning
Report Format Editor for Circuit Test
Provisioning and Use of Security Tokens to Enable Automated Test Equipment
Micro Thermal Chamber Having Proximity Control Temperature Management for Devices Under Test
Apparatus, System and/or Method for Converting a Serial Test to a Parallel Test
Apparatus, System and/or Method for Combining Multiple Tests to a Single Test in a Multiple Independent Port Test Environment
Transfer Clocks for a Multi-Channel Architecture
Test Apparatus
Timing Generator and Test Apparatus
Sigma-Delta Modulator with Pwm Output
Source Current Measurement Apparatus and Test Apparatus
Patent:
6,956,393 →
Application:
10/854,688 →
Test Apparatus
Test Apparatus, Computer Readable Program for Test Apparatus, Test Pattern Recording Medium,and Method for Controlling Test Apparatus
Coaxial Dc Block
Wideband Signal Analyzing Apparatus, Wideband Period Jitter Analyzing Apparatus, and Wideband Skew Analyzing Apparatus
An Electrical Test Circuit with an Active-Load and an Output Sampling Capability
Failure Analyzing System and Method for Displaying the Failure
Semiconductor Test Apparatus
Mosfet Drive Circuit, Programmable Power Supply and Semiconductor Test Apparatus
Parallel Calibration System for a Test Device
Tester for Testing an Electronic Device Using Oscillator and Frequency Divider
Sequencer Unit with Instruction Buffering
Method and Apparatus for Electromagnetic Interference Shielding in an Automated Test System
Signal Isolating Blindmate Connector
Patent:
6,981,889 →
Application:
10/903,271 →
Carrier Module for Adapting Non-Standard Instrument Cards to Test Systems
Test Apparatus, Correction Value Managing Method, and Computer Program
Method and System for Controlling Interchangeable Components in a Modular Test System
Channel with Domain Crossing
Method and Structure to Develop a Test Program for Semiconductor Integrated Circuits
Method and Structure to Develop a Test Program for Semiconductor Integrated Circuits
Low Distortion Variable Gain and Rooting Amplifier with Solid State Relay
Test Apparatus, Configuration Method, and Device Interface
Construction and Use of Dielectric Plate for Mating Test Equipment to a Load Board of a Circuit Tester
Measurement Instrument and Measurement Method
Calibration Method of Time Measurement Apparatus
Test Apparatus and Testing Method
Program, Test Apparatus and Testing Method
Methods and Apparatus for Providing Scan Patterns to an Electronic Device
Methods and Apparatus for Programming and Operating Automated Test Equipment
Phase Locked Time Interval Analyzer
Patent:
6,975,106 →
Application:
10/966,229 →
Connector
Application of Paging to a Dataset, Graphical Display Window and Graphical Scrollbar Grip
System, Method and Apparatus for Providing Ground Separation Between Different Environments
Test Apparatus and Test Method
Mock Wafer, System Calibrated Using Mock Wafer, and Method for Calibrating Automated Test Equipment
Method and Apparatus for Generating a Phase-Locked Output Signal
Method and Apparatus for Variable Sigma-Delta Modulation
Systems and Methods of Allocating Device Testing Resources to Sites of a Probe Card
Method for Optimizing Test Order, and Machine-Readable Media Storing Sequences of Instructions to Perform Same
Patent:
7,050,922 →
Application:
11/036,574 →
Incremental Generation of Calibration Factors for Automated Test Equipment
Clamp and Method for Operating Same
Test Apparatus and Test Method for Testing a Device Under Test
Current Measurement Device and Test Device
Method and Apparatus for Quantifying the Timing Error Induced by Crosstalk Between Signal Paths
Method and Apparatus for Quantifying the Timing Error Induced by an Impedance Variation of a Signal Path
Micro-Switch Device and Method for Manufacturing the Same
Test Apparatus and Power Supply Circuit
Testing Apparatus and Testing Method
Digitally Controlled Modular Power Supply for Automated Test Equipment
Patent:
7,154,253 →
Application:
11/087,157 →
Switch Control Apparatus, Semiconductor Device Test Apparatus and Sequence Pattern Generating Program
Electrostatic Chuck and Substrate Fixing Method Using the Same
Charged Particle Beam Photolithography Machine, Standard Substrate for Correcting Misalignment Factor of Charged Particle Beam Photolithography Machine, Correcting Method for Charged Particle Beam Photolithography Machine, and Method of Manufacturing Electronic Dev
Compilation of Calibration Information for Plural Testflows
Test Device and Setting Method
Device for Releasable Connecting an Interface with a Test Equipment
Multi-Strobe Apparatus, Testing Apparatus, and Adjusting Method
Jitter Measuring Apparatus and a Testing Apparatus
Testing Apparatus and a Testing Method
Model Based Testing for Electronic Devices
Fluid Sampling Device, Tubular Sampling Coupon, and System and Method for Sampling Equipment and Fluid Conditions
Pin Coupler for an Integrated Circuit Tester
Using a Leaf Spring to Attach Clamp Plates with a Heat Sink to Both Sides of a Component Mounted on a Printed Circuit Assembly
Test Device
Position Detecting Apparatus, a Position Detecting Method and an Electronic Component Carrying Apparatus
Test Apparatus and Control Method
Apparatus for Measuring Jitter and Method of Measuring Jitter
Channel Switching Circuit
Pressing Member and Electronic Device Handling Apparatus
Method of Connecting Probe Pin to Circuit Board and Method of Manufacturing Probe Card
Power Amplifying Apparatus
Precision Pulse Placement to Form a Binary Pulse Signal
Probe Card and the Production Method
Method and System for Per-Pin Clock Synthesis of an Electronic Device Under Test
Fast Synchronization of a Number of Digital Clocks
Semiconductor Testing Apparatus and Method of Testing Semiconductor
Jitter Applying Circuit and Test Apparatus
Test Apparatus and Test Method
Test Apparatus, Phase Adjusting Method and Memory Controller
Test Apparatus and Testing Method
Test Apparatus and Testing Method
Semiconductor Integrated Circuit Switch Matrix
Detection Apparatus, Detection Method, and Program
Testing Device
Analog Signal Generation Using a Delta-Sigma Modulator
Test Apparatus and Testing Method
Multi-Electron Beam Exposure Method and Apparatus
Self Contained, Liquid to Air Cooled, Memory Test Engineering Workstation
Test Apparatus, Optical Coupler and Method of Manufacturing Same
Test Apparatus, Timing Generator and Program Therefor
Source Synchronous Sampling
Electron Beam Exposure Mask, Electron Beam Exposure Method, and Electron Beam Exposure System
Mask Inspection Apparatus, Mask Inspection Method, and Electron Beam Exposure System
Memory Tester Having Defect Analysis Memory with Two Storage Sections
Carousel Device, System and Method for Electronic Circuit Tester
Test Apparatus, Program and Recording Medium
Zero Insertion Force Printed Circuit Assembly Connector System and Method
Patent:
7,147,499 →
Application:
11/253,446 →
