Granted Patent
Utility
US 6,787,780
· Confirmation No. 3364
MULTI-BEAM EXPOSURE APPARATUS USING A MULTI-AXIS ELECTRON LENS, FABRICATION METHOD OF A SEMICONDUCTOR DEVICE
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2004-05-05 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2004-04-26 | FRPR |
Certified Copy of Foreign Priority Application | 87 | View | |
| 2003-07-21 | RCEX |
Request for Continued Examination (RCE) | 1 | View | |
| 2003-07-21 | CFILE |
Request for Corrected Filing Receipt | 4 | View | |
| 2003-07-21 | LET. |
Miscellaneous Incoming Letter | 3 | View | |
| 2003-07-21 | ADS |
Application Data Sheet | 3 | View | |
| 2003-07-21 | OATH |
Oath or Declaration filed | 3 | View | |
| 2003-07-21 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 4 | View | |
| 2001-04-04 | TRNA |
Transmittal of New Application | 2 | View | |
| 2001-04-04 | SPEC |
Specification | 86 | View | |
| 2001-04-04 | CLM |
Claims | 5 | View | |
| 2001-04-04 | ABST |
Abstract | 1 | View | |
| 2001-04-04 | DRW |
Drawings-only black and white line drawings | 55 | View | |
| 2001-04-04 | OATH |
Oath or Declaration filed | 6 | View |
Inventors
Attorneys & Agents of Record
Classification
USPC
250/492.23
Prosecution
- Examiner
- VANORE, DAVID A
- Art Unit
- 2881
- Customer No.
- 25224
- Docket No.
- P 280020 AD-0198US
- Confirmation No.
- 3364
Foreign Priority
2000-102619
·
2000-04-04
·
JAPAN
2000-251885
·
2000-08-23
·
JAPAN
2000-342655
·
2000-10-03
·
JAPAN
Publication
- Pub. No.
- US20010028046A1
- Pub. Date
- 2001-10-11
Patent Term Adjustment
-120days
No related applications found.
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2001-04-04
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Quick Facts
- Patent No.
- US 6,787,780
- App. No.
- 09/824,880
- Filed
- 2001-04-04
- Granted
- 2004-09-07
- Pub. No.
- US20010028046A1
- Examiner
- VANORE, DAVID A
- Art Unit
- 2881
- PTA
- -120 days
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