Fixing instrument
View Patent ↗Fixtures according to the present invention include fixing surfaces in the same shape as end surfaces of a device under test which is to be measured while an electromagnetic wave to be measured at a frequency equal to more than 0.01 [THz] and equal to or less than 100 [THz] is irradiated on the device under test. The end surfaces are fixed to the fixing surfaces. When a refractive index of the fixtures is n 0 , and a refractive index of the device under test is n 1 , a relationship n 1 −0.1≦n 0 ≦n 1 +0.1 holds. The fixtures do not cover a side surface of the device under test. The fixtures are rotated about a straight line orthogonal to the fixing surfaces as a rotational axis.
1. A fixture comprising a fixing surface in the same shape as an end surface of a device under test which is measured by irradiating an electromagnetic wave to be measured having a frequency equal to or more than 0.01 terahertz and equal to or less than 100 terahertz on the device under test, wherein:
the end surface is fixed to the fixing surface;
a relationship n 1 −0.1≦n 0 ≦n 1 +0.1 holds, where n 0 denotes a refractive index of the fixture and n 1 denotes a refractive index of the device under test; and
the fixture does not cover a side surface of the device under test,
wherein the fixture is disposed within a container that includes at least one curved surface portion that at least partially encloses the device under test, the at least one curved surface portion being a lens for refracting the electromagnetic wave.
2. The fixture according to claim 1 , wherein the fixture is rotated about a straight line orthogonal to the fixing surface as an axis.
3. The fixture according to claim 2 , wherein a travel direction of the electromagnetic wave to be measured is orthogonal to the straight line.
4. The fixture according to claim 1 , wherein the end surface is fixed to the fixing surface by pressing the fixing surface against the end surface.
5. The fixture according to claim 4 , wherein:
there are two of the fixtures;
the device under test has two of the end surfaces parallel with each other; and
the two fixtures are respectively pressed against the two end surfaces.
6. The fixture according to claim 1 , wherein the end surface is fixed to the fixing surface by adhering the fixing surface to the end surface.
7. The fixture according to claim 1 , wherein
the container comprises:
a gap portion which internally disposes at least a part of the device under test; and
an enclosure portion which includes a first curved surface portion and a second curved surface portion, and disposes the gap portion between the first curved surface portion and the second curved surface portion, thereby enclosing the gap portion,
a refractive index n 2 of the enclosure portion is larger than the refractive index n 1 of the device under test, and
both the first curved surface portion and the second curved surface portion are convex surfaces.
8. The fixture according to claim 1 , wherein
the container comprises:
a gap portion which internally disposes at least a part of the device under test; and
an enclosure portion which includes a first curved surface portion and a second curved surface portion, and disposes the gap portion between the first curved surface portion and the second curved surface portion, thereby enclosing the gap portion,
a refractive index n 2 of the enclosure portion is smaller than the refractive index n 1 of the device under test, and
both the first curved surface portion and the second curved surface portion are concave surfaces.
9. The fixture according to claim 7 , wherein a contour of a plane shape of the gap portion of the container includes an arc.
10. The fixture according to claim 1 , wherein
the container comprises:
a first cover portion including a first curved surface portion which receives the electromagnetic wave to be measured, and a first concave surface portion which is closer than the first curved surface portion to the device under test, and through which the electromagnetic wave to be measured transmits, and having a refractive index of n 2 a ; and
a second cover portion including a second concave surface portion which receives the electromagnetic wave to be measured which has transmitted through the device under test, and a second curved surface portion which is farther than the second concave surface portion from the device under test, and through which the electromagnetic wave to be measured transmits, and having a refraction index of n 2 b , and
when the refractive index of the device under test is n 1 ,
if n 2 a is larger than n 1 , the first curved surface portion is a convex surface,
if n 2 a is smaller than n 1 , the first curved surface portion is a concave surface,
if n 2 b is larger than n 1 , the second curved surface portion is a convex surface, and
if n 2 b is smaller than n 1 , the second curved surface portion is a concave surface.
11. The fixture according to claim 10 , wherein n 2 a and n 2 b of the container are different from each other.
12. The fixture according to claim 10 , wherein a curvature radius of a plane shape of the first curved surface portion of the container and a curvature radius of a plane shape of the second curved surface portion of the container are different from each other.
13. The fixture according to claim 10 , wherein contours of plane shapes of the first concave surface portion and the second concave surface portion of the container include an arc.