Insert and Tray for Electronic Device Handling Apparatus, and Electronic Device Handling Apparatus
Test Apparatus, Clock Generator and Electronic Device
Method and Apparatus for Eliminating Automated Testing Equipment Index Time
Driver Circuit, Test Apparatus and Adjusting Method
Resource Matrix, System, and Method for Operating Same
Jitter Measuring Apparatus, Jitter Measuring Method and Test Apparatus
Connector
Sampling Circuit
Test Apparatus and Test Method
Conveyor Device, Electronic Device Handling Apparatus and Conveying Method in Electronic Device Handling Apparatus
System-On-A-Chip Pipeline Tester and Method
Transmission System, Signal Receiver, Test Apparatus and Test Head
Pin Connector
Estimating Boundaries of Schmoo Plots
Test Apparatus
Test Apparatus and Test Method
Optical Module Socket
Position Detection Apparatus, Position Detection Method, Testing Apparatus, and Camera Module Manufacturing Apparatus
Testing Method, Communication Device, and Testing System
Error Detection in Compressed Data
Test Apparatus
Apparatus for Storing and Formatting Data
Method and Machine-Readable Media for Inferring Relationships Between Test Results
Methods and Apparatus Using a Service to Launch and/or Monitor Data Formatting Processes
Methods and Systems for Derivation of Missing Data Objects from Test Data
Method and System for Selectively Processing Test Data Using Subscriptions in a Multi-Formatter Architecture
Systems and Methods for Accumulation of Summaries of Test Data
System, Method and Apparatus for Completing the Generation of Test Records After an Abort Event
Excitation Signal Generator for Improved Accuracy of Model-Based Testing
Testing a Device Under Test by Sampling Its Clock and Data Signal
Asynchronous Digital Data Capture
Self-Repair System and Method for Providing Resource Failure Tolerance
Test System and Method for Testing Electronic Devices Using a Pipelined Testing Architecture
Memory Device Fail Summary Data Reduction for Improved Redundancy Analysis
Method and Apparatus for Determining Which Timing Sets to Pre-Load into the Pin Electronics of a Circuit Test System, and for Pre-Loading or Storing Said Timing Sets
Measuring Apparatus, Measuring Method, Testing Apparatus, Testing Method, and Electronics Device
Pin Electronic for Automatic Testing of Integrated Circuits
Memory Device Fail Summary Data Reduction for Improved Redundancy Analysis
Test Device with Test Parameter Adaptation
Wavelength Determining Device, Wavelength Meter Equipped with the Device, Wavelength Determining Method, Program, and Recording Medium
Calibration Apparatus and Method Using Pulse for Frequency, Phase, and Delay Characteristic
Jitter Amplifier, Jitter Amplification Method, Electronic Device, Testing Apparatus, and Testing Method
Performance Board for Electrically Connecting a Device-Under-Test with a Test Apparatus, and a Test Apparatus for Testing a Device-Under-Test.
Analog to Digital Conversion Method Using Track/Hold Circuit and Time Interval Analyzer, and an Apparatus Using the Method
Test Apparatus and Test Method
Systems, Methods and Apparatus for Synthesizing State Events for a Test Data Stream
Testing Apparatus, Testing Method, Jitter Filtering Circuit, and Jitter Filtering Method
Apparatus, Systems and Methods for Processing Signals Between a Tester and a Plurality of Devices Under Test at High Temperatures and with Single Touchdown of a Probe Array
Testing Apparatus, and Testing Method
Graphically Extensible, Hardware Independent Method to Inspect and Modify State of Test Equipment
Re-Configurable Architecture for Automated Test Equipment
Waveform Generator, Waveform Shaper, and Testing Apparatus
Arbitrary Waveform Generator, Arbitrary Waveform Generate Method, Testing Apparatus, and Program
Mapping Logic for Controlling Loading of the Select Ram of an Error Data Crossbar Multiplexer
Measurement Board for Electronic Device Test Apparatus
Method and Apparatus for a Paddle Board Probe Card
Method for Adjusting Signal Generator and Signal Generator
Methods for Sampling Equipment and Fluid Conditions
Test Apparatus for Testing Multiple Electronic Devices
Electrical Coupling Apparatus and Method
Probability Density Function Separating Apparatus, Probability Density Function Separating Method, Testing Apparatus, Bit Error Rate Measuring Apparatus, Electronic Device, and Program
Electron-Beam Exposure System
Voltage Generating Apparatus, Current Generating Apparatus, and Test Apparatus
Test Apparatus, and Method of Manufacturing Semiconductor Memory
Source Synchronous Timing Extraction, Cyclization and Sampling
Fabric-Based High Speed Serial Crossbar Switch for Ate
Cooling Fin Connected to a Cooling Unit and a Pusher of the Testing Apparatus
Semiconductor Test Apparatus
Connection Unit, a Board for Mounting a Device Under Test, a Probe Card and a Device Interfacing Part
Method and System for Digital to Analog Conversion Using Multi-Purpose Current Summation
Digital to Analog Conversion Using Summation of Multiple Dacs
Measuring Apparatus, Measuring Method, and Test Apparatus
Bimorph Switch, Bimorph Switch Manufacturing Method, Electronic Circuitry and Electronic Circuitry Manufacturing Method
Optical Frequency Measurement Apparatus and Optical Frequency Measurement Method
Testing Apparatus and Testing Method
Testing Apparatus and Testing Method
Power Source Apparatus
Test Apparatus and Testing Method
Method and an Apparatus for Measuring the Input Threshold Level of Device Under Test
A-D Converter, a-D Convert Method, and a-D Convert Program
Wafer Test Head Architecture and Method of Use
Electrical Test Circuit with Active-Load and Output Sampling Capability
Diagnostic Information Capture from Logic Devices with Built-in Self Test
Test Apparatus, and Control Method
Patent:
7,340,364 →
Application:
11/546,926 →
Test Apparatus, and Control Method
Measuring Apparatus, Measuring Method, Testing Apparatus, Testing Method, and Electronic Device
Process for Improving Design Limited Yield by Efficiently Capturing and Storing Production Test Data for Analysis Using Checksums, Hash Values, or Digital Fault Signatures
Timing Generator and Semiconductor Testing Apparatus
Electronic Device Test Apparatus for Successively Testing Electronic Devices
Inverse Characteristic Measuring Apparatus, Distortion Compensation Apparatus, Method, Program, and Recording Medium
Jitter Injection Apparatus, Jitter Injection Method, Test Apparatus, and Communication Chip
Calibration Apparatus, Calibration Method, and Testing Apparatus
Ate Architecture and Method for Dft Oriented Testing
System and Method for Frequency Offset Testing
Test Apparatus, Adjustment Apparatus, Adjustment Method and Adjustment Program
High-Precision Foamed Coaxial Cable
Semiconductor Test Apparatus and Performance Board
Test Apparatus and Test Method
Method of Manufacturing a Pcb Having Improved Cooling
Stencil Design and Method for Cell Projection Particle Beam Lithography
