Test head moving apparatus and electronic component testing apparatus

1. An electronic component testing apparatus configured to test an electronic component under test, the electronic component testing apparatus comprising:

a test head that has a socket mounted on an upper portion of the test head;

an electronic component handling apparatus that presses the electronic component to the socket; and

a test head moving apparatus that moves the test head in order to join the test head to the electronic component handling apparatus, wherein

the electronic component handling apparatus includes:

a space that is formed in a bottom portion of the electronic component handling apparatus, the space being open to a lateral side of the electronic component handling apparatus and configured to accommodate the test head; and

an opening portion that is open to an upper portion of the space and configured to receive the upper portion of the test head when the upper portion of the test head is inserted into the opening portion,

the test head moving apparatus includes:

an elevating device that moves the test head up and down;

a horizontally moving device that moves the test head in a horizontal direction; and

a prohibiting device that prohibits a horizontal movement of the horizontally moving device on the basis of a height of the test head,

the prohibiting device includes:

a detecting device that detects that the test head is positioned at a predetermined height when the horizontally moving device moves the test head to insert the test head into the space; and

a stopper that permits or prohibits the horizontal movement of the horizontally moving device when the detecting device detects that the test head is positioned at the predetermined height and that prohibits or permits the horizontal movement of the horizontally moving device when the detecting device fails to detect that the test head is positioned at the predetermined height.

2. The electronic component testing apparatus as set forth in claim 1 , wherein

the predetermined height is a lowermost limit within a range where the elevating device is capable of moving the test head up and down; and

the stopper permits the horizontal movement of the horizontally moving device when the detecting device detects that the test head is positioned at the lowermost limit, and the stopper prohibits the horizontal movement of the horizontally moving device when the detecting device fails to detect that the test head is positioned at the lowermost limit.

3. The electronic component testing apparatus as set forth in claim 1 , wherein the prohibiting device further includes:

an abutting member that abuts against a floor plane;

a moving device that moves the abutting member toward or away from the floor plane; and

a first biasing device that is positioned between the abutting member and the moving device and biases the abutting member toward the floor plane.

4. The electronic component testing apparatus as set forth in claim 3 , wherein:

the moving device includes:

a rod to which the abutting member is attached via the first biasing device; and

a fluid pressure cylinder that moves the rod: and

the fluid pressure cylinder is a cylinder having a lock function capable of locking the rod in response to a shutoff of supply of pressurized fluid.

5. The electronic component testing apparatus as set forth in claim 4 , wherein the fluid pressure cylinder has a second biasing device that biases a piston connected to one end of the rod toward the floor plane.

6. The electronic component testing apparatus as set forth in claim 1 , the electronic component testing apparatus further comprising:

a tester electrically connected to the test head.