Calibration apparatus, calibration method, and testing apparatus

1. A calibration apparatus that calibrates a jitter measuring circuit, the calibration apparatus comprising:

a delay control section that sequentially sets a first delay amount and a second delay amount in a variable delay circuit included in the jitter measuring circuit, the jitter measuring circuit outputting a jitter measuring signal with a level according to an amount of jitter in an input signal based on the input signal and a delay signal obtained by delaying the input signal by means of the variable delay circuit; and

a gain computing section that computes a ratio of a signal level of the jitter measuring signal to a jitter amount included in an input signal for the jitter measuring circuit based on the jitter measuring signal respectively output from the jitter measuring circuit for the first delay amount and the second delay amount.

2. The calibration apparatus as claimed in claim 1 , wherein the gain computing section computes the ratio of a signal level of the jitter measuring signal to a jitter amount included in an input signal for the jitter measuring circuit based on a ratio between a difference between the first delay amount and the second delay amount and a difference between the levels of the jitter measuring signals.

3. The calibration apparatus as claimed in claim 1 , wherein

the delay control section sets the jitter measuring circuit so that the level of the jitter measuring signal output from the jitter measuring circuit for the first delay amount is substantially constant, and

the gain computing section computes the ratio of a signal level of the jitter measuring signal to a jitter amount included in an input signal for the jitter measuring circuit based on a change amount per a unit time of the level of the jitter measuring signal output from the jitter measuring circuit for the second delay amount and the difference between the first delay amount and the second delay amount.

4. The calibration apparatus as claimed in claim 1 , wherein

the jitter measuring circuit comprises:

a jitter signal generating section that generates a jitter signal whose duration of at least one of High logic and Low logic changes according to a jitter in the input signal based on the input signal and the delay signal; and

an integrating section that integrates the jitter signal and outputs the jitter measuring signal with the level according to the amount of jitter in the input signal, and

the calibration apparatus computes gain in the integrating section.

5. The calibration apparatus as claimed in claim 2 , wherein

the delay control section sequentially supplies a first delay setting signal for setting the first delay amount in the variable delay circuit and a second delay setting signal for setting the second delay amount in the variable delay circuit to the variable delay circuit, and

the gain computing section detects the first delay amount when the first delay setting signal has been supplied and the second delay amount when the second delay setting signal has been supplied.

6. A calibration apparatus that calibrates a jitter measuring circuit for outputting a jitter measuring signal with a level according to an amount of jitter in an input signal based on the input signal and a delay signal obtained by delaying the input signal by means of a variable delay circuit, the calibration apparatus comprising:

a delay control section that sequentially sets a first delay amount and a second delay amount in the variable delay circuit; and

a gain computing section that computes gain in the jitter measuring circuit based on a change amount per a unit time of the level of the jitter measuring signal output from the jitter measuring circuit for the second delay amount and a difference between the first delay amount and the second delay amount,

wherein

the delay control section sets the jitter measuring circuit so that the level of the jitter measuring signal output from the jitter measuring circuit for the first delay amount is substantially constant,

the jitter measuring circuit comprises a delay measuring circuit that measures a delay amount of the variable delay circuit and is formed inside a semiconductor package,

the delay control section supplies the first delay setting signal and the second delay setting signal from an outside of the semiconductor package to the variable delay circuit, and

the gain computing section receives delay measurement signals showing the first delay amount and the second delay amount measured by the measuring circuit from the semiconductor package.

7. The calibration apparatus as claimed in claim 6 , wherein

the delay measuring circuit comprises a looping section that loops the delay signal output from the variable delay circuit to an input port of the variable delay circuit to generate an oscillation signal and a period measuring section that measures a period of the oscillation signal,

the delay control section supplies, from the outside of the semiconductor package to the looping section, a signal that causes the looping section to sequentially generate a first oscillation signal obtained by looping the delay signal output from the variable delay circuit controlled by the first delay setting signal and a second oscillation signal obtained by looping the delay signal output from the variable delay circuit controlled by the second delay setting signal, and

the gain computing section receives a period of the first oscillation signal measured by the period measuring section and the delay measurement signal showing a period of the second oscillation signal from the outside of the semiconductor package.

8. A calibration method for calibrating a jitter measuring circuit, the calibration method comprising:

sequentially setting a first delay amount and a second delay amount in a variable delay circuit included in the jitter measuring circuit, the jitter measuring circuit outputting a jitter measuring signal with a level according to an amount of jitter in an input signal based on the input signal and a delay signal obtained by delaying the input signal by means of the variable delay circuit; and

computing a ratio of a signal level of the jitter measuring signal to a jitter amount included in an input signal for the jitter measuring circuit based on the jitter measuring signal respectively output from the jitter measuring circuit for the first delay amount and the second delay amount.