Test apparatus and test method for testing plurality of devices in parallel
View Patent ↗A test apparatus 10 according to the present invention includes: a plurality of test modules 150 , connected to either of the plurality of devices under test 100 , for supplying a test signal to the connected device under test 100 ; a plurality of control apparatuses 130 for controlling the plurality of test modules 150 , and for testing the plurality of devices under test 100 in parallel; and a connection setting section 140 for switching topology of the plurality of control apparatuses 130 and the plurality of test modules 150 so that the plurality of control apparatuses 10 connect with the plurality of devices under test 100 respectively.
1. A test method used for a test apparatus including a plurality of test modules, connected to either of a plurality of devices under test, for supplying a test signal to the connected device under test, and a plurality of control apparatuses for controlling the plurality of test modules, and a connection setting section for switching topology of the plurality of control apparatuses and the plurality of test modules, the connection setting section being connected with both the plurality of control apparatuses and the plurality of test modules, comprising steps of:
acquiring a connection switching setting data indicating which one of the plurality of control apparatuses is to be connected with each of the plurality of test modules;
connecting each of the plurality of control apparatuses with the plurality of test modules based on the connection switching setting data for connecting each control apparatus with the plurality of devices under test; and
controlling the plurality of test modules by the connected control apparatus and testing the plurality of devices under test in parallel.
2. The test method used for the test apparatus as claimed in claim 1 , wherein said connection switching setting data vary from at least one of the number of terminals of each of the devices under test, arrangement of the terminals of each of the devices under test, kind of the terminals of each of the devices under test and kind of a test of each of the devices under test.