Switch apparatus and test apparatus
View Patent ↗There is provided a semiconductor switch apparatus that can handle a wide range of input voltages. The switch apparatus includes a main switch that is provided between a first terminal and a second terminal, and a switch controller that, to turn on the main switch, supplies the same gate-source voltage to the main switch irrespective of a direction of a current flowing through the main switch. To turn on the main switch, the switch controller supplies the gate-source voltage that is determined based on at least one of a voltage of the first terminal and a voltage of the second terminal to a gate of the main switch.
1. A switch apparatus comprising:
a main switch that is provided between a first terminal and a second terminal; and
a switch controller that, to turn on the main switch, supplies the same gate-source voltage to the main switch irrespective of a direction of a current flowing through the main switch;
wherein to turn on the main switch, the switch controller supplies a higher or lower one of the voltage of the first terminal and the voltage of the second terminal to the gate of the main switch.
2. The switch apparatus as set forth in claim 1 , wherein the switch controller includes an off controller that supplies, to a gate of the main switch, an off voltage that turns off the main switch, to turn off the main switch.
3. The switch apparatus as set forth in claim 1 , wherein the main switch is a GaN semiconductor switch.
4. A test apparatus for testing a device under test, comprising:
a tester that tests the device under test by exchanging signals with the device under test; and
the switch apparatus as set forth in claim 1 , the switch apparatus forming or disconnecting electrical connection between the tester and the device under test.
5. A switch apparatus comprising:
a main switch that is provided between a first terminal and a second terminal; and
a switch controller that, to turn on the main switch, supplies the same gate-source voltage to the main switch irrespective of a direction of a current flowing through the main switch;
wherein to turn on the main switch, the switch controller supplies an intermediate voltage between the voltage of the first terminal and the voltage of the second terminal to the gate of the main switch.
6. The switch apparatus as set forth in claim 5 , wherein the switch controller includes an off controller that supplies, to a gate of the main switch, an off voltage that turns off the main switch, to turn off the main switch.
7. The switch apparatus as set forth in claim 5 , wherein the main switch is a GaN semiconductor switch.
8. A test apparatus for testing a device under test, comprising:
a tester that tests the device under test by exchanging signals with the device under test; and
the switch apparatus as set forth in claim 5 , the switch apparatus forming or disconnecting electrical connection between the tester and the device under test.
9. A switch apparatus comprising:
a main switch that is provided between a first terminal and a second terminal; and
a switch controller that, to turn on the main switch, supplies the same gate-source voltage to the main switch irrespective of a direction of a current flowing through the main switch, the switch controller including
a gate-source voltage generator that receives a voltage of the first terminal and a voltage of the second terminal to generate the gate-source voltage, and
an on controller that allows the voltage of the first terminal and the voltage of the second terminal to be input into the gate-source voltage generator to turn on the main switch and blocks the voltage of the first terminal and the voltage of the second terminal from being input into the gate-source voltage generator to turn off the main switch.
10. The switch apparatus as set forth in claim 9 , wherein the switch controller includes an off controller that supplies, to a gate of the main switch, an off voltage that turns off the main switch, to turn off the main switch.
11. The switch apparatus as set forth in claim 9 , wherein the main switch is a GaN semiconductor switch.
12. A test apparatus for testing a device under test, comprising:
a tester that tests the device under test by exchanging signals with the device under test; and
the switch apparatus as set forth in claim 9 , the switch apparatus forming or disconnecting electrical connection between the tester and the device under test.
13. A switch apparatus comprising:
a main switch that is provided between a first terminal and a second terminal; and
a switch controller that, to turn on the main switch, supplies the same gate-source voltage to the main switch irrespective of a direction of a current flowing through the main switch, the switch controller including
a gate-source voltage generator that receives a voltage of the first terminal and a voltage of the second terminal to generate the gate-source voltage, and
an on controller that allows the gate-source voltage output from the gate-source voltage generator to be supplied to the main switch to turn on the main switch and blocks the gate-source voltage from being supplied to the main switch to turn off the main switch.
14. The switch apparatus as set forth in claim 13 , wherein the switch controller includes an off controller that supplies, to a gate of the main switch, an off voltage that turns off the main switch, to turn off the main switch.
15. The switch apparatus as set forth in claim 13 , wherein the main switch is a GaN semiconductor switch.
16. A test apparatus for testing a device under test, comprising:
a tester that tests the device under test by exchanging signals with the device under test; and
the switch apparatus as set forth in claim 13 , the switch apparatus forming or disconnecting electrical connection between the tester and the device under test.