Semiconductor test apparatus and performance board
View Patent ↗A gain of a buffer provided on a performance board of a semiconductor test apparatus can be adjusted for testing image sensors with high accuracy. The performance board includes buffers for driving cables, and switches for inputting either a measurement signal from a device under measurement or a reference signal output from a reference signal generator. During calibration, the switches are turned to terminals to which the reference signal is input, such that the reference signal is applied to the buffers. Then, the gains of the buffers are corrected so that the output of an analog capture board has a desired value.
1. A semiconductor test apparatus for testing a semiconductor device, comprising:
a capture board having an input terminal to which a measurement signal output from a device under measurement is input, and an amplifier circuit which amplifies the measurement signal input to the input terminal;
a cable which sends the measurement signal from the device under measurement to the capture board;
a buffer connected between the cable and the device under measurement to drive the cable;
a performance board on which the buffer is mounted;
a reference signal generator which applies a reference signal for calibration of the buffer across the device under measurement and the buffer; and
a switch which switches between the measurement signal from the device under measurement and the reference signal from the reference signal generator so that one of them is input to the buffer.
2. The semiconductor test apparatus according to claim 1 , wherein the reference signal generator is a gain correcting reference signal generator which outputs a reference signal indicating a predetermined voltage value and then applies the reference signal to the buffer.
3. The semiconductor test apparatus according to claim 1 , wherein the reference signal generator is a voltage offset correcting reference signal generator which outputs a reference signal indicating a voltage value of 0 V and then applies the reference signal to the buffer.
4. The semiconductor test apparatus according to claim 1 , wherein the reference signal generator is a timing offset correcting reference signal generator which outputs a signal having a phase of 0 and applies the reference signal to the buffer.
5. The semiconductor test apparatus according to claim 1 , wherein the device under measurement is a charge coupled device or a complementary metal-oxide semiconductor constituting an image sensor.