Terahertz wave measuring apparatus having space arrangement structure and measuring method
View Patent ↗There is provided a measuring apparatus including a space arrangement structure that includes space regions surrounded by conductors in a plane, an electromagnetic wave emitter that emits electromagnetic waves towards an object held by the space arrangement structure, and an electromagnetic wave detector that measures the electromagnetic waves that have passed through the space arrangement structure. Here, characteristics of the object are measured by measuring the electromagnetic waves that have passed through the space arrangement structure. The electromagnetic waves emitted from the electromagnetic wave emitter towards the space arrangement structure are incident on the plane containing the space regions at an angle, and the electromagnetic waves that have passed through the space arrangement structure are measured.
1. A measuring apparatus comprising:
a space arrangement structure that includes space regions surrounded by conductors in a plane;
an electromagnetic wave emitter that emits electromagnetic waves towards an object held by the space arrangement structure, wherein the electromagnetic waves emitted from the electromagnetic wave emitter towards the space arrangement structure are incident on the plane containing the space regions at an angle;
an electromagnetic wave detector that detects the electromagnetic waves that have passed through the space arrangement structure; and
an analyzer configured to measure characteristics of the object by comparing a position of a dip in a waveform of measured frequency characteristics of a transmittance of the space arrangement structure when the object is absent with a position of a dip in a waveform of measured frequency characteristics of a transmittance of the space arrangement structure when the object is present, wherein
the space arrangement structure holding the object is placed between the electromagnetic wave emitter and the electromagnetic wave detector in such a manner that the plane containing the space regions is orthogonal to a straight line connecting together the electromagnetic wave emitter and the electromagnetic wave detector, and
the electromagnetic waves emitted from the electromagnetic wave emitter are converged towards a single point on the straight line after the electromagnetic wave emitter and before the space arrangement structure and the object.
2. The measuring apparatus as set forth in claim 1 , wherein
the analyzer measures the characteristics of the object based on a shift amount between the position of the dip in the waveform of the measured frequency characteristics of the transmittance of the space arrangement structure when the object is absent and the position of the dip in the waveform of measured frequency characteristics of the transmittance of the space arrangement structure when the object is present.
3. The measuring apparatus as set forth in claim 1 , wherein
an incidence angle of the electromagnetic waves with respect to the plane containing the space regions is set no more than 10 degrees.
4. A measuring apparatus comprising:
a space arrangement structure that includes space regions surrounded by conductors in a plane;
an electromagnetic wave emitter that emits electromagnetic waves towards an object held by the space arrangement structure, wherein the electromagnetic waves emitted from the electromagnetic wave emitter towards the space arrangement structure are incident on the plane containing the space regions at an angle;
an electromagnetic wave detector that detects the electromagnetic waves that have passed through the space arrangement structure; and
an analyzer configured to measure characteristics of the object by comparing a position of a dip in a waveform of measured frequency characteristics of a transmittance of the space arrangement structure when the object is absent with a position of a dip in a waveform of measured frequency characteristics of a transmittance of the space arrangement structure when the object is present, wherein
the space arrangement structure holding the object is placed between the electromagnetic wave emitter and the electromagnetic wave detector in such a manner that the plane containing the space regions is orthogonal to a straight line connecting together the electromagnetic wave emitter and the electromagnetic wave detector, and
the electromagnetic waves emitted from the electromagnetic wave emitter are converged into a straight line that (i) contains a single point after the electromagnetic wave emitter and before the space arrangement structure and the object on the straight line connecting together the electromagnetic wave emitter and the electromagnetic wave detector and (ii) is orthogonal to the straight line connecting together the electromagnetic wave emitter and the electromagnetic wave detector.
5. The measuring apparatus as set forth in claim 4 , wherein
an incidence angle of the electromagnetic waves with respect to the plane containing the space regions is set no more than 10 degrees.
6. The measuring apparatus as set forth in claim 4 , wherein
the analyzer measures the characteristics of the object based on a shift amount between the position of the dip in the waveform of the measured frequency characteristics of the transmittance of the space arrangement structure when the object is absent and the position of the dip in the waveform of measured frequency characteristics of the transmittance of the space arrangement structure when the object is present.
7. A measuring method comprising:
emitting electromagnetic waves towards an object held by a space arrangement structure including space regions surrounded by conductors in a plane, wherein the electromagnetic waves emitted from the electromagnetic wave emitter towards the space arrangement structure are incident on the plane containing the space regions at an angle;
detecting the electromagnetic waves that have passed through the space arrangement structure; and
measuring characteristics of the object by comparing a position of a dip in a waveform of measured frequency characteristics of a transmittance of the space arrangement structure when the object is absent with a position of a dip in a waveform of measured frequency characteristics of a transmittance of the space arrangement structure when the object is present, the dip in each waveform created due to the incidence angle of the electromagnetic waves with respect to a normal line of the plane containing the space regions.
8. The measuring apparatus as set forth in claim 7 , wherein
an incidence angle of the electromagnetic waves with respect to the plane containing the space regions is set no more than 10 degrees.
9. The measuring method as set forth in claim 7 , wherein
the measuring comprises measuring the characteristics of the object based on a shift amount between the position of the dip in the waveform of the measured frequency characteristics of the transmittance of the space arrangement structure when the object is absent and the position of the dip in the waveform of measured frequency characteristics of the transmittance of the space arrangement structure when the object is present.
10. The measuring method as set forth in claim 7 , wherein
the emitting is performed by using an electromagnetic wave emitter,
the detecting is performed by using an electromagnetic wave detector, and
the space arrangement structure holding the object is placed between the electromagnetic wave emitter and the electromagnetic wave detector in such a manner that the plane containing the space regions is at an angle with respect to a straight line connecting together the electromagnetic wave emitter and the electromagnetic wave detector.
11. The measuring method as set forth in claim 7 , wherein
the emitting is performed by using an electromagnetic wave emitter,
the detecting is performed by using an electromagnetic wave detector,
the space arrangement structure holding the object is placed between the electromagnetic wave emitter and the electromagnetic wave detector in such a manner that the plane containing the space regions is orthogonal to a straight line connecting together the electromagnetic wave emitter and the electromagnetic wave detector, and
the electromagnetic waves emitted from the electromagnetic wave emitter are converged towards a single point on the straight line.
12. The measuring apparatus as set forth in claim 7 , wherein
the emitting is performed by using an electromagnetic wave emitter,
the detecting is performed by using an electromagnetic wave detector,
the space arrangement structure holding the object is placed between the electromagnetic wave emitter and the electromagnetic wave detector in such a manner that the plane containing the space regions is orthogonal to a straight line connecting together the electromagnetic wave emitter and the electromagnetic wave detector, and
the electromagnetic waves emitted from the electromagnetic wave emitter are converged into a straight line that (i) contains a single point on the straight line connecting together the electromagnetic wave emitter and the electromagnetic wave detector and (ii) is orthogonal to the straight line connecting together the electromagnetic wave emitter and the electromagnetic wave detector.
13. The measuring method as set forth in claim 7 , wherein
the dip in each waveform becomes deeper as the incidence angle increases.
14. The measuring method as set forth in claim 7 , wherein
the dip is steeper than the steepest peak in each waveform.