Process for Identifying the Location of a Break in a Scan Chain in Real Time
Oscillator Circuit, Pll Circuit, Semiconductor Chip, and Test Apparatus
Heater Power Control Circuit and Burn-in Apparatus Using the Same
Interconnect Assemblies, and Methods of Forming Interconnects, Between Conductive Contact Bumps and Conductive Contact Pads
Forced Air Cooling of Components on a Probecard
Method and Apparatus for Improving Load Time for Automated Test Equipment
Automated Loader for Removing and Inserting Removable Devices to Improve Load Time for Automated Test Equipment
Evaluation of an Output Signal of a Device Under Test
Analysis Apparatus and Analysis Method
Laser Oscillator
Apparatus for Locating a Defect in a Scan Chain While Testing Digital Logic
Bimorph Element, Bimorph Switch, Mirror Element, and Method for Manufacturing These
Process for Improving Design-Limited Yield by Localizing Potential Faults from Production Test Data
Electric Power Applying Circuit and Test Apparatus
Methods and Apparatus for Testing a Circuit
High Voltage, High Frequency, High Reliability, High Density, High Temperature Automated Test Equipment (Ate) Switch Design
Patent:
7,348,791 →
Application:
11/685,873 →
System. Method and Apparatus Using at Least One Flex Circuit to Connect a Printed Circuit Board and a Socket Card Assembly That Are Oriented at a Right Angle to One Another
Probability Density Function Separating Apparatus, Probability Density Function Separating Method, Noise Separating Apparatus, Noise Separating Method, Testing Apparatus, Testing Method, Calculating Apparatus, Calculating Method, Program, and Recording Medium
Test Apparatus
High Impedance, High Parallelism, High Temperature Memory Test System Architecture
Measurement Apparatus, Test Apparatus, and Measurement Method
Test Apparatus and Test Method
Test Apparatus and Test Method
Electron Beam Generator for Multiple Columns
Apparatus/Method for Measuring the Switching Time of Output Signals of a Dut
Test Apparatus and Test Method
Feature-Oriented Test Program Development and Execution
System and Method for Electronic Testing of Multiple Memory Devices
Line-Width Measurement Adjusting Method and Scanning Electron Microscope
Pattern Measurement Apparatus and Pattern Measuring Method
Electron Beam Exposure Apparatus Involving the Position and Velocity Calculation
Clamp and Method for Operating Same
Test Apparatus, Program, and Test Method
Method and Apparatus for Displaying Test Data
Measurement Circuit and Test Apparatus
Power Supply Apparatus, Test Apparatus, and Electronic Device
Drive Method and Drive Circuit of Peltier Element, Attaching Structure of Peltier Module and Electronic Device Handling Apparatus
Apparatus for Manufacturing Taped Insulated Conductor and Method of Controlling Tape Winding Tension
Resource Access Manager for Controlling Access to a Limited-Access Resource
Test Unit and Test Apparatus
Electron-Beam Size Measuring Apparatus and Size Measuring Method with Electron Beams
Scanning Electron Microscope with Length Measurement Function and Dimension Length Measurement Method
Test Apparatus
Test System and Daughter Unit
Method for Operating a Secure Semiconductor Ip Server to Support Failure Analysis
A-D Converter and a-D Convert Method
A-D Converter and a-D Convert Method
Test Apparatus and Selection Apparatus
Test Apparatus and Test Method
Waveform Generator, Waveform Generating Device, Test Apparatus, and Machine Readable Medium Storing a Program Threrof
Performance Board and Cover Member
Electronic Device
Error Catch Ram Support Using Fan-Out/Fan-in Matrix
Wafer Boat for Semiconductor Testing
Pattern Dimension Measuring Apparatus and Pattern Area Measuring Method
Semiconductor Test Program Debug Device
Communication Circuit for a Bi-Directional Data Transmission
Locating Hold Time Violations in Scan Chains by Generating Patterns on Ate
Comparator and a-D Converter
Test Apparatus
Test Apparatus and Performance Board
Measuring Apparatus, Measuring Method, Recording Medium, and Test Apparatus
Voltage Generating Apparatus, Current Generating Apparatus, and Test Apparatus
Test Apparatus, Probe Card, and Test Method
Pressing Member and Electronic Component Handling Device
Tester, Method for Testing a Device Under Test and Computer Program
Electronic Device Testing Apparatus
System and Method for Electronic Testing of Devices
System and Method for Simulating a Semiconductor Wafer Prober and a Class Memory Test Handler
Screw-Less Latching System for Securing Load Boards
System and Method for Baseband Calibration
Pusher, Pusher Unit and Semiconductor Testing Apparatus
Test Apparatus
Signal-To-Noise Ratio Measurement for Discrete Waveform
Parallel Test Circuit with Active Devices
Patent:
8,384,410 →
Application:
12/035,378 →
Board Mount-Type Connector and Board Mount-Type Connector Assembly
Patent:
7,544,067 →
Application:
12/039,796 →
Testing Device, Testing Method, Computer Program Product, and Recording Medium
Test Apparatus, Test Method, Analyzing Apparatus and Computer Readable Medium
Carrier Module for Adapting Non-Standard Instrument Cards to Test Systems
Waveform Generator and Test Apparatus
Power Supply Circuit and Test Apparatus
Testing Module, Testing Apparatus and Testing Method
Methods for Analyzing Scan Chains, and for Determining Numbers or Locations of Hold Time Faults in Scan Chains
Measuring Device, Method, Program, and Recording Medium
Methods and Apparatus for Estimating a Position of a Stuck-at Defect in a Scan Chain of a Device Under Test
Electron Beam Exposure Apparatus and Method for Cleaning the Same
Semiconductor Relay
Apparatus, Method, and Computer Program for Obtaining a Time-Domain-Reflection Response-Information
Multi-Stage Data Processor with Signal Repeater
Electronic Device Test Apparatus and Method of Mounting of Performance Board in Electronic Device Test Apparatus
Electronic Device Test Apparatus and Method of Setting an Optimum Pushing Condition for Contact Arm of Electronic Device Test Apparatus
A Method of Fabricating a Probe Card Assembly Using Magnetically Aligned Electrical Contact Elements, a Stamped Construction Electrical Contact Element Usable with the Method, and a Standalone Probe Card Tester Formable Using the Method
Semiconductor Integrated Circuit Switch Matrix
Jitter Measurement Apparatus, Jitter Measurement Method, Recording Media, Communication System and Test Apparatus
Test Apparatus for Testing a Device Under Test and Device for Receiving a Signal
Digital Modulator, Digital Modulating Method, Digital Transceiver System, and Testing Apparatus
Sampling Apparatus, Sampling Method and Recording Medium
Measuring Board for Electronic Device Test Apparatus
Test Apparatus, Manufacturing Method, and Test Method
Electron Gun, Electron Beam Exposure Apparatus, and Exposure Method
Test Equipment and Semiconductor Device
Contact Device and Method for Producing the Same
A-D Convert Apparatus
