LOG POST-PROCESSOR FOR IDENTIFYING ROOT CAUSES OF DEVICE FAILURE DURING AUTOMATED TESTING

1 . A method for diagnosing a root cause of failure using automated test equipment (ATE), the method comprising:

highlighting a failing device under test (DUT);

opening a test program log associated with the failing DUT in response to executing a script associated with a log post-processor;

determining a time of failure by parsing through the test program log to locate an identifier and timestamp associated with the failure; and

displaying the test program log in a window within a graphical user interface, wherein a relevant section of the test program log associated with the failure is displayed in the window.

2 . The method of claim 1 , further comprising:

opening a snap log, wherein the snap log comprises further information pertaining to the failure of the DUT, and wherein the snap log also contains information regarding a logical to physical mapping for the DUT;

obtaining a logical to physical mapping for the DUT from the snap log; and

using the time of failure from the test program log, analyze the snap log to determine a root cause of failure for the failing DUT.

3 . The method of claim 2 , further comprising:

displaying the snap log in a window within a graphical user interface, wherein a relevant section of the snap log associated with the time of failure is displayed in the window.

4 . The method of claim 2 , wherein the DUT executes the PCIe protocol.

5 . The method of claim 3 , further comprising:

determining a transaction layer packet (TLP) capture time from the snap log;

opening a TLP log associated with the failing DUT and the time of failure; and

using the TLP capture time, analyzing the TLP log to determine a root cause of failure for the failing DUT.

6 . The method of claim 3 , further comprising:

determining a transaction layer packet (TLP) capture time from the test program log;

opening a TLP log associated with the failing DUT and the time of failure; and

using the TLP capture time, analyzing the TLP log to further determine a root cause of failure for the failing DUT.

7 . The method of claim 5 , further comprising:

adding information pertaining to the root cause of failure to a knowledge database.

8 . A computer-readable storage medium having stored thereon, computer executable instructions that, if executed by a computer system cause the computer system to perform a method for diagnosing a root cause of failure using automated test equipment (ATE), the method comprising:

highlighting a failing device under test (DUT);

opening a test program log associated with the failing DUT in response to executing a script associated with a log post-processor;

determining a time of failure by parsing through the test program log to locate an identifier and timestamp associated with the failure; and

displaying the test program log in a window within a graphical user interface, wherein a relevant section of the test program log associated with the failure is displayed in the window.

9 . The computer-readable storage medium of claim 8 , wherein the method further comprises:

opening a snap log, wherein the snap log comprises further information pertaining to the failure of the DUT, and wherein the snap log also contains information regarding a logical to physical mapping for the DUT;

obtaining a logical to physical mapping for the DUT from the snap log; and

using the time of failure from the test program log, analyze the snap log to determine a root cause of failure for the failing DUT.

10 . The computer-readable storage medium of claim 9 , wherein the method further comprises:

displaying the snap log in a window within a graphical user interface, wherein a relevant section of the snap log associated with the time of failure is displayed in the window.

11 . The computer-readable storage medium of claim 9 , wherein the DUT executes the PCIe protocol.

12 . The computer-readable storage medium of claim 11 , wherein the method further comprises:

determining a transaction layer packet (TLP) capture time from the snap log;

opening a TLP log associated with the failing DUT and the time of failure; and

using the TLP capture time, analyzing the TLP log to further determine a root cause of failure for the failing DUT.

13 . The computer-readable storage medium of claim 11 , wherein the method further comprises:

determining a transaction layer packet (TLP) capture time from the test program log;

opening a TLP log associated with the failing DUT and the time of failure; and

using the TLP capture time, analyzing the TLP log to determine a root cause of failure for the failing DUT.

14 . The computer-readable storage medium of claim 12 , wherein the method further comprises:

adding information pertaining to the root cause of failure to a knowledge database.

15 . A system for performing a method for diagnosing a root cause of failure using automated test equipment (ATE), the system comprising:

a memory comprising a test program and a log post-processor script stored on a tester operating system;

a communicative interface operable to connect to one or more devices under test (DUTs);

a processor coupled to the memory and the communicative interface, the processor being configured to operate in accordance with the log post-processor script to:

execute the test program;

identify a failing device under test (DUT), wherein the failing DUT produces an error condition in response to executing the test program;

open a test program log associated with the failing DUT in response to executing the log post-processor script;

determine a time of failure by parsing through the test program log to find an identifier and timestamp associated with the failure; and

display the test program log in a window within a graphical user interface, wherein a relevant section of the test program log associated with the failure is displayed in the window.

16 . The system of claim 15 , wherein the processor is further configured to:

open a snap log, wherein the snap log comprises further information pertaining to the failure;

obtain a logical to physical mapping for the DUT from the snap log; and

use the time of failure from the test program log to analyze the snap log to determine a root cause of failure for the failing DUT.

17 . The system of claim 16 , wherein the processor is further configured to:

display the snap log in a window within a graphical user interface, wherein a relevant section of the snap log associated with the time of failure is displayed in the window.

18 . The system of claim 16 , wherein the DUT executes the PCIe protocol.

19 . The system of claim 16 , wherein the processor is further configured to:

determine a transaction layer packet (TLP) capture time from the snap log;

open a TLP log associated with the failing DUT and the time of failure; and

use the TLP capture time to analyze the TLP log to determine a root cause of failure for the failing DUT.

20 . The system of claim 19 , wherein the processor is further configured to:

add information pertaining to the root cause of failure to a knowledge database.