Method and product for testing a device under test
View Patent ↗In a method of testing a device under test (DUT) using a test device adapted to provide a connection to a central controller, a test procedure activation signal is supplied from the central controller to the test device. A test procedure for testing the DUT is performed on the basis of test procedure data, upon receipt of the test procedure activation signal. The test procedure is adjustable upon receipt of a feedback signal from the DUT. The test procedure is adjusted by 1) receiving a feedback signal from the DUT, 2) determining from the feedback signal properties of a physical connection between the test device and the DUT, and 3) adjusting the test procedure to modify the test signal and compensate for the properties of the physical connection between the test device and the DUT.
1. A method of testing a device under test using a test device adapted to provide a connection to a central controller, the method comprising:
supplying a test procedure activation signal from the central controller to the test device;
performing a test procedure for testing the device under test on the basis of test procedure data, upon receipt of the test procedure activation signal, wherein the test procedure is adjustable upon receipt of a feedback signal from the device under test; and
adjusting the test procedure by,
receiving a feedback signal from the device under test;
determining from the feedback signal properties of a physical connection between the test device and the device under test; and
adjusting the test procedure to modify the test signal and compensate for the properties of the physical connection between the test device and the device under test.
2. The method of claim 1 , wherein the test procedure is adjusted by adjusting at least one of the following test parameters: a wave form, a voltage, and a current of the test signal.
3. The method of claim 2 , further comprising:
evaluating the feedback signal in order to i) determine test signal distortions resulting from at least one of the group consisting of signal damping, signal reflection, and signal delay, and ii) adjust the test parameters so that the distortions are at least partly compensated.
4. The method of claim 1 , wherein the test procedure is adapted to fulfill at least one of the functions of the group consisting of a calibration function, a compensation function, a time control function, a synchronization function, a comparison function, and a test signal pattern generation function.
5. A non-transitory computer-readable medium in which a computer program is stored, the computer program, when executed by a processor, causing a processor to test a device under test using a test device adapted to provide a connection to a central controller, the method comprising:
supplying a test procedure activation signal from the central controller to the test device;
performing a test procedure for testing the device under test on the basis of test procedure data, upon receipt of the test procedure activation signal, wherein the test procedure is adjustable upon receipt of a feedback signal from the device under test; and
adjusting the test procedure by,
receiving a feedback signal from the device under test;
determining from the feedback signal properties of a physical connection between the test device and the device under test; and
adjusting the test procedure to modify the test signal and compensate for the properties of the physical connection between the test device and the device under test.
6. The non-transitory computer-readable medium of claim 5 , wherein the test procedure is adjusted by adjusting at least one of the following test parameters: a wave form, a voltage, and a current of the test signal.
7. The non-transitory computer-readable medium of claim 6 , further comprising:
evaluating the feedback signal in order to i) determine test signal distortions resulting from at least one of the group consisting of signal damping, signal reflection, and signal delay, and ii) adjust the test parameters so that the distortions are at least partly compensated.
8. The non-transitory computer-readable medium of claim 5 , wherein the test procedure is adapted to fulfill at least one of the functions of the group consisting of a calibration function, a compensation function, a time control function, a synchronization function, a comparison function, and a test signal pattern generation function.