Test apparatus and test method

1. A test apparatus that tests a device under test, comprising:

a plurality of testing sections that sequentially execute commands included in programs supplied respectively thereto so as to output data patterns to be provided to pins of the device under test; and

a synchronizing section that synchronizes operation of at least two testing sections among the plurality of testing sections, wherein

each testing section transmits a synchronization standby command to the synchronizing section when a predetermined condition is fulfilled during execution of the corresponding program and the testing section enters a synchronization standby state, and

on a condition that the synchronization standby commands have been received from all of one or more designated testing sections among the plurality of testing sections, the synchronizing section supplies a synchronization signal, which ends the synchronization standby state, in synchronization to the at least two testing sections, the one or more designated testing sections being a different combination of testing sections than the at least two testing sections.

2. The test apparatus according to claim 1 , wherein

the synchronizing section is further operable to supply the synchronization signal in synchronization to all of the testing sections on a condition that the synchronization standby commands have been received from all of the testing sections.

3. The test apparatus according to claim 1 , wherein

after a predetermined time has passed since receiving a final one of the synchronization standby commands from the one or more designated testing sections, the synchronizing section supplies the synchronization signal in synchronization to the at least two testing sections.

4. The test apparatus according to claim 3 , wherein

the predetermined time is a constant time that is unaffected by the number of the one or more designated testing sections.

5. The test apparatus according to claim 1 , wherein

the synchronizing section changes a combination of the testing sections to which the synchronization signal is supplied in synchronization, during execution of the programs.

6. The test apparatus according to claim 1 , wherein

each testing section transmits to the synchronizing section a designation command indicating whether the synchronization standby state of the testing section is to be ended when another testing section has entered the synchronization standby state prior to the synchronization standby command being sent to the synchronizing section, and

on a condition that the synchronization standby commands have been received from all of the one or more designated testing sections set by the designation commands, the synchronizing section supplies the synchronization signal to the corresponding testing sections.

7. The test apparatus according to claim 1 , wherein

each program includes a command for repeatedly supplying the device under test with a predetermined wait packet when the corresponding testing section is in the synchronization standby state, and

each testing section transmits the synchronization standby command to the synchronizing section when a command for supplying the device under test with the wait packet is detected.

8. The test apparatus according to claim 1 , wherein

the device under test includes a plurality of function blocks that operate at different frequencies,

the at least two testing sections include at least one testing section belonging to a first time domain of the test apparatus and at least one testing section belonging to a second time domain of the test apparatus, the first time domain and the second time domain being operable to test different function blocks of the device under test, and

the synchronization section includes an upper-level synchronizing function that supplies the synchronization signal in response to a notification that the synchronization standby commands have been received from the at least one testing section belonging to the first time domain and the at least one testing section belonging to the second time domain.

9. A test method comprising:

using a plurality of testing sections of a test apparatus to sequentially execute commands included in programs supplied respectively thereto so as to output data patterns to be provided to sins of a device under test;

using each testing section to transmit a synchronization standby command to a synchronizing section of the test apparatus when a predetermined condition is fulfilled during execution, by the testing section, of a program supplied to the testing section and the testing section enters a synchronization standby state; and

on a condition that the synchronization standby commands have been received by the synchronizing section from all of one or more designated testing sections among the plurality of testing sections, supplying a synchronization signal, which ends the synchronization standby state, in synchronization to at least two testing sections among the plurality of testing sections to synchronize operation of the at least two testing sections, the one or more designated testing sections being a different combination of testing section than the at least two testing sections.

10. The test method according to claim 9 , further comprising

supplying the synchronization signal in synchronization to all of the testing sections on a condition that the synchronization standby commands have been received from all of the testing sections.

11. The test method according to claim 9 , wherein

the supplying includes supplying the synchronization signal in synchronization to the at least two testing sections after a predetermined time has passed since receiving a final one of the synchronization standby commands from the one or more designated testing sections.

12. The test method according to claim 11 , wherein

the predetermined time is a constant time that is unaffected by the number of the one or more designated testing sections.

13. The test method according to claim 9 , further comprising

changing a combination of the testing sections to which the synchronization signal is supplied in synchronization, during execution of the programs.

14. The test method according to claim 9 , further comprising

using each testing section to transmit, to the synchronizing section, a designation command indicating whether the synchronization standby state of the testing section is to be ended when another testing section has entered the synchronization standby state prior to the synchronization standby command being sent to the synchronizing section, wherein

the supplying includes, on a condition that the synchronization standby commands have been received from all of the one or more designated testing sections set by the designation commands, supplying the synchronization signal to the corresponding testing sections.

15. The test method according to claim 9 , wherein

each program includes a command for repeatedly supplying the device under test with a predetermined wait packet when the corresponding testing section is in the synchronization standby state, and

said using each testing section to transmit a synchronization standby command includes using each testing section to transmit the synchronization standby command to the synchronizing section when a command for supplying the device under test with the wait packet is detected.

16. The test method according to claim 9 , wherein

the device under test includes a plurality of function blocks that operate at different frequencies,

the at least two testing sections include at least one testing section belonging to a first time domain of the test apparatus and at least one testing section belonging to a second time domain of the test apparatus, the first time domain and the second time domain being operable to test different function blocks of the device under test, and

the supplying includes supplying, by an upper-level synchronizing function of the synchronizing section, the synchronization signal in response to a notification that the synchronization standby commands have been received from the at least one testing section belonging to the first time domain and the at least one testing section belonging to the second time domain.