IP Library Granted Patent US 6,956,393
Granted Patent B1
US 6,956,393 · App. 10/854,688 · Granted Oct 18, 2005

Source current measurement apparatus and test apparatus

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Quick Facts
Patent No.
US 6,956,393
App. No.
10/854,688
Granted
Oct 18, 2005
Kind
B1
Abstract

A source current measurement apparatus for supplying a source voltage to an electronic device and measuring a source current supplied to the electronic device includes a reference voltage generating unit for generating a reference voltage, a supply unit for generating the source voltage based on the reference voltage and supplying the source voltage to the electronic device, wherein the supply unit is provided between the reference voltage generating unit and the electronic device, a feedback unit for controlling magnitude of the reference voltage generated by the reference voltage generating unit based on the source voltage applied to the electronic device, and a measurement unit for measuring the source current, wherein the supply unit includes a first differential amplifier for outputting the source voltage corresponding to a differential between the reference voltage and a predetermined comparison voltage and a second differential amplifier for generating the comparison voltage corresponding to the source voltage outputted by the first differential amplifier and supplying the comparison voltage to the first differential amplifier.

Claims (25)

1. A source current measurement apparatus for supplying a source voltage to an electronic device and measuring a source current supplied to said electronic device, comprising:

a reference voltage generating unit for generating a reference voltage;

a supply unit for generating said source voltage based on said reference voltage and supplying said source voltage to said electronic device, wherein said supply unit is provided between said reference voltage generating unit and said electronic device;

a feedback unit for controlling magnitude of said reference voltage generated by said reference voltage generating unit based on said source voltage applied to said electronic device; and

a measurement unit for measuring said source current, wherein said supply unit comprises:

a first differential amplifier for outputting said source voltage corresponding to a differential between said reference voltage and a predetermined comparison voltage; and

a second differential amplifier for generating said comparison voltage corresponding to said source voltage outputted by said first differential amplifier and supplying said comparison voltage to said first differential amplifier.

2. A source current measurement apparatus as claimed in claim 1 further comprising a plurality of said supply units provided in parallel between said reference voltage generating unit and said electronic device,

wherein said measurement unit measures said source current by detecting an output current outputted by said first differential amplifier of one of said supply units according to said comparison voltage outputted by said second differential amplifier of said one of supply units and multiplying said output current by a coefficient corresponding to a number of said supply units provided in parallel.

3. A source current measurement apparatus as claimed in claim 2 , wherein each of said supply units further comprises a current detecting unit for detecting said output current outputted by said first differential amplifier, and said second differential amplifier generates said comparison voltage corresponding to said output current.

4. A source current measurement apparatus as claimed in claim 3 , wherein said current detecting unit comprises a current detecting resistor provided in series between said first differential amplifier and said electronic device, and said second differential amplifier generates said comparison voltage corresponding to a voltage difference between both ends of said current detecting resistor.

5. A source current measurement apparatus as claimed in claim 1 further comprising a clamp unit for restricting magnitude of said reference voltage generated by said reference voltage generating unit based on said comparison voltage outputted by said second differential amplifier of said supply unit.

6. A source current measurement apparatus as claimed in claim 2 further comprising a clamp unit for restricting magnitude of said reference voltage generated by said reference voltage generating unit based on said comparison voltage outputted by said second differential amplifier of one of said supply units.

7. A test apparatus for testing an electronic device, comprising:

a source current measurement apparatus for supplying a source voltage to said electronic device and measuring a source current supplied to said electronic device; and

a judgment unit for judging quality of said electronic device based on said source current measured by said source current measurement apparatus,

wherein said source current measurement apparatus comprises:

a reference voltage generating unit for generating a reference voltage;

a supply unit for generating said source voltage based on said reference voltage and supplying said source voltage to said electronic device, wherein said supply unit is provided between said reference voltage generating unit and said electronic device;

a feedback unit for controlling magnitude of said reference voltage generated by said reference voltage generating unit based on said source voltage applied to said electronic device; and

a measurement unit for measuring said source current, and

said supply unit comprises:

a first differential amplifier for outputting said source voltage corresponding to a differential between said reference voltage and a given comparison voltage; and

a second differential amplifier for generating said comparison voltage corresponding to said source voltage outputted by said first differential amplifier and supplying said comparison voltage to said first differential amplifier.

8. A test apparatus as claimed in claim 7 , wherein said source current measurement apparatus further comprises a plurality of said supply units provided in parallel between said reference voltage generating unit and said electronic device, and said measurement unit measures said source current by detecting an output current outputted by said first differential amplifier of one of said supply units according to said comparison voltage outputted by said second differential amplifier of said one of supply units and multiplying said output current by a coefficient corresponding to a number of said supply units provided in parallel.

Assignments (2)
CHANGE OF ADDRESS Recorded Dec 18, 2018
From: ADVANTEST CORPORATION
To: ADVANTEST CORPORATION
Reel/Frame 047987/0626 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 26, 2004
From: TANAKA, HIRONORI
To: ADVANTEST CORPORATION
Reel/Frame 015388/0236 →