IP Library Granted Patent US 6,873,405
Granted Patent B2
US 6,873,405 · App. 10/740,999 · Granted Mar 29, 2005

Propagation measuring apparatus and a propagation measuring method

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Quick Facts
Patent No.
US 6,873,405
App. No.
10/740,999
Granted
Mar 29, 2005
Kind
B2
Abstract

A propagation measuring apparatus for measuring propagation characteristics of an object to be measured includes a first light source for outputting a first optical signal of a first frequency, a second light source for outputting a second optical signal of a second frequency, a terahertz light outputting unit for generating terahertz light of a frequency, which is equal to a difference between the first and second frequencies, by using the first and second optical signals and radiating the terahertz light to the object to be measured, a first detecting unit for detecting the terahertz light passing through the object to be measured and a measuring unit for measuring the propagation characteristics of the object to be measured based on the terahertz light detected by the first detecting unit.

Claims (21)

1. A propagation measuring apparatus for measuring propagation characteristics of an object to be measured comprising:

a first light source for outputting a first optical signal of a first frequency;

a second light source for outputting a second optical signal of a second frequency;

a terahertz light outputting unit for generating terahertz light of a frequency,

which is equal to a difference between said first and second frequencies, by using

said first and second optical signals and radiating said terahertz light to said object to be measured:

a first detecting unit for detecting said terahertz light passing through said object to be measured;

a measuring unit for measuring said propagation characteristics of said object to be measured based on said terahertz light detected by said first detecting unit;

a reference signal source for generating a referencee signal; and a modulating unit for modulating at least one of said first and second optical signals based on said reference signal generated by said reference signal source,

wherein said measuring unit measures said propagation characteristics of said object to be measured based on at least one of said first and second optical signals modulated by said modulating unit and said reference signal generated by said reference signal source, further comprising:

a first demultiplexer for demultiplexing said first optical signal outputted by said first light source;

a second demultiplexer for demultiplexing said second optical signal outputted by said second light source;

a first multiplexer for multiplexing a first component of said first optical signal demultiplexed by said first demultiplexer and a first component of said second optical signal demultiplexed by said second demultiplexer; and

a second multiplexer for multiplexing a second component of said first optical signal demultiplexed by said first demultiplexer and a second component of said second optical signal demultiplexed by said second demultiplexer,

wherein said terahertz light outputting unit generates said terahertz light by using said first and second optical signals multiplexed by said first multiplexer and radiates said terahertz light to said object to be measured,

said modulating unit modulates a frequency of said second component of said first optical signal demultiplexed by said first demultiplexer,

said second multiplexer multiplexes said second component of said first optical signal of which said frequency is odulated by said modulating unit and said second component of said second optical signal demultiplexed by said second demultiplexer, and

said first detecting unit performs heterodyne detection of said terahertz light passing through said object to be measured by using said second components of said first and second optical signals multiplexed by said second multiplexer.

2. A propagation measuring apparatus as claimed in claim 1 further comprising a delay element for delaying at least one of said second component of said first optical signal demultiplexed by said first demultiplexer and said second component of said second optical signal demultiplexed by said second demultiplexer.

3. A propagation measuring apparatus as claimed in claim 1 further comprising a second detecting unit for detecting said terahertz light radiated by said terahertz light outputting unit not through said object to be measured and performing heterodyne detection by using said second components of said first and second optical signals multiplexed by said second multiplexer,

wherein said measuring unit measures said propagation characteristics of said object to be measured based on results of said heterodyne detection of said first and second detecting units.

Assignments (2)
CHANGE OF ADDRESS Recorded Dec 18, 2018
From: ADVANTEST CORPORATION
To: ADVANTEST CORPORATION
Reel/Frame 047987/0626 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 19, 2003
From: KIDO, TAKASHI; NIKI, SHOJI
To: ADVANTEST CORPORATION
Reel/Frame 014826/0157 →