Interconnection Substrate, Skew Measurement Method, and Test Apparatus
Modulation Method and Modulator Using Pulse Edge Shift
Differential Signal Transmitting Apparatus and a Test Apparatus
Test Apparatus and Test Method for Testing a Device Based on Quiescent Current
Testing Apparatus and Testing Method
Time-To-Digital Conversion with Calibration Pulse Injection
Test Apparatus
Deterministic Component Model Judging Apparatus, Judging Method, Program, Recording Medium, Test System and Electronic Device
Deterministic Component Model Identifying Apparatus, Identifying Method, Program, Recording Medium, Test System and Electronic Device
Test System, Electronic Device, and Test Apparatus
Device, Test Apparatus and Test Method
Voltage Generating Apparatus, Current Generating Apparatus, and Test Apparatus
Deterministic Component Identifying Apparatus, Identifying, Program, Recording Medium, Test System and Electronic Device
Methods and Apparatus That Selectively Use or Bypass a Remote Pin Electronics Block to Test at Least One Device Under Test
Transmit/Receive Unit, and Methods and Apparatus for Transmitting Signals Between Transmit/Receive Units
Thermal Controller for Electronic Devices
Advanced Thermal Control Interface
Time-To-Digital Conversion with Delay Contribution Determination of Delay Elements
Calibrating Signals by Time Adjustment
Device, Method, and Program for Signal Analysis, and Recording Medium
Decorrelation of Data by Using This Data
Format Transformation of Test Data
Characteristic Acquisition Device, Method and Program
Calibration Method of Electronic Device Test Apparatus
Test Apparatus and Test Method
Differential Comparator with Skew Compensation Function and Test Apparatus Using the Same
Measurement Apparatus, Test System, and Measurement Method for Measuring a Characteristic of a Device
Analog Digital Convert Apparatus, Analog Digital Convert Method, Control Apparatus and Program
Piezoelectric-Drive Apparatus, Method of Controlling Piezoelectric-Drive and Electronic Device
Measuring Apparatus, Measuring Method and Test Apparatus
Asynchronous Sigma-Delta Digital-Analog Converter
Test Module with Blocks of Universal and Specific Resources
Device, Method, Program, and Recording Medium for Error Factor Determination, and Output Correction Device and Reflection Coefficient Measurement Device Provided with the Device
Connection Unit, a Board for Mounting a Device Under Test, a Probe Card and a Device Interfacing Part
Electron-Beam Dimension Measuring Apparatus and Electron-Beam Dimension Measuring Method
Test Apparatus and Test Method with Features of Adjusting Phase Difference Between Data and Reference Clock and Acquiring Adjusted Data
Test Apparatus Having Bidirectional Differential Interface
Laser Apparatus
Test System and Back Annotation Method
Test Apparatus, Calibration Method, Program, and Recording Medium
Transmission Characteristics Measurement Apparatus, Transmission Characteristics Measurement Method, and Electronic Device
Test Apparatus and Driver Circuit
Laser Oscillator
Diagnosis Board Electrically Connected with a Test Apparatus for Testing a Device Under Test
Correcting Apparatus, Pdf Measurement Apparatus, Jitter Measurement Apparatus, Jitter Separation Apparatus, Electric Device, Correcting Method, Program, and Recording Medium
Variable Capacitor, Resonator and Modulator
A Semiconductor Test Device Capable of Modifying an Amplitude of an Output Signal of a Driver
Thermal Controller for Electronic Devices
Optical Measuring Apparatus
Container, a Method for Disposing the Same, and a Measurement Method
Electromagnetic Wave Measuring Apparatus, Measurement Method, a Program, and a Recording Medium
Test Apparatus and Test Method
Test Apparatus and Recording Medium
Light Measurement Apparatus and a Trigger Signal Generator
Method and Product for Testing a Device Under Test
Measurement Apparatus, Program, Recording Medium, and Measurement Method
Terahertz wave measuring apparatus having space arrangement structure and measuring method
Test Apparatus and Electronic Device
A-D Converter
Amplification Control Device, Test Signal Generation Module, Test Device, Amplification Control Method, Program, and Recording Medium
Method and Apparatus for Determining a Minimum/Maximum of a Plurality of Binary Values
Methods, Apparatus and Articles of Manufacture for Testing a Plurality of Singulated Die
Cell Projection Charged Particle Beam Lithography
Demodulation Apparatus, Test Apparatus and Electronic Device
Test Apparatus and Test Method
Test Apparatus Additional Module and Test Method
Test Apparatus Synchronous Module and Synchronous Method
Test Apparatus and Test Method
Test Apparatus and Test Method
Mask for Multi-Column Electron Beam Exposure, and Electron Beam Exposure Apparatus and Exposure Method Using the Same
Multi-Column Electron Beam Exposure Apparatus and Multi-Column Electron Beam Exposure Method
Electron Gun Minimizing Sublimation of Electron Source and Electron Beam Exposure Apparatus Using the Same
Fixing Apparatus for a Probe Card
Test Apparatus
Semiconductor Test Apparatus and Test Method
Semiconductor Test Apparatus and Test Method
Test Apparatus and Test Method
Collection Medium and Collection Amount Measuring Apparatus, and Measuring Method, Program, and Recording Medium of the Same
Switching Circuit, Signal Output Device and Test Apparatus
Switching Circuit, Signal Output Device and Test Apparatus
Test Apparatus and Electronic Device That Tests a Device Under Test
Electromagnetic Wave Measuring Apparatus
Container, Container Positioning Method, and Measuring Method
Test Electronics to Device Under Test Interfaces, and Methods and Apparatus Using Same
Signal Generating Apparatus and Test Apparatus
Signal Generating Apparatus and Test Apparatus
Level Shifter Using Sr-Flip Flop
Signal Generating Apparatus and Test Apparatus
Testing Apparatus
Test Apparatus and Test Method
Fixing Instrument
Charged Particle Beam Inspection Apparatus and Inspection Method Using Charged Particle Beam
Test Section Unit, Test Head and Electronic Device Testing Apparatus
Method and Apparatus for Determining Relevance Values for a Detection of a Fault on a Chip and for Determining a Fault Probability of a Location on a Chip
System, Method and Computer Program for Detecting an Electrostatic Discharge Event
Chip Tester, Method for Providing Timing Information, Test Fixture Set, Apparatus for Post-Processing Propagation Delay Information, Method for Post-Processing Delay Information, Chip Test Set Up and Method for Testing Devices Under Test
Water Jacket for Cooling an Electronic Device on a Board
Test Apparatus and Transmission Apparatus
Test Apparatus and Circuit Apparatus
A-D Convert Apparatus and Control Method
Backup Line Allocation Apparatus, Memory Repairing Apparatus, Backup Line Allocation Method, Memory Manufacturing Method, and Recording Medium
Test Apparatus and Test Module
Test Apparatus and Test Method
