Method and apparatus for a paddle board probe card
View Patent ↗A paddle board probe card for connecting a device under test with an ATE tester by means of ZIF connectors is presented. The paddle board probe card may include more than one printed circuit board mounted on a probe card in such a manner that the more than one printed circuit boards mate with ZIF connectors on an ATE testhead interface.
1. A paddle board probe card comprising:
a probe card having a top side for mating with a device under test and a bottom side for mating with ZIF connectors of an ATE testhead; and
a plurality of printed circuit boards mounted at a substantially right angle to the bottom side of the probe card, wherein the plurality of printed circuit boards are configured to mate with the ZIF connectors of the ATE testhead.
2. The paddle board probe card according to claim 1 , wherein the plurality of printed circuit boards are mounted to the bottom side of the probe card with respective right angle connectors.
3. The paddle board probe card according to claim 1 , wherein the plurality of printed circuit boards comprise circuitry for fanout of address lines of memory devices.
4. The paddle board card according to claim 1 , wherein the plurality of printed circuit boards comprise circuitry for fanout of power supply and sense lines.
5. The paddle board card according to claim 1 , wherein the plurality of printed circuit boards comprise circuitry for fanout of I/O lines of memory devices.
6. A method of fabricating a paddle board probe card comprising:
providing a probe card with a top side and a bottom side; and
mounting a plurality of printed circuit boards at substantially right angles to the bottom side of the probe card, wherein the plurality of printed circuit boards are configured to mate with ZIF connectors of an ATE testhead.
7. The method of fabricating a paddle board probe card according to claim 6 , wherein the plurality of printed circuit boards are mounted to the probe card with respective right angle connectors.
8. A method for testing a device under test comprising:
providing a paddle board probe card with printed circuit boards mounted at substantially right angles to a bottom side of the paddle board probe card;
mounting the paddle board probe card to an ATE test head by mating the printed circuit boards mounted on the bottom side of the paddle board probe card to ZIF connectors on the ATE test head;
mounting the device under test to a top side of the paddle board probe card; and
running at least one test on the device under test.