Granted Patent
Utility
US 6,292,342 · App. 09/315,798
Voltage protection circuit for semiconductor test system
Inventor:
Yasuhiro Miyamoto
Patented Case
View Patent ↗
Granted: Sep 18, 2001
Filed: May 21, 1999
Inventor
Yasuhiro Miyamoto
Assignee (at issue)
Advantest Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.