Method and apparatus for improving differential direct (DC) measurement accuracy

1. A method of error correction in automated test equipment (ATE), said method comprising:

calibrating said ATE using a calibration board, wherein said calibration board comprises a reference voltage and wherein said calibrating comprises:

measuring said reference voltage using a reference channel and each of a plurality of channels in said ATE;

recording a series of differential voltage measurement values obtained from said measuring in a calibration module; and

calculating a respective correction factor for each of said plurality of channels utilizing said series of differential voltage measurement values;

measuring a voltage value for a DUT connected to a first channel in said ATE, wherein said first channel is one of said plurality of channels; and

correcting said measured voltage value using a respective correction factor for said first channel.

2. The method of claim 1 , wherein said respective correction factor is an offset voltage value to correct for thermal EMF related error in an associated channel.

3. The method of claim 1 , wherein said series of differential voltage measurement values are obtained using a digital voltmeter.

4. The method of claim 1 , wherein said calculating comprises:

determining an average of said series of differential voltage measurement values;

approximating an average of a plurality of correction factors corresponding to thermal EMF related errors in said plurality of channels as zero;

computing a correction factor corresponding to thermal EMF related error for said reference channel using said average and a value of said reference voltage; and

computing a series of correction factors for said plurality of channels, one correction factor for each of said plurality of channels, using said correction factor for said reference channel, wherein each of said series of correction factors corresponds to thermal EMF related error in a respective channel.

5. The method of claim 1 , wherein said measured voltage value for said DUT is a differential measurement made between said first channel and a second channel in said ATE, wherein said second channel is one of said plurality of channels.

6. The method of claim 1 , wherein said measured voltage value for said DUT is a single-ended voltage measurement value.

7. The method of claim 6 , wherein said single-ended voltage measurement value is further corrected for ground offset error, wherein said ground offset error results from an uncommon ground between a measurement instrument and said DUT.

8. A non-transitory computer-readable storage medium having stored thereon, computer executable instructions that, if executed by a computer system cause the computer system to perform a method of error correction in automated test equipment (ATE), said method comprising:

calibrating said ATE using a calibration board, wherein said calibration board comprises a reference voltage and wherein said calibrating comprises:

measuring said reference voltage using a reference channel and each of a plurality of channels in said ATE;

recording a series of differential voltage measurement values obtained from said measuring;

calculating a respective correction factor for each of said plurality of channels utilizing said series of differential voltage measurement values; and

storing a plurality of correction factors corresponding to said plurality of channels in a memory module;

measuring a voltage value for a DUT connected to a first channel in said ATE, wherein said first channel is one of said plurality of channels; and

correcting said measured voltage value using a respective correction factor for said first channel.

9. The computer-readable medium as described in claim 8 , wherein said respective correction factor is an offset voltage value to correct for thermal EMF related error in an associated channel.

10. The computer-readable medium as described in claim 8 , wherein said calculating further comprises:

determining an average of said series of differential voltage measurement values;

approximating an average of a plurality of correction factors corresponding to thermal EMF related errors in said plurality of channels as zero;

computing a correction factor corresponding to thermal EMF related error for said reference channel using said average and a value of said reference voltage; and

computing a series of correction factors for said plurality of channels, one correction factor for each of said plurality of channels, using said correction factor for said reference channel, wherein each of said series of correction factors corresponds to thermal EMF related error in a respective channel.

11. The computer-readable medium as described in claim 8 , wherein said measured voltage value for said DUT is a differential measurement made between said first channel and a second channel in said ATE, wherein said second channel is one of said plurality of channels.

12. The computer-readable medium as described in claim 8 , wherein said measured voltage value for said DUT is a single-ended voltage measurement value.

13. The computer-readable medium as described in claim 12 , wherein said single-ended voltage measurement value is further corrected for ground offset error, wherein said ground offset error results from an uncommon ground between a measurement instrument and said DUT.

14. A system for performing error correction in automated test equipment (ATE), said system comprising:

a memory comprising a test application stored therein;

a test interface to connect to a plurality of DUTs;

a calibration board for calibrating said ATE, wherein said calibration board comprises a reference voltage, and wherein said calibration board is configured to plug into said test interface;

a processor coupled to said memory and said test interface, wherein said processor is configured to:

measure said reference voltage using a reference channel and each of a plurality of channels in said ATE;

record a series of differential voltage measurement values obtained from said measuring in a calibration memory module;

calculate a respective correction factor for each of said plurality of channels utilizing said series of differential voltage measurement values; and

store a plurality of correction factors corresponding to said plurality of channels in a memory module; and

a voltage measuring device configured to measure a voltage value for a DUT connected to a first channel in said ATE, wherein said first channel is one of said plurality of channels; and

wherein said processor is further configured to correct said measured voltage value using a respective correction factor for said first channel.

15. The system of claim 14 , wherein said respective correction factor is an offset voltage value to correct for thermal EMF related error in an associated channel.

16. The system of claim 14 , wherein to calculate said correction factor for each of said plurality of channels, said process is configured to:

determine an average of said series of differential voltage measurement values;

approximate an average of a plurality of correction factors corresponding to thermal EMF related errors in said plurality of channels as zero;

compute a correction factor corresponding to thermal EMF related error for said reference channel using said average and a value of said reference voltage; and

compute a series of correction factors for said plurality of channels, one correction for each of said plurality of channels, using said correction factor for said reference channel, wherein each of said series of correction factors corresponds to thermal EMF related error in a respective channel.

17. The system of claim 14 , wherein said measured voltage value for said DUT is a differential measurement made between said first channel and a second channel in said ATE, wherein said second channel is one of said plurality of channels.

18. The system of claim 14 , wherein said measured voltage value for said DUT is a single-ended voltage measurement value.