Connector and semiconductor testing device including the connector

1. A connector, the connector comprising:

a signal terminal and a ground terminal, the terminals being arranged next to each other, each of the terminals including a first extending portion, extending toward a tip end thereof, and a second extending portion, extending in a direction opposite to the first extending portion, the first extending portions including a curved portion, the second extending portions including a contact portion, the curved portion of at least one of the signal terminal and the ground terminal has a width smaller than a width of the contact portion of at least one of the signal terminal and the ground terminal; and

an insulative housing, into which the signal terminal and the ground terminal are inserted, the housing including a first housing, into which the first extending portions of the terminals are inserted, and a second housing, into which the second extending portions of the terminals are inserted, the second housing being formed separately from the first housing, the first housing including a wall portion, the wall portion being located between the first extending portion of the signal terminal and the first extending portion of the ground terminal.

2. The connector of claim 1 , wherein the first extending portion having the smaller width is formed such that the width thereof becomes smaller toward the tip end thereof.

3. The connector of claim 2 , wherein the first extending portions further include, on their tip side, a contact portion for contacting a surface of an electronic component, where the connector is mounted on the surface, and the first extending portions are curved so that a position of the contact portion is elastically movable up and down.

4. The connector of claim 2 , wherein the wall portion becomes thicker toward the portion between the tip end of the first extending portion of the signal terminal and the tip end of the first extending portion of the ground terminal.

5. The connector of claim 1 , wherein the housings are formed of materials different in dielectric constant from each other.

6. The connector of claim 1 , wherein the terminals are held in the second housing in such a manner that the second extending portions thereof are press-fit into the second housing.

7. A semiconductor testing device comprising the connector of claim 1 , the semiconductor testing device comprising a circuit board on which the connector is mounted.