Test unit and test apparatus
View Patent ↗In the digitizer, a plurality of ADCs convert a plurality of analogue signals output from the device to be tested, to digital signals, respectively. The processing circuit is configured as a software-independent circuit and processes a plurality of digital signals output from the plurality of ADCs. The processing circuit is formed on the FPGA. In the processing circuit, the FFT circuit performs complex Fourier transform on two digital signals.
1. A test apparatus provided with a test unit apparatus which processes a plurality of digital signals to be tested and a decision unit for determining a device to be tested is good or not, wherein the test unit apparatus comprises,
a plurality of analogue-digital conversion units which convert a plurality of analogue signals output from a device to be tested into the corresponding plurality of digital signals, wherein the analogue signals output from the device are of different types;
a plurality of memories which hold the plurality of digital signals to be tested; and
a hardware processing circuit which reads out and performs complex Fast Fourier transform on the plurality of digital signals which are held in the plurality of memories, simultaneously,
wherein the decision unit is configured to,
a) receive result of the complex Fast Fourier transform from the hardware processing circuit;
b) analyze the result received from the hardware processing unit;
c) determine whether the device is good or not based on the analysis.
2. The test apparatus according to claim 1 , wherein the hardware processing circuit is configured on a FPGA.