Granted Patent
Utility
US 6,363,022
· Confirmation No. 7789
Semiconductor memory device tester
Inventor:
Masaru Tsuto
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2009-06-25 | EBCC.AD |
Notice of Change of Address Place in File Wrapper Due to Electronic Business Center(EBC) Customer Number Update | 1 | View | |
| 2001-08-02 | TRNA |
Transmittal of New Application | 3 | View | |
| 2001-08-02 | ADS |
Application Data Sheet | 1 | View | |
| 2001-08-02 | SPEC |
Specification | 18 | View | |
| 2001-08-02 | CLM |
Claims | 3 | View | |
| 2001-08-02 | ABST |
Abstract | 1 | View | |
| 2001-08-02 | DRW |
Drawings-only black and white line drawings | 12 | View | |
| 2001-08-02 | OATH |
Oath or Declaration filed | 2 | View |
Inventors
Masaru Tsuto
Tokyo, JAPAN
Attorneys & Agents of Record
Classification
USPC
365/201
G11C29/56
G11C29/10
Prosecution
- Examiner
- NGUYEN, TUAN T
- Art Unit
- 2824
- Customer No.
- 88488
- Docket No.
- KPO130
- Confirmation No.
- 7789
Foreign Priority
2000-235635
·
2000-08-03
·
JAPAN
Publication
- Pub. No.
- US20020016941A1
- Pub. Date
- 2002-02-07
Patent Term Adjustment
-69days
No related applications found.
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Quick Facts
- Patent No.
- US 6,363,022
- App. No.
- 09/922,351
- Filed
- 2001-08-02
- Granted
- 2002-03-26
- Pub. No.
- US20020016941A1
- Examiner
- NGUYEN, TUAN T
- Art Unit
- 2824
- PTA
- -69 days
External Links