Testing apparatus and testing method
Provided is a test apparatus that tests a device under test that outputs a plurality of modulated signals modulated with carrier signals having frequencies identical to each other, including a synthesizing section that synthesizes the plurality of modulated signals to output a synthesized signal; an AD converting section that samples the synthesized signal to output a digital signal corresponding to the synthesized signal; and a judging section that judges acceptability of the plurality of modulated signals output by the device under test, based on the digital signal.
1. A test apparatus that tests a device under test that outputs a plurality of modulated signals modulated with carrier signals having frequencies identical to each other, comprising:
a synthesizing section that synthesizes the plurality of modulated signals to output a synthesized signal;
an AD converting section that samples the synthesized signal to output a digital signal corresponding to the synthesized signal; and
a judging section that judges acceptability of the plurality of modulated signals output by the device under test, based on the digital signal.
2. The test apparatus according to claim 1 , wherein
the AD converting section includes:
a demodulator that quadrature demodulates the synthesized signal output by the synthesizing section to output a demodulated signal;
a first AD converter that samples an in-phase component of the demodulated signal to output a first digital signal corresponding to the in-phase component; and
a second AD converter that samples a quadrature component of the demodulated signal to output a second digital signal corresponding to the quadrature component, and
the judging section judges the acceptability of the plurality of modulated signals output by the device under test based on the first digital signal and the second digital signal.
3. The test apparatus according to claim 1 , wherein
the AD converting section includes:
a frequency converting section that multiplies the synthesized signal output from the synthesizing section by a local signal having a prescribed frequency to output an intermediate signal having a frequency lower than that of the synthesized signal;
an AD converter that samples the intermediate signal to output a digital signal corresponding to the intermediate signal; and
a demodulator that quadrature demodulates the digital signal to output a demodulated signal, and
the judging section judges the acceptability of the plurality of modulated signals output by the device under test based on a first digital signal indicating the in-phase component of the demodulated signal and a second digital signal indicating the quadrature component of the demodulated signal.
4. The test apparatus according to claim 3 , wherein,
the AD converting section further includes a decimation filter that decreases a sampling frequency of the first digital signal and the second digital signal by thinning the data values in the first digital signal and the second digital signal output by the demodulator.
5. The test apparatus according to claim 3 , wherein
the device under test quadrature modulates each of a plurality of baseband signals to generate the plurality of modulated signals, and
the judging section judges the acceptability of the plurality of modulated signals based on whether a phase and an amplitude of each demodulated signal is within a range of expected values of the phase and amplitude designated according to a combination of the plurality of baseband signals.
6. The test apparatus according to claim 1 , wherein
the device under test can switch between operating in a first mode and a second mode,
the first mode involves generating the plurality of modulated signals by quadrature modulating each of the plurality of baseband signals with substantially the same gain,
the second mode involves generating the plurality of modulated signals by quadrature modulating each of the plurality of baseband signals with a different gain,
the test apparatus further includes a test control section that performs a first test causing the judging section to judge the acceptability of the plurality of modulated signals while the device under test operates in the first mode, and performs a second test causing the judging section to judge the acceptability of the plurality of modulated signals while the device under test operates in the first mode, the second test being performed on a condition that the plurality of modulated signals are judged to be acceptable during the first test, and
the test control section judges the device under test to be non-defective if the plurality of modulated signals are judged to be acceptable in both the first test and the second test.
7. The test apparatus according to claim 1 , further comprising:
a plurality of switches that are provided to correspond one-to-one with the plurality of modulated signals, and that each switch whether the corresponding modulated signal is supplied to the synthesizing section; and
a test control section that performs a first test in which the judging section judges the acceptability of the plurality of modulated signals while the plurality of switches are turned on, and performs a second test in which the judging section judges the acceptability of at least one of the plurality of modulated signals while at least one switch corresponding to the at least one modulated signal is turned on and the other switches are turned off, the second test being performed on a condition that the plurality of modulated signals are judged to be acceptable during the first test.
8. The test apparatus according to claim 2 , wherein
the device under test quadrature modulates each of a plurality of baseband signals to generate the plurality of modulated signals, and
the judging section judges the acceptability of the plurality of modulated signals based on whether a phase and an amplitude of each demodulated signal is within a range of expected values of the phase and amplitude designated according to a combination of the plurality of baseband signals.
9. The test apparatus according to claim 8 , wherein
the device under test can switch between operating in a first mode and a second mode,
the first mode involves generating the plurality of modulated signals by quadrature modulating each of the plurality of baseband signals with substantially the same gain,
the second mode involves generating the plurality of modulated signals by quadrature modulating each of the plurality of baseband signals with a different gain,
the test apparatus further includes a test control section that performs a first test causing the judging section to judge the acceptability of the plurality of modulated signals while the device under test operates in the first mode, and performs a second test causing the judging section to judge the acceptability of the plurality of modulated signals while the device under test operates in the first mode, the second test being performed on a condition that the plurality of modulated signals are judged to be acceptable during the first test, and
the test control section judges the device under test to be non-defective if the plurality of modulated signals are judged to be acceptable in both the first test and the second test.
10. The test apparatus according to claim 8 , further comprising:
a plurality of switches that are provided to correspond one-to-one with the plurality of modulated signals, and that each switch whether the corresponding modulated signal is supplied to the synthesizing section; and
a test control section that performs a first test in which the judging section judges the acceptability of the plurality of modulated signals while the plurality of switches are turned on, and performs a second test in which the judging section judges the acceptability of at least one of the plurality of modulated signals while at least one switch corresponding to the at least one modulated signal is turned on and the other switches are turned off, the second test being performed on a condition that the plurality of modulated signals are judged to be acceptable during the first test.
11. A test method for testing a device under test that outputs a plurality of modulated signals modulated with carrier signals having frequencies identical to each other, comprising the steps of:
synthesizing the plurality of modulated signals to output a synthesized signal;
sampling the synthesized signal to output a digital signal corresponding to the synthesized signal; and
judging acceptability of the plurality of modulated signals output by the device under test, based on the digital signal.
12. A test apparatus that tests a device under test that outputs a plurality of baseband signals, comprising:
a synthesizing section that synthesizes the plurality of baseband signals to output a synthesized signal;
an AD converting section that samples the synthesized signal to output a digital signal corresponding to the synthesized signal; and
a judging section that judges acceptability of the plurality of baseband signals output by the device under test, based on the digital signal.
13. A test method for testing a device under test that outputs a plurality of baseband signals, comprising the steps of:
synthesizing the plurality of baseband signals to output a synthesized signal;
performing an AD conversion by sampling the synthesized signal to output a digital signal corresponding to the synthesized signal; and
judging acceptability of the plurality of baseband signals output by the device under test, based on the digital signal.