Output Apparatus and Test Apparatus
Output Apparatus and Test Apparatus
Patent:
7,978,109 →
Application:
12/708,508 →
Sequence Control Apparatus and Test Apparatus
Substrate Structure and Manufacturing Method
Electromagnetic Wave Measuring Apparatus, Measuring Method, Program, and Recording Medium
Electromagnetic Wave Measuring Apparatus, Measuring Method, Program, and Recording Medium
Abnormality Detecting Apparatus for Detecting Abnormality at Interface Portion of Contact Arm
Valve Device and Temperature Adjusting System for Electronic Device
Testing Apparatus for Multiple Identical Circuit Components
Frequency Characteristics Measuring Device
Comparison Judgment Circuit
Method and Structure to Develop a Test Program for Semiconductor Integrated Circuits
Driver Comparator Circuit
Circuit Board Unit and Testing Apparatus
Pll Circuit
Stage Device and Stage Cleaning Method
D/A Converter and Electron Beam Exposure Apparatus
Pattern Measuring Apparatus and Pattern Measuring Method
Test System and Method for Testing Electronic Devices Using a Pipelined Testing Architecture
High Impedance, High Parallelism, High Temperature Memory Test System Architecture
Probe Wafer, Probe Device, and Testing System
Test Apparatus and Test Method
Test Apparatus and Power Supply Apparatus
Method of Sharing a Test Resource at a Plurality of Test Sites, Automated Test Equipment, Handler for Loading and Unloading Devices to Be Tested and Test System
Frequency Characteristics Measuring Device
Test Apparatus, Test Method and Computer Readable Medium
Production Device, Production Method, Test Apparatus and Integrated Circuit Package
Wafer Tray and Test Apparatus
Probe Apparatus and Test Apparatus
Computing Device for Enabling Concurrent Testing
Light Receiving Device, Light Receiving Device Manufacturing Method, and Light Receiving Method
Electronic Device Mounting Apparatus and Method of Mounting Electronic Device
Test System and Probe Apparatus
Test Apparatus for Digital Modulated Signal
Electron Beam Lithography Apparatus and Electron Beam Lithography Method
Multi-Column Electron Beam Exposure Apparatus and Magnetic Field Generation Device
Electron Detection Device and Scanning Electron Microscope
Stage Device
Receiving Apparatus, Test Apparatus, Receiving Method, and Test Method
Signal Output Device, and Output Apparatus of Signal Source of Signals and of Laser Beam Pulses
Test Apparatus and Transmission Device
Communication System, Test Apparatus, Communication Apparatus, Communication Method and Test Method
Test Apparatus and Test Method
Test Apparatus, Test Method and System
Test Apparatus and Test Method
Test Apparatus and Information Processing System
Wafer Unit Manufacturing Method for Testing a Semiconductor Chip Wafer
Test Wafer Unit and Test System
Test System and Write Wafer
Apparatus for Manufacturing Substrate for Testing, Method for Manufacturing Substrate for Testing and Recording Medium
Test System and Substrate Unit for Testing
Wafer Unit for Testing Semiconductor Chips and Test System
Wafer Unit for Testing and Test System
Contact Equipment and Circuit Package
Test Apparatus and Test Method
Memory Test Apparatus and Testing Method
Test Apparatus for Digital Modulated Signal
Pattern Generator
Pattern Generator and Memory Testing Device Using the Same
Method and Apparatus for the Determination of a Repetitive Bit Value Pattern
Apparatus and Method for Estimating Data Relating to a Time Difference and Apparatus and Method for Calibrating a Delay Line
Test Head Moving Apparatus and Electronic Component Testing Apparatus
High Speed, High Resolution, High Precision Voltage Source/Awg System for Ate
Leakage Compensated Electronic Switch
Method and Apparatus for Complex Time Measurements
Test Module and a Test Method for Reading a Number of Fails for a Device Under Test (Dut)
Electronic Device Test Apparatus
Test Head and Semiconductor Wafer Test Apparatus Comprising Same
Test Apparatus, Transmission Apparatus, Receiving Apparatus, Test Method, Transmission Method and Receiving Method
Test Apparatus and Test Method
Electronic Device and Manufacturing Method
Test Apparatus and Synchronization Method
Switching Apparatus and Test Apparatus
Test Apparatus Having Optical Interface and Test Method
Test Apparatus, Test Method, and Device Interface
Test Apparatus, Test Method, and Device Interface for Testing a Device Under Test Using Optical Signaling
Test Apparatus and Manufacturing Method
Clock Hand-Off Circuit
Test Apparatus and Testing Method
Mask inspection apparatus and mask inspection method
Mask Inspection Apparatus and Image Generation Method
Pattern Measurement Apparatus and Pattern Measurement Method
Electron beam lithography apparatus and electron beam lithography method
Wireless Power Supply Apparatus
Wireless Power Receiving Apparatus and Wireless Power Supply System
Semiconductor Device, Method for Manufacturing of Semiconductor Device, and Switching Circuit
Test Apparatus and Circuit Module
Test Apparatus, Circuit Module and Manufacturing Method
Electronic Component Handling Apparatus, Electronic Component Testing Apparatus, and Electronic Component Testing Method
Connector And Semiconductor Testing Device Having The Same
Data Latch Circuit
Connector and Semiconductor Testing Device Using the Same
Switching Apparatus and Test Apparatus
Test Apparatus
Switching Apparatus
Test Apparatus and Test Method
Data Processing Unit and a Method of Processing Data
Signal Distribution Structure and Method for Distributing a Signal
State Machine and Generator for Generating a Description of a State Machine Feedback Function
Re-Configurable Test Circuit, Method for Operating an Automated Test Equipment, Apparatus, Method and Computer Program for Setting Up an Automated Test Equipment
Pattern Measurement Apparatus and Pattern Measurement Method
Pattern Measuring Apparatus and Pattern Measuring Method
Pin Card
Pin Card
Semiconductor Wafer Test Apparatus
Switching Circuit and Test Apparatus
Power Supply Apparatus for Test Apparatus
Measurement Circuit and Test Apparatus
Test Apparatus with Power Cutoff Section Having Variable Maximum and Minimum Thresholds
Probe Card Holding Apparatus with Probe Card Engagement Structure
Device Interface Apparatus and Test Apparatus
Test Apparatus, Test Method and Manufacturing Method for Testing a Device Under Test Packaged in a Test Package
Control Apparatus and Control Method
Test Apparatus and Test Method
Wireless Power Receiving Apparatus
Power Supply Apparatus for Test Apparatus
Avalanche Breakdown Test Apparatus
Analog to Digital Converter and Digital to Analog Converter
Test Apparatus
Temperature Control Device and Temperature Control Method
Connector and Interface Apparatus Comprising Connector
Light Source, Optical Signal Generator, and Electrical Signal Generator
Switching Apparatus and Test Apparatus
Switching Apparatus and Test Apparatus
Optical Signal Output Apparatus, Electrical Signal Output Apparatus, and Test Apparatus
