Patent Assignment
Reel/Frame 012031/0423
Assignment of Assignor's Interest
Recorded: 2001-07-26
Received: 2001-08-07
Pages: 3
Assignor
HIGASHIDE, KOICHI
Executed: 2001-07-12
Assignee
ADVANTEST CORPORATION
32-1, ASAHICHO 1-CHOME, NERIMA-KU, TOKYO, JPX, JAPAN
Covered Properties
(2)
Timing Calibration Method and Semiconductor Device Testing Apparatus Having Timing Calibration Function
Application:
09/916,713 →
System and Method for Aggregating Information Over a Wide Area Network
Application:
09/837,071 →