IP Library › Granted Patent US 6,556,934
Granted Patent Utility
US 6,556,934 · Confirmation No. 8237

TIMING CALIBRATION METHOD AND SEMICONDUCTOR DEVICE TESTING APPARATUS HAVING TIMING CALIBRATION FUNCTION

Inventor: Koichi Higashide
Patented Case View Patent ↗ View Publication ↗
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 Code Description Pages PDF
2009-06-25 EBCC.AD Notice of Change of Address Place in File Wrapper Due to Electronic Business Center(EBC) Customer Number Update 1 View
2001-07-26 TRNA Transmittal of New Application 3 View
2001-07-26 ADS Application Data Sheet 1 View
2001-07-26 SPEC Specification 17 View
2001-07-26 CLM Claims 10 View
2001-07-26 ABST Abstract 1 View
2001-07-26 DRW Drawings-only black and white line drawings 10 View
2001-07-26 OATH Oath or Declaration filed 4 View
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Quick Facts
Patent No.
US 6,556,934
App. No.
09/916,713
Filed
2001-07-26
Granted
2003-04-29
Pub. No.
US20020013672A1
Examiner
LAU, TUNG S
Art Unit
2863
PTA
-7 days