Switching Apparatus and Test Apparatus
Manufacturing Method, Switching Apparatus, Transmission Line Switching Apparatus, and Test Apparatus
Optical Device and Optical Modulation Apparatus
Optical Device and Optical Modulation Apparatus
Switching Apparatus, Switching Apparatus Manufacturing Method, Transmission Line Switching Apparatus, and Test Apparatus
Method for Manufacturing Bimorph Actuator
Test Apparatus
Test Apparatus and Repair Analysis Method
Repetition Frequency Control Device
Repetition Frequency Control Device
Defect Review Apparatus and Defect Review Method
Pattern Inspection Apparatus and Pattern Inspection Method
Emo Linkage Simplification
Test Apparatus
Stage Device and Stage Cleaning Method
Test Apparatus
Test Head, Test Board and Test Apparatus
Edge Connector
Connector, Cable Assembly, and Semiconductor Testing Device
Connector and Semiconductor Testing Device Including the Connector
Connector and Semiconductor Testing Device Including the Connector
Optimized Automated Test Equipment Multi-Path Receiver Concept
Apparatus and Method for Wireless Testing of a Plurality of Transmit Paths and a Plurality of Receive Paths of an Electronic Device
Power Supply Apparatus for Test Apparatus
Pattern-Height Measuring Apparatus and Pattern-Height Measuring Method
Test Apparatus and Test Method for a/D Converter
Test Apparatus and Test Module
Test Apparatus and Test Module
Test Apparatus and Test Module
Electron Beam Exposure Apparatus and Electron Beam Exposure Method
Interposer Between a Tester and Meaterial Handling Equipment to Separate and Control Different Requests of Multiple Entities in a Test Cell Operation
Creation and Scheduling of a Decision and Execution Tree of a Test Cell Controller
Test Apparatus and Test Method
Test Apparatus and Test Method
Test Apparatus and Test Method
Electromagnetic Wave Measurement Device, Measurement Method, and Recording Medium
Signal Display Device, Method, and Recording Medium
Signal Measurement Device, Signal Measurement Method, and Recording Medium
Measurement Apparatus and Measurement Method
Flexible Storage Interface Tester with Variable Parallelism and Firmware Upgradeability
Apparatus Comprising a Recursive Delayer and Method for Measuring a Phase Noise
Test Device and Test Method for Measuring a Phase Noise of a Test Signal
Test Carrier
Board Assembly, Electronic Device Test Apparatus and Water Jacket
Actuator Apparatus, Test Apparatus, and Test Method
Test Apparatus and Test Method
Coaxial Cable Member Coupled to a Signal Terminal, a Ground Terminal and an Auxiliary Ground Conductor with an Elastically-Deformable Piece
Connector and Semiconductor Test Device
Method and Apparatus for Testing a Device-Under-Test
Method and Apparatus for Massively Parallel Multi-Wafer Test
Electromagnetic Wave Emission Device
Electromagnetic Wave Detection Device
Measuring Apparatus and Measuring Method
Pattern Inspection Apparatus and Method
Fatty Tissue Image Display Device
Method and Automatic Test Equipment for Performing a Plurality of Tests of a Device Under Test
Apparatus and Method for Source Synchronous Testing of Signal Coverters
Apparatus and Method for Testing a Plurality of Devices Under Test
Pattern Measurement Apparatus and Pattern Measurement Method
Test Module Generation Apparatus, Test Procedure Generation Apparatus, Generation Method, Program, and Test Apparatus
Test Pattern Generation Apparatus, Test Program Generation Apparatus, Generation Method, Program, and Test Apparatus
Method of Manufacturing Semiconductor Device
Pseudo Tester-Per-Site Functionality on Natively Tester-Per-Pin Automatic Test Equipment for Semiconductor Test
Handler for Conveying a Plurality of Devices Under Test to a Socket for a Test and Test Apparatus
Handler and Test Apparatus
Handler Apparatus and Test Method
Carrier and Adhesion Amount Measuring Apparatus, and Measuring Method, Program, and Recording Medium of the Same
Da Conversion Device and Electron Beam Exposure System Using the Same
Apparatus for Determining a Number of Successive Equal Bits Preceding an Edge Within a Bit Stream and Apparatus for Reconstructing a Repetitive Bit Sequence
Solution for Full Speed, Parallel Dut Testing
Electrical Double Filter Structure
Electrical Filter Structure
Contact Pressure Detection Apparatus and Contact Point Pressure Measurement Apparatus
Electronic Device Transfer Apparatus, Electronic Device Handling Apparatus, and Electronic Device Testing Apparatus
Pitch Changing Apparatus, Electronic Device Handling Apparatus, and Electronic Device Testing Apparatus
Test Apparatus and Test Method
Wavelength Conversion Apparatus, Light Source Apparatus, and Wavelength Conversion Method
Measurement Apparatus and Electronic Device
Test Apparatus and Test Method
Converter and Measuring Apparatus
Analog to Digital Converter and Digital to Analog Converter
Detecting Apparatus, Wafer and Electronic Device
Signal Generation Apparatus and Signal Generation Method
Wireless Communication Apparatus and Wireless Communication System
Tester with Acceleration on Memory and Acceleration for Automatic Pattern Generation Within a Fpga Block
Using Shared Pins in a Concurrent Test Execution Environment
Test Architecture Having Multiple Fpga Based Hardware Accelerator Blocks for Testing Multiple Duts Independently
Tester with Mixed Protocol Engine in a Fpga Block
Tester with Acceleration for Packet Building Within a Fpga Block
Test Apparatus
Light Beam Incident Device and Reflected Light Measurement Device
Transferring Electronic Probe Assemblies to Space Transformers
Bit Sequence Generator and Apparatus for Calculating a Sub-Rate Transition Matrix and a Sub-Rate Initial State for a State Machine of a Plurality of State Machines
Test Apparatus for Generating Reference Scan Chain Test Data and Test System
Terahertz Wave Generating Device Which Outputs a Terahertz Frequency Electromagnetic Wave via Cherenkov Phase Matching
System, Methods and Apparatus Using Virtual Appliances in a Semiconductor Test Environment
Laterally Driven Probes for Semiconductor Testing
Test Apparatus
Measurement Device, Method, and Recording Medium
Electromagnetic Wave Emission Device
Implementing Edit and Update Functionality Within a Development Environment Used to Compile Test Plans for Automated Semiconductor Device Testing
Testing Stacked Devices
Switch Apparatus and Test Apparatus
Electromagnetic Wave Measuring Apparatus, Measuring Method, Program, and Recording Medium
Automated Generation of a Test Class Pre-Header from an Interactive Graphical User Interface
Stiffener Plate for a Probecard and Method
Tester Having an Application Specific Electronics Module, and Systems and Methods That Incorporate or Use the Same
Power Supply Noise Reduction Circuit and Power Supply Noise Reduction Method
Low Overdrive Probes with High Overdrive Substrate
Tester Hardware
Power Supply Apparatus for Testing Apparatus
