Parallel test circuit with active devices
View Patent ↗In accordance with one embodiment of the invention, a system is provided that comprises a first terminal for receiving an input testing signal during operation; a plurality of input/output terminals coupled with the first terminal; wherein the input/output terminals are configured to parallel output respective output testing signals during parallel output operation; wherein the input/output terminals are configured to parallel input testing response signals during parallel input operation from devices under test; and wherein each of the input/output terminals is electrically isolated during operation from the remaining plurality of input/output terminals.
1. An integrated circuit comprising:
a first input terminal for receiving an input testing signal during operation;
a plurality of input/output terminals coupled with said first input terminal; wherein said input/output terminals are configured to fan-out the input testing signal in parallel as respective output testing signals, during parallel output operation;
wherein said input/output terminals are configured to parallel input testing response signals during parallel input operation from devices under test; and
wherein each of said input/output terminals is electrically isolated during operation from the remaining plurality of input/output terminals.
2. The integrated circuit as claimed in claim 1 , wherein said input/output terminals are electrically isolated by active components during operation from the remaining plurality of input/output terminals.
3. The integrated circuit as claimed in claim 2 and further comprising a plurality of active drivers, each of said active drivers coupling one of said plurality of input/output terminals to said first input terminal.
4. The integrated circuit as claimed in claim 1 and further comprising: a storage device coupled with said plurality of input/output terminals for storing said testing response signals as stored testing response signals.
5. The integrated circuit as claimed in claim 4 and further comprising: a serial output circuit coupled with said storage device and coupled with said first input terminal for serially outputting said stored testing response signals via said first input terminal.
6. The integrated circuit as claimed in claim 1 and further comprising:
a plurality of parametric measuring circuits, each of said parametric measuring circuits for use with one of said input/output terminals, wherein said plurality of parametric measuring circuits are configured to allow independent parametric measurement at one of said plurality of input/output terminals during operation while isolated from the remaining plurality of input/output terminals.
7. The integrated circuit as claimed in claim 1 wherein said plurality of input/output terminals are configurable for non-parallel operation.
8. The integrated circuit as claimed in claim 1 and further comprising: an error signal storage device for storing individual error signals for said devices under test.
9. The integrated circuit as claimed in claim herein said parallel input occurs without an increase in test time overhead.
10. The integrated circuit as claimed in claim 1 wherein said parallel input provides a timing accuracy of lens than about 300 picoseconds.
11. The integrated circuit as claimed in claim 1 and further comprising a second input terminal.
12. The integrated circuit as claimed in claim 11 and further comprising a second plurality of input/output terminals coupled with said second input terminal.
13. The integrated circuit as claimed in claim 1 and further comprising: a bypass circuit configured to couple said first input terminal with only one of said input/output terminals while isolating said remaining input/output terminals from said first input terminal.
14. The integrated circuit as claimed in claim 1 wherein said devices under test are low power devices without the ability to drive a signal over a wire having a length of more than 10 inches.
15. The integrated circuit as claimed in claim 1 wherein each of said input/output terminals is coupled to a respective input driver configured to drive signals received from a device under test.