Automated test equipment for combined signals
An automated test equipment for testing devices under test is configured to combine different output signals from multiple pins of a single device under test or from pins of a plurality of devices under test to obtain a combined signal; and to extract individual signals or properties of the individual signals from the combined signal.
1. An apparatus comprising:
an automated test equipment for testing devices, wherein the automated test equipment is configured
to generate a combined signal comprising a plurality of different signal components, wherein the plurality of different signal components are multiplexed into combined signals, and
to provide the combined signal to a plurality of pins of a plurality of devices under test, wherein at least one of the plurality of different signal components comprises a different signal characteristic relative to another one of the plurality of different signal components, and wherein at a predetermined time respective ones of the plurality of different signal components are received and evaluated by respective ones of the plurality of devices under test.
2. The apparatus according to claim 1 , wherein the automated test equipment is further configured to control the devices to cause, at a given time, different ones of the devices to evaluate a same one of the different signal components of the combined signal.
3. The apparatus according to claim 1 , wherein the automated test equipment is further configured to control the devices to cause, at a given time, different ones of the devices to evaluate different ones of the different signal components of the combined signal.
4. An apparatus comprising:
an automated test equipment for testing devices, wherein the automated test equipment is configured:
to combine a first plurality of different output signals from at least one of multiple pins of a device under test or a plurality of pins of a plurality of devices under test to acquire a combined signal, wherein the first plurality of different output signals are multiplexed into the combined signal;
to extract at least one of a plurality of individual signals or at least one of a plurality of properties from the combined signal, wherein the plurality of individual signals corresponds to the first plurality of different output signals;
generate a combined signal comprising a second plurality of different signal components, wherein the second plurality of different signal components are multiplexed into the combined signals; and
to provide the combined signal to at least one of multiple pins of a device under test or a plurality of pins of a plurality of devices under test.
5. The apparatus according to claim 4 , wherein the different output signals comprise at least two out of a digital signal, an analog signal, a Radio-Frequency signal, or a DC signal.
6. The apparatus according to claim 4 , wherein the different output signals are at least one of time-multiplexed into the combined signal, frequency-multiplexed into the combined signal, or code-multiplexed into the combined signal.
7. The apparatus according to claim 4 , wherein the automated test equipment is further configured to separate out the different output signals which are time-multiplexed into the combined signal, frequency-multiplexed into the combined signal, or code-multiplexed into the combined signal.
8. The apparatus according to claim 4 , wherein the automated test equipment comprises a signal extracting unit that is configured to perform the extraction of the at least one of the individual signals or the properties of the individual signals from the combined signal, and wherein the signal extracting unit comprises a digital filter.
9. The apparatus according to claim 4 , wherein the automated test equipment comprises a signal extracting unit that is configured to extract at least one of the individual signals or the properties of the individual signals from the combined signal, and wherein the signal extracting unit comprises an analog filter.
10. The apparatus according to claim 4 , wherein the automated test equipment is further configured to separate the individual signals from the combined signal, and wherein the individual signals comprise at least two out of a digital signal, an analogue signal, a Radio-Frequency signal, or a DC signal.
11. The apparatus according to claim 4 , wherein the automated test equipment is further configured to separate the individual signals from the combined signal, and wherein the individual signals comprise at least one of different frequencies or different frequency components.
12. The apparatus according to claim 4 , further comprising a single tester resource configured to measure the combined signal.
13. The apparatus according to claim 12 , wherein the at least a portion of the measurement of the more than one of the plurality of properties from the combined signal are perform simultaneously.
14. A method for testing devices, the method comprising:
generating in automated test equipment a first combined signal comprising a first plurality of different signal components, wherein the first plurality of different signal components are multiplexed into the first combined signal;
providing the first combined signal to at least one of multiple pins of a device under test or a plurality of devices under test;
combining in the automated test equipment a second plurality of different output signals from multiple pins of a device under test or respective pins of a plurality of devices under test to acquire a second combined signal, wherein the second plurality of different signal components are multiplexed into the second combined signal; and
extracting at least one of a plurality of individual signals or properties of the individual signals from a combined signal, wherein the plurality of individual signals or properties correspond to the second plurality of different output signals.
15. The method according to claim 14 , wherein the different output signals comprise at least two out of a digital signal, an analog signal, a Radio-Frequency signal, or a DC signal.
16. The method according to claim 14 , wherein the different output signals are at least one out of time-multiplexed into the combined signal, frequency-multiplexed into the combined signal, or code-multiplexed into the combined signal.
17. The method according to claim 14 , further comprising measuring the combined signal in a single tester resource.
18. The method according to claim 14 , wherein the extracting includes filtering operations.
19. A non-transitory digital storage medium having a computer program stored thereon when implemented by a processor to directs a method for testing devices, the method comprising:
combining a plurality of different individual signals from a plurality of pins of a plurality of devices under test to acquire a combined signal, wherein at least one of the plurality of individual signals comprises a different signal property relative to another one of the plurality of individual signals; and
extracting respective ones of the plurality of individual signals or properties of the individual signals from the combined signal, wherein the respective ones of the plurality of individual signals or properties of the individual signals are extracted at a predetermined time.