Test apparatus and test method
View Patent ↗Provided is a test apparatus including: an address generator that generates an address of a memory under test; a selector that selects whether to perform bit inversion on the address generated by the address generator before supplying the address to the memory under test; an inversion processing section that outputs the address generated by the address generator after performing bit inversion on the address if the selector has selected in the affirmative, and outputs the address generated by the address generator without performing any bit inversion on the address if the selector has selected in the negative; and a supply section that supplies, to the memory under test, the address having undergone inversion control outputted from the inversion processing section and an inversion cycle signal that indicates whether the address outputted from the inversion processing section is bit inverted or not.
1. A test apparatus comprising:
an address generator that generates an address of a memory under test;
a selector that selects whether to perform bit inversion on the address generated by the address generator before supplying the address to the memory under test;
an inversion processing section that outputs the address generated by the address generator after performing bit inversion on the address if the selector has selected in the affirmative, and outputs the address generated by the address generator without performing any bit inversion on the address if the selector has selected in the negative; and
a supply section that supplies, to the memory under test, the address having undergone inversion control outputted from the inversion processing section and an inversion cycle signal that indicates whether the address outputted from the inversion processing section is bit inverted or not.
2. The test apparatus according to claim 1 , wherein
the selector selects to perform bit inversion on the address generated by the address generator, when the address has been changed at least by a predetermined number of bits from a comparison address.
3. The test apparatus according to claim 2 , wherein
the selector selects to perform bit inversion on the address, when the address has been changed from the comparison address by bits corresponding to ½ of a bit width of the address or more.
4. The test apparatus according to claim 2 , wherein
the selector selects to perform bit conversion on the address, when the address has been changed at least by a predetermined number of bits from the comparison address which has been fixed in advance.
5. The test apparatus according to claim 4 , wherein
the address generator generates a predetermined address in a cycle in which the memory under test does not receive any address, and
the selector receives, as the comparison address, the address generated in a cycle in which the memory under test does not receive any address, and selects to perform bit inversion on the address when the address has been changed from the comparison address at least by a predetermined number of bits.
6. The test apparatus according to claim 5 , wherein
the address generator designates a recording region of the memory under test to be accessed by outputting two consecutive addresses.
7. The test apparatus according to claim 2 , wherein
the selector receives, as the comparison address, the address supplied to the memory under test in a cycle immediately therebefore, and selects to perform bit inversion on the address when the address has been changed from the comparison address by a predetermined number of bits or more.
8. The test apparatus according to claim 2 , further comprising:
a number-of-bits setting section that sets a number of bits equal to or lower than a bit width of the address to the selector, wherein
the selector selects to perform bit inversion on the address generated by the address generator, when the address has been changed from the comparison address at least by a number of bits having been set by the number-of-bits setting section.
9. The test apparatus according to claim 1 , wherein
the inversion processing section is operable to stop a function to perform bit inversion on the bit according to a particular setting, and to output the address not having undergone bit inversion.
10. A test method for testing a memory under test, comprising:
generating an address of a memory under test;
selecting whether to perform bit inversion on the generated address before supplying the address to the memory under test;
outputting the generated address after performing bit inversion on the address if it has been judged in the affirmative in the selecting step, and outputting the generated address without performing any bit inversion on the address if it has been judged in the negative in the selecting step; and
supplying, to the memory under test, the outputted address having undergone inversion control and an inversion cycle signal that indicates whether the outputted address is bit inverted or not.