Test electronics to device under test interfaces, and methods and apparatus using same

1. A test electronics to device under test (DUT) interface, comprising:

a test electronics interface;

a zero insertion force (ZIF) connector having:

a compliant flex circuit form;

a flex circuit having a first surface and a second surface, the flex circuit being looped around the flex circuit form with the first surface facing the flex circuit form, the flex circuit having a plurality of electrical contacts on the second surface, the plurality of electrical contacts providing at least part of a DUT interface, and the flex circuit having a plurality of electrical signal paths thereon, the plurality of electrical signal paths being coupled to the plurality of electrical contacts of the DUT interface; and

a ZIF connector to DUT clamping mechanism; and

a plurality of coaxial cables coupled between the test electronics interface and the electrical signal paths of the flex circuit.

2. The test electronics to DUT interface of claim 1 , wherein the test electronics interface comprises at least one printed circuit board (PCB) to which the coaxial cables are electrically coupled.

3. The test electronics to DUT interface of claim 2 , wherein the ATE interface further comprises at least one test electronics interposer, each of the at least one test electronics interposer having a first side and a second side, the first side of each test electronics interposer having a first plurality of electrical contacts that is electrically coupled to at least some of the coaxial cables via a respective one of the at least one PCB, and the second side of each test electronics interposer having a second plurality of electrical contacts that provide an electrical coupling to a test electronics assembly.

4. The test electronics to DUT interface of claim 1 , wherein the test electronics interface comprises at least two printed circuit boards (PCBs) to which ones of the coaxial cables are electrically coupled.

5. The test electronics to DUT interface of claim 1 , wherein the DUT interface further comprises a DUT interposer having a first side and a second side, the first side of the DUT interposer having a first plurality of electrical contacts coupled to the plurality of electrical contacts of the flex circuit, and the second side of the DUT interposer having a second plurality of electrical contacts coupled to the first plurality of electrical contacts, the second plurality of electrical contacts providing an electrical coupling to the DUT.

6. The test electronics to DUT interface of claim 1 , wherein the ZIF connector to DUT clamping mechanism is configured to i) apply a first orthogonal force to a probe card that interfaces with a DUT, by pressing the DUT interface against the probe card, and simultaneously ii) exert a second orthogonal force on the probe card, the second orthogonal force being opposite in direction to the first orthogonal force.

7. The test electronics to DUT interface of claim 6 , wherein the ZIF connector to DUT clamping mechanism comprises a pneumatically actuated clamping mechanism.

8. The test electronics to DUT interface of claim 1 , wherein:

the flex circuit has first and second opposing ends; and

first and second subsets of the plurality of coaxial cables are respectively coupled to the first and second opposing ends of the flex circuit.

9. The test electronics to DUT interface of claim 1 , wherein the electrical signal paths of the flex circuit comprise controlled impedance transmission line paths.