Test wafer unit and test system
View Patent ↗A wafer unit for testing is electrically connected to a plurality of chips to be tested formed on a wafer to be tested, the wafer unit for testing including: a connecting wafer provided to face the wafer to be tested, and to be electrically connected to each of the plurality of chips to be tested; and a temperature distribution adjusting section provided on the connecting wafer, and to adjust a temperature distribution of the wafer to be tested.
1. A wafer unit for testing that is electrically connected to a plurality of chips to be tested formed on a wafer to be tested, the wafer unit for testing comprising:
a connecting wafer provided to face the wafer to be tested, the connecting wafer including a plurality of test pads for sending or receiving test signals to or from the wafer to be tested, each test pad adapted to be electrically connected to a corresponding one of the plurality of chips to be tested;
a temperature distribution adjusting section adapted to adjust a temperature distribution of the wafer to be tested, the temperature distribution adjusting section including a plurality of individual temperature adjusting sections, each of the individual temperature adjusting sections including a heater adapted to heat a corresponding one of the plurality of chips to be tested; and
a plurality of test circuits adapted to test a corresponding one of the plurality of chips to be tested, via a corresponding one of the plurality of test pads, wherein
the plurality of test pads and the plurality of heaters are provided on a surface of the connecting wafer that faces the wafer to be tested, and
each of the individual temperature adjusting sections is adapted to control its heater based on a current flowing through a corresponding one of the plurality of test circuits.
2. The wafer unit for testing according to claim 1 , wherein
the connecting wafer corresponds, in shape, to the wafer to be tested.
3. The wafer unit for testing according to claim 2 , wherein
each individual temperature adjusting section detects information corresponding to power consumption of the chip that the individual temperature adjusting section's heater is adapted to heat, to adjust the temperature of the chip based on a result of the detection.
4. The wafer unit for testing according to claim 1 , further comprising:
a circuit wafer provided to face the connecting wafer, and to be electrically connected via the connecting wafer to the wafer to be tested, wherein
the plurality of test circuits are provided on the circuit wafer to correspond to the plurality of chips to be tested.
5. The wafer unit for testing according to claim 4 , wherein
each of the individual temperature adjusting sections includes a control circuit, provided on the circuit wafer, corresponding to a corresponding one of the plurality of chips to be tested and adapted to control the individual temperature adjusting section's heater based on a result of detecting a power source current supplied to the corresponding one of the plurality of chips to be tested.
6. The wafer unit for testing according to claim 4 , wherein
the plurality of test circuits are provided on a surface of the circuit wafer that faces away from the connecting wafer.
7. The wafer unit for testing according to claim 6 , wherein
a plurality of circuit wafer pads are provided on a surface of the connecting wafer that faces the circuit wafer, each circuit wafer pad to be electrically connected to a corresponding one of the plurality of test circuits.
8. The wafer unit for testing according to claim 7 , wherein
an interval for the plurality of test pads is different from an interval for the plurality of circuit wafer pads.
9. The wafer unit for testing according to claim 1 , wherein
each of the individual temperature adjusting sections includes a temperature sensor provided on the surface of the connecting wafer that faces the wafer to be tested, each temperature sensor adapted to measure surface temperature of a corresponding one of the plurality of chips to be tested, and
each of the individual temperature adjusting sections is adapted to control its heater based on the measurement of the individual temperature adjusting section's temperature sensor.
10. The wafer unit for testing according to claim 1 , wherein
the plurality of test circuits are provided on a surface of the connecting wafer that faces away from the wafer to be tested.
11. The wafer unit for testing according to claim 10 , wherein
each of the individual temperature adjusting sections includes a control circuit, provided on the surface of the connecting wafer that faces away from the wafer to be tested, corresponding to a corresponding one of the plurality of chips to be tested and adapted to control the individual temperature adjusting section's heater based on a current flowing through a corresponding one of the plurality of test circuits.
12. A test system for testing a plurality of chips to be tested formed on a wafer to be tested, the test system comprising:
a wafer unit for testing that is electrically connected to the plurality of chips to be tested; and
a control apparatus that tests each of the plurality of chips to be tested via the wafer unit for testing, wherein
the wafer unit for testing includes:
a connecting wafer provided to face the wafer to be tested, the connecting wafer including a plurality of test pads for sending or receiving test signals to or from the wafer to be tested, each test pad adapted to be electrically connected to a corresponding one of the plurality of chips to be tested;
a temperature distribution adjusting section adapted to adjust a temperature distribution of the wafer to be tested, the temperature distribution adjusting section including a plurality of individual temperature adjusting sections, each of the individual temperature adjusting sections including a heater adapted to heat a corresponding one of the plurality of chips to be tested; and
a plurality of test circuits adapted to test a corresponding one of the plurality of chips to be tested, via a corresponding one of the plurality of test pads,
the plurality of test pads and the plurality of heaters are provided on a surface of the connecting wafer that faces the wafer to be tested, and
each of the individual temperature adjusting sections is adapted to control its heater based on a current flowing through a corresponding one of the plurality of test circuits.
13. The test system according to claim 12 , wherein
the connecting wafer corresponds, in shape, to the wafer to be tested.
14. The test system according to claim 13 , wherein
each individual temperature adjusting section detects information corresponding to power consumption of the chip that the individual temperature adjusting section's heater is adapted to heat, to adjust the temperature of the chip based on a result of the detection.
15. The test system according to claim 12 , further comprising:
a circuit wafer provided to face the connecting wafer, and to be electrically connected via the connecting wafer to the wafer to be tested, wherein
the plurality of test circuits are provided on the circuit wafer to correspond to the plurality of chips to be tested.
16. The test system according to claim 15 , wherein
each of the individual temperature adjusting sections includes a control circuit, provided on the circuit wafer, corresponding to a corresponding one of the plurality of chips to be tested and adapted to control the individual temperature adjusting section's heater based on a result of detecting a power source current supplied to the corresponding one of the plurality of chips to be tested.
17. The test system according to claim 15 , wherein
the plurality of test circuits are provided on a surface of the circuit wafer that faces away from the connecting wafer.
18. The test system according to claim 17 , wherein
a plurality of circuit wafer pads are provided on a surface of the connecting wafer that faces the circuit wafer, each circuit wafer pad to be electrically connected to a corresponding one of the plurality of test circuits.
19. The test system according to claim 18 , wherein
an interval for the plurality of test pads is different from an interval for the plurality of circuit wafer pads.
20. The test system according to claim 12 , wherein
each of the individual temperature adjusting sections includes a temperature sensor provided on the surface of the connecting wafer that faces the wafer to be tested, each temperature sensor adapted to measure surface temperature of a corresponding one of the plurality of chips to be tested, and
each of the individual temperature adjusting sections is adapted to control its heater based on the measurement of the individual temperature adjusting section's temperature sensor.
21. The test system according to claim 12 , wherein
the plurality of test circuits are provided on a surface of the connecting wafer that faces away from the wafer to be tested.
22. The test system according to claim 21 , wherein
each of the individual temperature adjusting sections includes a control circuit, provided on the surface of the connecting wafer that faces away from the wafer to be tested, corresponding to a corresponding one of the plurality of chips to be tested and adapted to control the individual temperature adjusting section's heater based on a current flowing through a corresponding one of the plurality of test circuits.