Electronic component handling apparatus and electronic component testing apparatus
View Patent ↗An electronic component handling apparatus that handles a DUT having a temperature detection circuit and presses the DUT against a socket electrically connected to a tester is provided. The electronic component includes: a temperature adjuster that adjusts a temperature of the DUT; a first receiver that receives a first signal from the tester, the first signal indicating a junction temperature of the DUT; a second receiver that receives a second signal from the tester, the second signal indicating a detection value of the temperature detection circuit; a first calculator that calculates the temperature of the DUT by using the first signal and the second signal; and a temperature controller that controls the temperature adjuster on the basis of a calculation result of the first calculator.
1. An electronic component handling apparatus that handles a DUT having a temperature detection circuit and presses the DUT against a socket electrically connected to a tester, comprising:
a temperature adjuster that adjusts a temperature of the DUT;
a first receiver that receives a first signal from the tester, the first signal indicating a junction temperature of the DUT;
a second receiver that receives a second signal from the tester, the second signal indicating a detection value of the temperature detection circuit;
a first calculator that calculates the temperature of the DUT by using the first signal and the second signal; and
a temperature controller that controls the temperature adjuster on the basis of a calculation result of the first calculator.
2. The electronic component handling apparatus according to claim 1 , wherein
the second signal is an analog signal outputted from the tester, and
the electronic component handling apparatus comprises a converter performing AD conversion on the second signal received by the second receiver and outputting the converted signal to the first calculator.
3. The electronic component handling apparatus according to claim 1 , wherein
a second period during which the second signal is transmitted from the tester is longer than a first period during which the first signal is transmitted from the tester.
4. An electronic component testing apparatus that tests a DUT having a temperature detection circuit, comprising:
the electronic component handling apparatus according to claim 1 ; and
a tester electrically connected to the socket and testing the DUT, wherein
the tester includes:
a second calculator that calculates a junction temperature from a detection value of the temperature detection circuit;
a first transmitter that outputs a calculation result of the second calculator as the first signal to the first receiver; and
a second transmitter that outputs the detection value of the temperature detection circuit as the second signal to the second receiver.
5. The electronic component testing apparatus according to claim 4 , wherein
the first signal is a digital signal outputted from the tester, and
the second calculator calculates the junction temperature from the detection value of the temperature detection circuit and performs AD conversion to generate the first signal.
6. The electronic component testing apparatus according to claim 4 , wherein
the tester comprises a switch switching a connection destination of the temperature detection circuit to the second calculator or the second transmitter.
7. The electronic component testing apparatus according to claim 4 , wherein
the first calculator calculates the temperature of the DUT by correcting the first signal by using the second signal.
8. The electronic component testing apparatus according to claim 4 , wherein
the first calculator calculates the temperature of the DUT by correcting the second signal by using the first signal.