Granted Patent
Utility
US 6,836,863
· Confirmation No. 5889
SEMICONDUCTOR MEMORY TESTING METHOD AND APPARATUS
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2009-06-25 | EBCC.AD |
Notice of Change of Address Place in File Wrapper Due to Electronic Business Center(EBC) Customer Number Update | 1 | View | |
| 2004-11-15 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2002-01-22 | CRFD |
Sequence Listing in Computer Readable Format is Defective | 7 | View | |
| 2001-08-08 | TRNA |
Transmittal of New Application | 3 | View | |
| 2001-08-08 | ADS |
Application Data Sheet | 2 | View | |
| 2001-08-08 | SPEC |
Specification | 15 | View | |
| 2001-08-08 | CLM |
Claims | 5 | View | |
| 2001-08-08 | ABST |
Abstract | 1 | View | |
| 2001-08-08 | DRW |
Drawings-only black and white line drawings | 6 | View |
Inventors
Makoto Tabata
Tokyo, JAPAN
Noboru Okino
Tokyo, JAPAN
Attorneys & Agents of Record
Classification
USPC
714/719
Prosecution
- Examiner
- DILDINE JR, R STEPHEN
- Art Unit
- 2133
- Customer No.
- 88488
- Docket No.
- KPO131
- Confirmation No.
- 5889
Foreign Priority
2000-243965
·
2000-08-11
·
JAPAN
Publication
- Pub. No.
- US20020054528A1
- Pub. Date
- 2002-05-09
Patent Term Adjustment
-47days
No related applications found.
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2001-12-14
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Quick Facts
- Patent No.
- US 6,836,863
- App. No.
- 09/925,138
- Filed
- 2001-08-08
- Granted
- 2004-12-28
- Pub. No.
- US20020054528A1
- Examiner
- DILDINE JR, R STEPHEN
- Art Unit
- 2133
- PTA
- -47 days
External Links