Self contained, liquid to air cooled, memory test engineering workstation

1. An engineering work station that aids a user in the creation of an electronic device test program, said engineering work station comprising:

a cabinet;

electronic circuitry, inside said cabinet, that is electrically connected to and conducts electronic tests on an electronic device external to said cabinet;

a water-to-air heat exchanger, inside said cabinet, said water-to-air heat exchanger including at least one fan for moving air past said water-to-air heat exchanger;

a reservoir, inside said cabinet, for holding a cooling fluid;

a cooling block, inside said cabinet, in heat conductive communication with predetermined elements of said electronic circuitry; and

a pump, inside said cabinet, for pumping said cooling fluid from said reservoir and through said cooling block and said water-to-air heat exchanger; said engineering work station operating at a noise level that is below 55 decibels.

2. The engineering work station of claim 1 , that meets OSHA office noise and power requirements.

3. The engineering work station of claim 1 , wherein said engineering work station weighs less than 125 pounds when filled with said cooling fluid.

4. The engineering work station of claim 1 wherein said cabinet has dimensions of less than 17″w×30″d×22″h.

5. The engineering work station of claim 1 , further comprising temperature control circuitry, inside said cabinet, that controls said pump and said at least one fan to operate to keep said cooling block within +/−3 degrees Celsius of a predetermined temperature.

6. The engineering work station of claim 1 , wherein said combination of said pump, said cooling block, said water-to-air heat exchanger can operate with said cooling fluid to dissipate about 1200 watts of heat on a continuous basis when operating in an office environment.

7. The engineering workstation of claim 1 , further comprising power supply circuitry, inside said cabinet, adapted to receive standard office alternating current voltages and convert said standard office alternating current voltages to a power corrected direct current voltage for use by other circuitry in said cabinet.

8. The engineering workstation of claim 7 , wherein said other circuitry includes power converter circuitry that provides a plurality of necessary voltages to said electronic circuitry.

9. The engineering workstation of claim 1 , wherein said electronic circuitry includes a site module that is functionally compatible and functionally identical to a manufacturing facility site module found in a large scale electronic device testing equipment.

10. A self-contained, liquid-to-air cooled, memory test engineering station comprising:

memory test circuitry for testing an electronic memory device;

a closed liquid-to-air cooling system comprising:

a reservoir containing a cooling fluid;

a pump that pumps said cooling fluid from said reservoir;

a water block, in thermal communication with said memory test circuitry, that receives said cooling fluid from said pump;

a liquid-to-air heat exchanger system that dissipates heat from said cooling fluid; and

a fan for moving air past said liquid-to-air heat exchanger; and

a chassis cabinet containing said memory test circuitry and said closed liquid-to-air cooling system, said closed liquid-to-air cooling system operating at a sound level below 55 decibels.

11. The self contained, liquid-to-air cooled, memory test engineering station of claim 10 , wherein said pump is a gear pump.

12. The self contained, liquid-to-air cooled, memory test engineering station of claim 10 , wherein said memory test circuitry comprises:

algorithmic pattern generator circuitry;

a programmable power for providing a plurality of voltages to said electronic memory device; and

PIN electronic circuitry for providing and receiving signals to said electronic memory device in a correct physical format.

13. The self contained, liquid-to-air cooled, memory test engineering station of claim 10 , further comprising a universal power converter, inside said chassis cabinet, that is adapted to receive standard office voltages.

14. The self contained, liquid-to-air cooled, memory test engineering station of claim 13 , wherein said standard office voltages are between 90 and 220 volts AC.

15. The self contained, liquid-to-air cooled, memory test engineering station of claim 10 , wherein said memory test station weighs less than about 125 pounds, has dimensions of less than about 17″w×30″d×22″h, and dissipates up to about 1200 watts of heat in order to keep said water block within 3 degrees Celsius of a preset temperature when operating in an office environment.

16. An electronic device test engineering workstation, comprising:

a site module comprising memory test circuitry for testing an electronic device;

a plurality of power converters that provide a plurality of voltages to said site module to power said memory test circuitry;

a liquid-to-air cooling system, said liquid-to-air cooling system being a closed loop liquid system comprising a water based cooling fluid;

a water block in thermal communication with said site module and in thermal communication with said liquid-to-air cooling system, said liquid-to-air cooling system keeping said water block within +/−3 degrees of a predetermined temperature when operating; and

a single cabinet containing said site module, said plurality of power converters, said liquid-to-air cooling system, and said water block, said engineering workstation producing less than 55 decibels of noise and dissipating up to about 1200 watts of heat energy when operating.

17. The electronic device test engineering workstation of claim 16 , wherein said liquid-to-air cooling system comprises:

a reservoir that holds said water based cooling fluid;

a gear pump for pumping said cooling fluid from said reservoir and through said closed loop liquid system;

a liquid-to-air heat exchanger that exchanges heat from said water based cooling fluid to air moving past said liquid-to-air heat exchanger; and

at least one fan for pushing said air past said liquid-to-air heat exchanger.

18. The electronic device test engineering workstation of claim 16 , wherein said engineering work station weighs less than about 125 pounds.

19. The electronic device test engineering workstation of claim 16 , wherein said test circuitry for testing an electronic device comprises:

algorithmic pattern generator circuitry;

a programmable power for providing a plurality of voltages to said electronic memory device; and

PIN electronic circuitry for providing and receiving signals to said electronic memory device in a correct physical format.

20. The electronic device test engineering workstation of claim 16 , further comprising power supply circuitry, inside said single cabinet, adapted to receive standard office alternating current voltages and convert said standard office alternating current voltages to a power corrected direct current voltage for use by said plurality of power converts.