Inverse characteristic measuring apparatus, distortion compensation apparatus, method, program, and recording medium
View Patent ↗A nonlinear distortion is compensated based upon a characteristic relating to a characteristic of a device under test. An inverse characteristic measuring device measures an output signal output from the device under test as a result of supplying the device under test with an input signal generated by a signal source. Further, the inverse characteristic measuring device acquires an ideal signal output from the device under test based upon the input signal if the device under test is ideal. Moreover, the inverse characteristic measuring device acquires an inverse characteristic which is a relation of the ideal signal with respect to the output signal. This inverse characteristic is applied to a distortion compensator. The distortion compensator supplies the device under test with the input signal converted based upon the inverse characteristic. As a result, a signal output from the device under test is an ideal signal whose distortion caused by the device under test is compensated.
1. An inverse characteristic measuring apparatus comprising:
a signal measurer that measures an output signal Y output from a device under test as a result of the device under test being supplied with an input signal;
an ideal signal acquirer that acquires an ideal signal Yt that would be output from the device under test based upon the input signal if the device under test were ideal; and
an inverse characteristic acquirer that acquires an inverse characteristic h −1 which is a relation of the ideal signal Yt with respect to the output signal Y,
wherein the output signal Y, the ideal signal Yt, and the inverse characteristic h −1 have the relationship Yt=h −1 (Y).
2. The inverse characteristic measuring apparatus according to claim 1 , further comprising:
an input signal measurer that measures the input signal,
wherein said ideal signal acquirer acquires the ideal signal Yt based upon the measured input signal.
3. A distortion compensation apparatus that acquires the inverse characteristic h −1 from the inverse characteristic measuring apparatus according to claim 2 , and provides the device under test with a result of a conversion of the input signal based upon the inverse characteristic h −1 .
4. The inverse characteristic measuring apparatus according to claim 1 , wherein:
the input signal is generated based upon recorded content in a waveform recorder that records a waveform of the input signal; and
said ideal signal acquirer acquires the ideal signal Yt based upon the waveform recorded in the waveform recorder.
5. A distortion compensation apparatus that acquires the inverse characteristic h −1 from the inverse characteristic measuring apparatus according to claim 4 , and converts the waveform recorded in the waveform recorder based upon the inverse characteristic h −1 ,
wherein the input signal is generated based upon a result of the conversion by the distortion compensation apparatus.
6. A distortion compensation apparatus that acquires the inverse characteristic h −1 from the inverse characteristic measuring apparatus according to claim 1 , and provides the device under test with a result of a conversion of the input signal based upon the inverse characteristic h −1 .
7. An inverse characteristic measuring apparatus comprising:
an input signal measurer that measures an input signal generated based upon recorded content in a waveform recorder that records a waveform;
an ideal signal acquirer that acquires the recorded content in said waveform recorder as an ideal signal Yt; and
an inverse characteristic acquirer that acquires an inverse characteristic h −1 which is a relation of the ideal signal Yt with respect to the measured input signal,
wherein the ideal signal Yt and the inverse characteristic h −1 have the relationship Yt=h −1 (Y), Y being an output signal output from a device under test as a result of the device under test being supplied with the input signal.
8. A distortion compensation apparatus that acquires the inverse characteristic h −1 from the inverse characteristic measuring apparatus according to claim 7 , and converts the waveform recorded in the waveform recorder based upon the inverse characteristic h −1 ,
wherein the input signal is generated based upon a result of the conversion by the distortion compensation apparatus.
9. An inverse characteristic measuring method comprising:
measuring an output signal Y output from a device under test as a result of the device under test being supplied with an input signal;
acquiring an ideal signal Yt that would be output from the device under test based upon the input signal if the device under test were ideal; and
acquiring an inverse characteristic h −1 which is a relation of the ideal signal Yt with respect to the output signal Y,
wherein the output signal Y, the ideal signal Yt, and the inverse characteristic h −1 have the relationship Yt=h −1 (Y).
10. An inverse characteristic measuring method comprising:
measuring an input signal generated based upon recorded content in a waveform recorder that records a waveform;
acquiring the recorded content in said waveform recorder as an ideal signal Yt; and
acquiring an inverse characteristic h −1 which is a relation of the ideal signal Yt with respect to the measured input signal,
wherein the ideal signal Yt and the inverse characteristic h −1 have the relationship Yt=h −1 (Y), Y being an output signal output from a device under test as a result of the device under test being supplied with the input signal.
11. A computer-readable medium having a program of instructions for execution by a computer to perform an inverse characteristic measuring process, said inverse characteristic measuring process comprising:
measuring an output signal Y output from a device under test as a result of the device under test being supplied with an input signal;
acquiring an ideal signal Yt that would be output from the device under test based upon the input signal if the device under test were ideal; and
acquiring an inverse characteristic h −1 which is a relation of the ideal signal with respect to the output signal Y,
wherein the output signal Y, the ideal signal Yt, and the inverse characteristic h −1 have the relationship Yt=h −1 (Y).
12. A computer-readable medium having a program of instructions for execution by a computer to perform an inverse characteristic measuring process, said inverse characteristic measuring process comprising:
measuring an input signal generated based upon recorded content in a waveform recorder that records a waveform;
acquiring the recorded content in said waveform recorder as an ideal signal Yt; and
acquiring an inverse characteristic h −1 which is a relation of the ideal signal Yt with respect to the measured input signal,
wherein the ideal signal Yt and the inverse characteristic h −1 have the relationship Yt=h −1 (Y), Y being an output signal output from a device under test as a result of the device under test being supplied with the input signal.