Electron beam exposure apparatus and electron beam exposure method

1. An electron beam exposure apparatus comprising:

a plurality of column cells arranged above a sample and configured to irradiate electron beams in parallel onto a surface of the sample;

an integrated controller configured to generate exposure data including an exposure position, an exposure pattern and an exposure time of each shot of the plurality of column cells;

a column cell control unit provided in each of the column cells and configured to control the column cell based on the exposure data;

a correction parameter storage unit provided in the integrated controller and configured to store a correction parameter for allowing a relationship between exposure intensity and a line width for a correction target column cell to coincide with a relationship between exposure intensity and a line width for a reference column cell selected from among the plurality of column cells;

a reference exposure time storage unit provided in the integrated controller and configured to store reference exposure time required to form a predetermined reference pattern having a line width as designed in the reference column cell; and

an exposure time calculating unit provided in the integrated controller and configured to obtain exposure time of the correction target column cell by correcting the reference exposure time based on the correction parameter.

2. The electron beam exposure apparatus according to claim 1 , wherein

the correction parameter includes a first correction parameter for correcting a slope of the relationship between the exposure intensity and the line width for the correction target column cell, and a second correction parameter for correcting the intercept of the relationship between the exposure intensity and the line width for the correction target column cell.

3. The electron beam exposure apparatus according to claim 2 , wherein

the exposure time calculating unit obtains the exposure time of the correction target column cell by adding the second correction parameter to a value obtained by multiplying the reference exposure time by the first correction parameter.

4. The electron beam exposure apparatus according to any one of claims 1 to 3 , wherein

the reference pattern is a pattern in which a distance between edges opposite to each other is larger than a range of blurs caused by scattering the corresponding electron beam.

5. The electron beam exposure apparatus according to claim 4 , wherein

the exposure time calculating unit obtains exposure time required to expose an exposure target pattern in the reference column cell by multiplying a proximity effect correction coefficient by the reference exposure time, the proximity effect correction coefficient representing the ratio between exposure intensity required to obtain a line width as designed in the exposure target pattern and exposure intensity required to obtain a line width as designed in the reference pattern.

6. The electron beam exposure apparatus according to claim 5 , wherein

the first and second correction parameters are expressed by functions of the proximity effect correction coefficient, and values of the first and second correction parameters are determined based on the proximity effect correction coefficient of the exposure target pattern.

7. The electron beam exposure apparatus according to claim 1 , wherein

the correction parameter storage unit stores an auxiliary exposure intensity correction parameter for allowing a relationship between auxiliary exposure intensity and the line width for the correction target column cell to coincide with a relationship between auxiliary exposure intensity and the line width for the reference column cell, and

the exposure time calculating unit obtains auxiliary exposure time of the correction target column cell by correcting auxiliary exposure time of the reference column cell based on the auxiliary exposure intensity correction parameter.

8. An electron beam exposure method for exposing a plurality of patterns in parallel on a wafer by use of a plurality of column cells configured to irradiate electron beams, the method comprising the steps of:

obtaining a relationship between exposure intensity and a line width for each of the column cells by exposing a predetermined pattern in the column cell while changing exposure time, and measuring the line width of the pattern;

obtaining a correction parameter for allowing a relationship between exposure intensity and a line width for a correction target column cell to coincide with a relationship between a line width and exposure intensity for a reference column cell selected from among the plurality of column cells;

obtaining reference exposure time required to form a predetermined reference pattern having a line width as designed in the reference column cell;

calculating exposure time of the correction target column cell based on the correction parameter and the reference exposure time; and

performing exposure in the correction target column cell based on the exposure time of the correction target column cell.

9. The electron beam exposure method according to claim 8 , wherein

the correction parameter includes a first correction parameter for correcting a slope of the relationship between the exposure intensity and the line width for the correction target column cell, and a second correction parameter for correcting the intercept of the relationship between the exposure intensity and the line width for the correction target column cell.

10. The electron beam exposure method according to claim 9 , wherein

the exposure time of the correction target column cell is obtained by adding the second correction parameter to a value obtained by multiplying the reference exposure time by the first correction parameter.

11. The electron beam exposure method according to any one of claims 8 to 10 , wherein

the reference pattern is a pattern in which a distance between edges opposite to each other is larger than a range of blurs caused by scattering of the corresponding electron beam.

12. The electron beam exposure method according to claim 11 , wherein

exposure time required to expose an exposure target pattern in the reference column cell is obtained by multiplying a proximity effect correction coefficient by the reference exposure time, the proximity effect correction coefficient representing the ratio between exposure intensity required to obtain a line width as designed in the exposure target pattern and exposure intensity required to obtain a line width as designed in the reference pattern.

13. The electron beam exposure method according to claim 12 , further comprising the steps of:

obtaining the first and second correction parameters for each of an isolated pattern and a dense pattern, and obtaining dependency of the first and second correction parameters on the proximity effect correction coefficient by linear interpolation; and

determining values of the first and second correction parameters based on a proximity effect correction coefficient of the exposure target pattern.

14. An electron beam exposure method for exposing a plurality of patterns in parallel on a wafer by use of a plurality of column cells configured to irradiate electron beams, and then performing auxiliary exposure to correct the influence of a proximity effect during the exposure, the method comprising the steps of:

obtaining a relationship between auxiliary exposure intensity and a line width for each of the column cells by performing auxiliary exposure on a pattern exposed in the column cell while changing auxiliary exposure time, and measuring a line width of the pattern;

obtaining a correction parameter for allowing a relationship between auxiliary exposure intensity and a line width for a correction target column cell to coincide with a relationship between auxiliary exposure intensity and a line width for a reference column cell selected from among the plurality of column cells;

calculating auxiliary exposure time of the correction target column cell by correcting auxiliary exposure time of the reference column cell based on the correction parameter; and

performing auxiliary exposure in the correction target column cell based on the auxiliary exposure time of the correction target column cell.