Method and apparatus for electromagnetic interference shielding in an automated test system
View Patent ↗An electronic test system load board electromagnetic shield is presented. The load board electromagnetic shield may have a DUT docking plate having a periphery rim on a first side with an aperture extending through the docking plate that has a waveguide chimney through which a DUT may be inserted into a socket or contactor on the load board.
1. An electronics test system load board EMI shielding apparatus comprising:
a load board with a ground plane;
a contactor attached to the load board;
a conductive plate having a periphery conductive rim on a first side and at least one aperture extending through the plate, wherein the rim is conductively attached to the ground plane of the load board; and
a device handler adapted to insert an electronic device to be tested into the contactor attached to the load board through the aperture in the conductive plate.
2. The load board EMI shielding apparatus according to claim 1 , further comprising conductive spring fingers connected to a ground plane on a load board, such that the periphery conductive rim of the conductive plate attaches to the conductive spring fingers to create an EMI shield.
3. The load board EMI shielding apparatus according to claim 1 , further comprising a conductive waveguide chimney on a second side of the conductive plate extending around and upward from the aperture.
4. An EMI shield with a wave guide aperture in an electronic test system comprising:
a load board with a ground plane;
a contactor attached to the load board;
a conductive plate having a conductive rim on a first surface around a periphery of the conductive plate and an aperture in the conductive plate with a waveguide chimney extending from a second surface of the conductive plate and surrounding the aperture, wherein the rim is attached to the ground plane of the load board to accommodate inserting electronic devices to be tested into the contactor attached to the load board through the aperture in the conductive plate.