Granted Patent
Utility
US 6,678,852
· Confirmation No. 4518
SEMICONDUCTOR DEVICE TESTING APPARATUS
Inventor:
Masaru Tsuto
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2009-06-25 | EBCC.AD |
Notice of Change of Address Place in File Wrapper Due to Electronic Business Center(EBC) Customer Number Update | 1 | View | |
| 2003-11-17 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2003-11-17 | LET. |
Miscellaneous Incoming Letter | 1 | View | |
| 2001-05-23 | TRNA |
Transmittal of New Application | 2 | View | |
| 2001-05-23 | SPEC |
Specification | 13 | View | |
| 2001-05-23 | CLM |
Claims | 2 | View | |
| 2001-05-23 | ABST |
Abstract | 1 | View | |
| 2001-05-23 | DRW |
Drawings-only black and white line drawings | 5 | View | |
| 2001-05-23 | OATH |
Oath or Declaration filed | 4 | View |
Inventors
Masaru Tsuto
Tokyo, JAPAN
Attorneys & Agents of Record
Classification
USPC
714/738
G01R31/31937
G01R31/31935
Prosecution
- Examiner
- TON, DAVID
- Art Unit
- 2133
- Customer No.
- 88488
- Docket No.
- KPO118
- Confirmation No.
- 4518
Foreign Priority
152496/00
·
2000-05-24
·
JAPAN
Publication
- Pub. No.
- US20010047500A1
- Pub. Date
- 2001-11-29
Patent Term Adjustment
-58days
No related applications found.
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Quick Facts
- Patent No.
- US 6,678,852
- App. No.
- 09/865,811
- Filed
- 2001-05-23
- Granted
- 2004-01-13
- Pub. No.
- US20010047500A1
- Examiner
- TON, DAVID
- Art Unit
- 2133
- PTA
- -58 days
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