Calibration Module for a Tester and Tester
Power Supply Apparatus with Feedback Ratio Calculation Unit
Measurement Apparatus and Measurement Method
High Speed Tester Communication Interface Between Test Slice and Trays
Test Card for Testing One or More Devices Under Test and Tester
Pattern Printing Apparatus, Pattern Printing Method, and Test Apparatus
Flexible Interrupt Generation Mechanism
Sample Holder of Electron Beam Exposure Apparatus and Electron Beam Exposure Method Using the Same
Electron Beam Detector, Electron Beam Processing Apparatus, and Method of Manufacturing Electron Beam Detector
Distributed Pin Map Memory
System and Method for Electronic Testing of Partially Processed Devices
Methods, Apparatus, and Systems for Contacting Semiconductor Dies That Are Electrically Coupled to Test Access Interface Positioned in Scribe Lines of a Wafer
X-Y Constraining Unit, and Stage Apparatus and Vacuum Stage Apparatus Including the Same
Probe Apparatus and Test Apparatus
Methods, Sampling Device and Apparatus for Terahertz Imaging and Spectroscopy of Coated Beads, Particles and/or Microparticles
Test Apparatus
Electron Beam Exposure Method
Electronic Component Handling Apparatus, Electronic Component Testing Apparatus, and Electronic Component Testing Method
Correction Apparatus, Probe Apparatus, and Test Apparatus
Application:
14/059,422 →
Publication:
US 2014/0160270
Programming Multiple Serial Input Devices
Method and Apparatus for Improving Differential Direct Current (Dc) Measurement Accuracy
Seamless Fail Analysis with Memory Efficient Storage of Fail Lists
Flexible Test Site Synchronization
Electromagnetic Lens for Electron Beam Exposure Apparatus
Wireless Power Transmitter and Wireless Power Receiver
Wireless Power Transmitter
Relay Device of Wireless Power Transmission System
Electromagnetic Wave Measurement Device, Measurement Method, and Recording Medium
Online Design Validation for Electronic Devices
Integrated Rf Mems on Ate Loadboards for Smart Self Rf Matching
Adaptive Value Capture for Process Monitoring
Lumped Element Radio Frequency Tuning Calibration Process
Integrated Cooling System for Electronics Testing Apparatus
Testing Memory Devices with Parallel Processing Operations
Testing Memory Devices with Distributed Processing Operations
Distributed Power Supply Architecture in Automatic Test Equipment
Adaptive Thermal Control
Wireless Power Transmitter and Wireless Power Receiver
Wireless Power Transmitter and Wireless Power Receiver
Staged Buffer Caching in a System for Testing a Device Under Test
Current Compensation Circuit
Photoacoustic Wave Measurement Instrument, Photoacoustic Wave Measurement Device, Method, and Recording Medium
Wireless Power Receiver
Concept for Extracting a Signal Being Exchanged Between a Device Under Test and an Automatic Test Equipment
Dynamic Measurement of Density Using Terahertz Radiation with Real-Time Thickness Measurement for Process Control
Voice Recognition Virtual Test Engineering Assistant
Techniques for Determining a Fault Probability of a Location on a Chip
Test System
Impedance Measurement Apparatus
Device Interface Apparatus, Test Apparatus, and Test Method
Fast Semantic Processor for Per-Pin Apg
Member for Ink Recording, Ink Recording Body, and Laminated Body for Ink Recording
Photoacoustic Wave Measurement Device
Photoacoustic Wave Measurement Device, Method, Program, and Recording Medium
Photoacoustic Wave Measurement Device
Test Carrier
Test Carrier
Pulse Light Source, and Method for Stably Controlling Phase Difference Between Pulse Laser Lights
Light Measurement Apparatus, Method, Program and Recording Medium
Ate Digital Channel for Rf Frequency/Power Measurement
Method and Apparatus to Provide Both High Speed and Low Speed Signaling from the High Speed Transceivers on an Field Programmable Gate Array
Wireless Power Receiving Apparatus
Handler Apparatus, Device Holder, and Test Apparatus
Fixture Unit, Fixture Apparatus, Handler Apparatus, and Test Apparatus
Handler Apparatus, Adjustment Method of Handler Apparatus, and Test Apparatus
Handler Apparatus That Conveys a Device Under Test to a Test Socket and Test Apparatus Including the Handler Apparatus
Handler Apparatus That Conveys a Device Under Test to a Test Socket and Test Apparatus That Comprises the Handler Apparatus
Actuator, Handler Apparatus and Test Apparatus
Temperature Control Apparatus and Test System Using Main Flow Path and Sub Flow Path
Method and System for Spectral Leakage Removal in Dac Testing
Wireless Power Transmitting Apparatus and Wireless Power Supply System
Charged Particle Beam Exposure Apparatus and Method of Manufacturing Semiconductor Device
Universal Test Floor System
Universal Container for Device Under Test
Universal Test Cell
Device Under Test Data Processing Techniques
Electronic Device Handling Apparatus and Electronic Device Testing Apparatus
Test System
Application:
14/529,032 →
Publication:
US 2015/0066417
Variable Attenuator
Charged Particle Beam Exposure Apparatus
Test Program and Test System
Application:
14/597,217 →
Publication:
US 2015/0127986
Electronic Component Transfer Shuttle
Generation of Rf Stimulus Signal Using Dc Modulating Signal
Socket and Electronic Device Test Apparatus
Measurement Apparatus and a Method for Temperature Dependent Frequency Change Measurement in a Body Part via Ultrasonic Measurements
Wireless Power Receiving Apparatus
Wafer for Testing and a Test System
Electron Beam Exposure Method
Test Apparatus, Test Method, Calibration Device, and Calibration Method
Method and Apparatus for an Efficient Framework for Testcell Development
Device Holder, Inner Unit, Outer Unit, and Tray
Api-Based Pattern-Controlled Test on an Ate
Method and Apparatus for Defect Repair in Nand Memory Device
Method and System for Advanced Fail Data Transfer Mechanisms
Ate Thermal Overload Detection and Recovery Techniques
Millimeter Wave Pogo Pin Contactor Design
Application:
14/728,699 →
Publication:
US 2016/0356842
Semiconductor Switch
Multi-Configurable Testing Module for Automated Testing of a Device
Customizable Tester Having Testing Modules for Automated Testing of Devices
Supporting Automated Testing of Devices in a Test Floor System
Controlling Automated Testing of Devices
Test Carrier for Mounting and Testing an Electronic Device
Calibration Module for a Tester and Tester
Exposure Apparatus
RF Probe
Scan Test Multiplexing
Scan Test Multiplexing
Non-Invasive in Situ Glucose Level Sensing Using Electromagnetic Radiation
Non-Invasive in Situ Glucose Level Sensing Using Electromagnetic Radiation
Test Apparatus Determining Threshold Signal Using History of Judgment Value
Test System
Patent:
9,484,116 →
Application:
14/827,743 →
System, Methods and Apparatus Using Virtual Appliances in a Semiconductor Test Environment
Switchable Signal Routing Circuit
Authentication Terminal
Authentication System, Authentication Method and Service Providing System
