Patent Application
Utility
App. No. 10/370,843
· Confirmation No. 9800
Semiconductor device testing apparatus having timing calibration function
Inventor:
Koichi Higashide
Abandoned -- Failure to Respond to an Office Action
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2004-04-05 | ABN |
Abandonment | 2 | View | |
| 2003-02-21 | TRNA |
Transmittal of New Application | 3 | View | |
| 2003-02-21 | ADS |
Application Data Sheet | 2 | View | |
| 2003-02-21 | A.PE |
Preliminary Amendment | 14 | View | |
| 2003-02-21 | SPEC |
Specification | 17 | View | |
| 2003-02-21 | CLM |
Claims | 10 | View | |
| 2003-02-21 | ABST |
Abstract | 1 | View | |
| 2003-02-21 | DRW |
Drawings-only black and white line drawings | 10 | View | |
| 2003-02-21 | OATH |
Oath or Declaration filed | 1 | View |
Inventors
Koichi Higashide
Tokyo, JAPAN
Attorneys & Agents of Record
Classification
USPC
702/89
G01R31/28
G01R31/3191
Prosecution
- Examiner
- LAU, TUNG S
- Art Unit
- 2863
- Customer No.
- 25271
- Docket No.
- KPO12901
- Confirmation No.
- 9800
Foreign Priority
2000-226900
·
2000-07-27
·
JAPAN
Publication
- Pub. No.
- US20030125897A1
- Pub. Date
- 2003-07-03
No recorded assignments were found for this patent.
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Quick Facts
- App. No.
- 10/370,843
- Filed
- 2003-02-21
- Pub. No.
- US20030125897A1
- Examiner
- LAU, TUNG S
- Art Unit
- 2863
External Links