Method of connecting probe pin to circuit board and method of manufacturing probe card

1. A method of manufacturing a probe card that electrically connects a testing device and a device under test to transmit a signal between the testing device and the device under test, the method comprising the steps of:

forming a probe pin on a probe pin substrate;

joining the probe pin held on the probe pin substrate to a circuit board; and

cutting the probe pin to separate the probe pin substrate from the probe pin,

wherein said probe pin forming step comprises the steps of:

depositing a sacrifice layer on a surface of the probe pin substrate;

depositing a conductive material from the surface of the probe pin substrate to a surface of the sacrifice layer to form the probe pin; and

removing the sacrifice layer to form a portion in which the probe pin is separated from the probe pin substrate, and

wherein said probe pin cutting step comprises the step of cutting the portion of the probe pin, which is separated from the probe pin substrate, while the remaining portion of the probe pin is joined to the probe pin substrate.

2. The manufacturing method as claimed in claim 1 , wherein the manufacturing method further comprises the step of forming a bump, which electrically connects electric wiring on the circuit board and the probe pin, ahead of a position in which the probe pin is in contact with the probe pin substrate, and said sacrifice layer removing step comprises the step of removing the sacrifice layer to form the portion separated from the probe pin substrate between the position in which the probe pin is in contact with the probe pin substrate and a position in which the probe pin is in contact with the bump.

3. The manufacturing method as claimed in claim 1 , wherein the manufacturing method further comprises the step of removing a portion of the probe pin substrate and bending the probe pin in a direction toward the probe pin substrate, and said sacrifice layer removing step comprises the step of removing the sacrifice layer after said probe pin bending step.

4. The manufacturing method as claimed in claim 1 , wherein said probe pin forming step comprises the step of forming a cut portion in which an area of a cross section generally perpendicular to a drawing direction of the probe pin is smaller than that of the rest of the probe pin, and said probe pin cutting step comprises the step of cutting the probe pin at the position of the cut portion.

5. The manufacturing method as claimed in claim 4 , wherein said cut portion forming step comprises the step of forming the cut portion having a width narrower than that of the rest of the probe pin.

6. A method of manufacturing a probe card that electrically connects a testing device and a device under test to transmit a signal between the testing device and the device under test, the method comprising the steps of:

forming a probe pin on a probe pin substrate;

joining the probe pin held on the probe pin substrate to a circuit board; and

cutting the probe pin to separate the probe pin substrate from the probe pin,

wherein said probe pin forming step comprises the steps of:

depositing a conductive material on a surface of the probe pin substrate to form the probe pin; and

removing some portion of the probe pin substrate to form a portion in which the probe pin is separated from the probe pin substrate, and

wherein said probe pin cutting step comprises the step of cutting the portion of the probe pin, which is separated from the probe pin substrate, while the remaining portion is joined to the probe pin substrate.

7. A method of connecting a probe pin to a circuit board, comprising the steps of:

forming a probe pin on a probe pin substrate;

joining the probe pin held on the probe pin substrate to the circuit board; and

cutting the probe pin to separate the probe pin substrate from the probe pin,

wherein said probe pin forming step comprises the steps of

depositing a sacrifice layer on a surface of the probe pin substrate;

depositing a conductive material from the surface of the probe pin substrate to a surface of the sacrifice layer to form the probe pin; and

removing the sacrifice layer to form a portion in which the probe pin is separated from the probe pin substrate, and

wherein said probe pin cutting step comprises the step of cutting the portion of the probe pin, which is separated from the probe pin substrate, while the remaining portion of the probe pin is joined to the probe pin substrate.