Charged Particle Beam Exposure Apparatus Suitable for Drawing on Line Patterns, and Exposure Method Using the Same
Scan Speed Optimization of Input and Output Paths
Current Measurement Circuit
Measurement Apparatus
Measurement Apparatus
Wave Interface Assembly for Automatic Test Equipment for Semiconductor Testing
Multiple Waveguide Structure with Single Flange for Automatic Test Equipment for Semiconductor Testing
Plating Methods for Modular and/or Ganged Waveguides for Automatic Test Equipment for Semiconductor Testing
Integrated Waveguide Structure and Socket Structure for Millimeter Waveband Testing
Automated Test Equipment, Instruction Provider for Providing a Sequence of Instructions, Method of Providing Signal to a Device Under Test, Method for Providing a Sequence of Instructions and Test System
Automated Test Equipment for Testing a Device Under Test and Method for Testing a Device Under Test
Exposure Apparatus and Exposure Method
Test Apparatus, Test Signal Supply Apparatus, Test Method, and Computer Readable Medium
Application:
15/054,145 →
Publication:
US 2017/0102429
Frequency Modulated (Fm) Chirp Testing for Automotive Radars Using Standard Automated Test Equipment (Ate) Digital Pin Channels
Handler with Integrated Receiver and Signal Path Interface to Tester
Tester
Tester
Instruction Provider and Method for Providing a Sequence of Instructions, Test Processor and Method for Providing a Device Under Test
Multi-Port Measurement Technique
Power Supply Device, a Test Equipment Comprising a Power Supply Device and a Method for Operating a Power Supply Device
Method and Apparatus for Socket Power Calibration with Flexible Printed Circuit Board
CHARACTERIZATION OF PHASE SHIFTER CIRCUITRY IN INTEGRATED CIRCUITS (ICs) USING STANDARD AUTOMATED TEST EQUIPMENT (ATE)
Test Apparatus and Method for Testing a Device Under Test
Exposure Apparatus and Exposure Method
Measuring Probe Using Terahertz Wave
Measuring Apparatus, Measuring Method, and Recording Medium
Application:
15/231,997 →
Publication:
US 2017/0082668
Magnetic Noise Rejection Apparatus and Magnetic Field Measurement Apparatus
Exposure Apparatus
Power Supply Apparatus
Production-Level Modularized Load Board Produced Using a General Universal Device Interface for Automatic Test Equipment for Semiconductor Testing
Patent:
9,921,244 →
Application:
15/414,507 →
General Universal Device Interface for Automatic Test Equipment for Semiconductor Testing
Patent:
9,921,266 →
Application:
15/414,512 →
Wireless Power Receiver
Real-Time Capture of Traffic Upon Failure for Protocol Debug
Test System and Method
Device Testing Using Dual-Fan Cooling with Ambient Air
Detector for Detecting Position of Ic Device and Method for the Same
Scheduler
Pulse Wave Sensor Unit
Semiconductor Device
Automated Handling of Different Form Factor Devices Under Test in Test Cell
Test Program Flow Control
User Control of Automated Test Features with Software Application Programming Interface (Api)
Test System Supporting Multiple Users Using Different Applications
Test System and Method
Manufacturing Method for Compound Semiconductor Device
Epitaxial Substrate
Application:
15/591,716 →
Publication:
US 2017/0365667
Removal of Sampling Clock Jitter Induced in an Output Signal of an Analog-to-Digital Converter
Dut Testing with Configurable Cooling Control Using Dut Internal Temperature Data
Electronic Component Handling Apparatus, Electronic Component Testing Apparatus, and Electronic Component Testing Method
Test Equipment, Method for Operating a Test Equipment and Computer Program
Magnetic Field Measurement Apparatus and Method for Noise Environment
Compound Semiconductor Device
Method for Operating a Test Apparatus and a Test Apparatus
Device Testing with Heat Pipe Cooling Assembly
Electronic Component Handling Apparatus and Electronic Component Testing Apparatus
Exposure Apparatus and Computer Readable Non-Transitory Storage Medium
Application:
15/786,603 →
Publication:
US 2018/0067402
Switch Circuit, Method for Operating a Switch Circuit and an Automated Test Equipment
Control Device Using Gan Semiconductor
Automated Test Equipment for Combined Signals
High Frequency Integrated Circuit and Emitting Device for Irradiating the Integrated Circuit
Method and System for Acquisition of Test Data
Addressing Scheme for Distributed Hardware Structures
Scalable Platform for System Level Testing
Test Architecture with an Fpga Based Test Board to Simulate a Dut or End-Point
Log Post-Processor for Identifying Root Causes of Device Failure During Automated Testing
Application:
15/916,126 →
Publication:
US 2019/0278645
Heat Exchanger and Electronic Device Handling Apparatus Including the Same
Traffic Capture and Debugging Tools for Identifying Root Causes of Device Failure During Automated Testing
Smart and Efficient Protocol Logic Analyzer Configured Within Automated Test Equipment (Ate) Hardware
Test Architecture with a Small Form Factor Test Board for Rapid Prototyping
Semiconductor Device and Manufacturing Method Thereof
Application:
16/031,493 →
Publication:
US 2018/0323295
Magnetic Sensor Testing Device
Deterministic Concurrent Test Program Executor for an Automated Test Equipment
Power Supply for Providing an Electrical Pulse to an Electrical Consumer and a Tester Comprising the Power Supply
Method and Device for Calibrating an Automated Test Equipment
Three-Dimensional Laminating and Shaping Apparatus and Laminating and Shaping Method
Three-Dimensional Laminating and Shaping Apparatus and Laminating and Shaping Method
Low Cost Built-in-Self-Test Centric Testing
Device Under Test Temperature Synchronized with Test Pattern
Application:
16/138,029 →
Publication:
US 2019/0086468
Test Apparatus and Test Method
Electrical Connector
Patent:
581,876 →
Application:
29/304,411 →
Electrical Connector
Patent:
584,693 →
Application:
29/304,415 →
Electrical Connector
Patent:
583,769 →
Application:
29/304,417 →
Electrical Connector Housing
Patent:
597,951 →
Application:
29/304,421 →
Socket for an Electronic Device Testing Apparatus
Patent:
788,722 →
Application:
29/509,962 →
Socket for Electronic Device Testing Apparatus
Patent:
796,978 →
Application:
29/560,253 →
Socket for Electronic Device Testing Apparatus
Patent:
819,581 →
Application:
29/601,371 →
Adapting Serdes Receivers to Ufs Rx Protocol
Application:
62/711,185 →
Ufs Terminated & Unterminated Pwm Support Using Dual Channels Including HIB8 Detection
Application:
62/711,383 →
Integrated Protocol Analyzer
Application:
62/711,400 →
Related Assignments
(2)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Apr 6, 2015
From: ADVANTEST (SINGAPORE) PTE. LTD.
To: ADVANTEST CORPORATION
Reel/Frame 035371/0265 →
Corrective Assignment to Correct the Assignee Address Previously Recorded at Reel: 035371 Frame: 0265. Assignor(S) Hereby Confirms the Assignment.
Apr 14, 2015
From: ADVANTEST (SINGAPORE) PTE. LTD.
To: ADVANTEST CORPORATION
Reel/Frame 035425/0768 →